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Author: Henning Friis Poulsen
Publisher: Springer Science & Business Media
ISBN: 9783540223306
Category : Nature
Languages : en
Pages : 176
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Book Description
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Author: Henning Friis Poulsen
Publisher: Springer Science & Business Media
ISBN: 9783540223306
Category : Nature
Languages : en
Pages : 176
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Book Description
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
Author: Henning Friis Poulsen
Publisher: Springer
ISBN: 9783662145425
Category :
Languages : en
Pages : 172
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Book Description
Author: Diling Zhu
Publisher: Stanford University
ISBN:
Category :
Languages : en
Pages : 124
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Book Description
The ability to interpret and inverse x-ray diffraction patterns from crystals has largely shaped our understanding of the structure of matter. However, structure determination of noncrystalline objects from their diffraction patterns is a much more difficult task. The dramatic increase in available coherent x-ray photon flux over the past decade has made possible a technique known as lensless coherent diffractive imaging (CDI), that addresses exactly this problem. The central question around CDI is the so-called phase problem: upon detection of the diffraction intensity, the phase information of the diffracted wave is inevitably lost. Generally, the phase problem is approached using iterative phase retrieval algorithms. Holographic methods, through interference with reference diffractions, encode the phase information directly inside the measured x-ray holograms, and are therefore able to avoid the stagnation and uniqueness problems commonly encountered by the iterative algorithms. This dissertation discusses two novel holographic methods for coherent lensless imaging using resonant soft x-rays. The first part focuses on generalizing the multiple-wavelength anomalous diffraction technique, a highly successful method for solving the crystal structures of biomacromolecules, into a multiple-wavelength holography technique for nanoscale resonant x-ray imaging. Using this method I show element specific reconstructions of nanoparticles and magnetization distribution in magnetic thin films with sub 50 nm resolution. The second part discusses progress in X-ray Fourier holography, an ultrafast lensless imaging platform that can be used with the upcoming x-ray free electron lasers. In particular, I will present experiments using two novel types of extended reference structures that bring the resolution beyond the precision of reference fabrication, previously regarded as the resolution limit for x-ray Fourier transform holography. Finally, future applications of holographic methods, especially experimental considerations for time-resolved studies of nanostructures using X-FELs, will be discussed.
Author: Emil Zolotoyabko
Publisher: John Wiley & Sons
ISBN: 3527681183
Category : Science
Languages : en
Pages : 299
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Book Description
Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
Author: Bob B. He
Publisher: John Wiley & Sons
ISBN: 1119356067
Category : Science
Languages : en
Pages : 492
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Book Description
An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.
Author: Adam Morawiec
Publisher: Springer Nature
ISBN: 3031110773
Category : Science
Languages : en
Pages : 427
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Book Description
This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination. The book is intended equally for materials scientists curious about ‘nuts and bolts’ of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.
Author: Rozaliya Barabash
Publisher: World Scientific
ISBN: 1908979631
Category : Science
Languages : en
Pages : 478
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Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author: David E. Laughlin
Publisher: Newnes
ISBN: 0444537716
Category : Technology & Engineering
Languages : en
Pages : 2963
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Book Description
This fifth edition of the highly regarded family of titles that first published in 1965 is now a three-volume set and over 3,000 pages. All chapters have been revised and expanded, either by the fourth edition authors alone or jointly with new co-authors. Chapters have been added on the physical metallurgy of light alloys, the physical metallurgy of titanium alloys, atom probe field ion microscopy, computational metallurgy, and orientational imaging microscopy. The books incorporate the latest experimental research results and theoretical insights. Several thousand citations to the research and review literature are included. - Exhaustively synthesizes the pertinent, contemporary developments within physical metallurgy so scientists have authoritative information at their fingertips - Replaces existing articles and monographs with a single, complete solution - Enables metallurgists to predict changes and create novel alloys and processes
Author: The Minerals, Metals & Materials Society (TMS)
Publisher: John Wiley & Sons
ISBN: 1119016606
Category : Technology & Engineering
Languages : en
Pages : 958
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Book Description
