Thin Films and Interfaces II (Volume 25). PDF Download
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Author: JEE Baglin (ed)
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: JEE Baglin (ed)
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: KN TU (ED.)
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: John E. E. Baglin
Publisher: North Holland
ISBN:
Category : Semiconductor films
Languages : en
Pages : 712
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Author:
Publisher:
ISBN:
Category : Thin films
Languages : en
Pages : 432
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Author: John D. Dow
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 850
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Author: E. Kasper
Publisher: CRC Press
ISBN: 1351093517
Category : Technology & Engineering
Languages : en
Pages : 302
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Book Description
This subject is divided into two volumes. Volume I is on homoepitaxy with the necessary systems, techniques, and models for growth and dopant incorporation. Three chapters on homoepitaxy are followed by two chapters describing the different ways in which MBE may be applied to create insulator/Si stackings which may be used for three-dimensional circuits. The two remaining chapters in Volume I are devoted to device applications. The first three chapters of Volume II treat all aspects of heteroepitaxy with the exception of the epitaxial insulator/Si structures already treated in volume I.
Author: Geraldine Cogin Shwartz
Publisher: CRC Press
ISBN: 9780849384660
Category : Technology & Engineering
Languages : en
Pages : 598
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Covering materials, processes, equipment, methodologies, characterization techniques, clean room practices, and ways to control contamination-related defects, this work offers up-to-date information on the application of interconnection technology to semiconductors. It offers an integration of technical, patent and industry literature.
Author: Cullis
Publisher: CRC Press
ISBN: 9780854981786
Category : Technology & Engineering
Languages : en
Pages : 836
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Book Description
The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.
Author: Robert L. Day
Publisher:
ISBN: 9781558990661
Category : Technology & Engineering
Languages : en
Pages : 328
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Author: Pamela B. Vandiver
Publisher:
ISBN: 9781558990746
Category :
Languages : en
Pages : 894
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