Theory, Analysis and Design of RF Interferometric Sensors PDF Download
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Author: Cam Nguyen
Publisher: Springer Science & Business Media
ISBN: 1461420237
Category : Technology & Engineering
Languages : en
Pages : 80
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Book Description
Theory, Analysis and Design of RF Interferometric Sensors presents the theory, analysis and design of RF interferometric sensors. RF interferometric sensors are attractive for various sensing applications that require every fine resolution and accuracy as well as fast speed. The book also presents two millimeter-wave interferometric sensors realized using RF integrated circuits. The developed millimeter-wave homodyne sensor shows sub-millimeter resolution in the order of 0.05 mm without correction for the non-linear phase response of the sensor's quadrature mixer. The designed millimeter-wave double-channel homodyne sensor provides a resolution of only 0.01 mm, or 1/840th of the operating wavelength, and can inherently suppress the non-linearity of the sensor's quadrature mixer. The experimental results of displacement and velocity measurement are presented as a way to demonstrate the sensing ability of the RF interferometry and to illustrate its many possible applications in sensing. The book is succinct, yet the material is very much self-contained, enabling readers with an undergraduate background in electrical engineering or physics with some experiences or graduate courses in RF circuits to understand easily.
Author: Cam Nguyen
Publisher: Springer Science & Business Media
ISBN: 1461420237
Category : Technology & Engineering
Languages : en
Pages : 80
Get Book Here
Book Description
Theory, Analysis and Design of RF Interferometric Sensors presents the theory, analysis and design of RF interferometric sensors. RF interferometric sensors are attractive for various sensing applications that require every fine resolution and accuracy as well as fast speed. The book also presents two millimeter-wave interferometric sensors realized using RF integrated circuits. The developed millimeter-wave homodyne sensor shows sub-millimeter resolution in the order of 0.05 mm without correction for the non-linear phase response of the sensor's quadrature mixer. The designed millimeter-wave double-channel homodyne sensor provides a resolution of only 0.01 mm, or 1/840th of the operating wavelength, and can inherently suppress the non-linearity of the sensor's quadrature mixer. The experimental results of displacement and velocity measurement are presented as a way to demonstrate the sensing ability of the RF interferometry and to illustrate its many possible applications in sensing. The book is succinct, yet the material is very much self-contained, enabling readers with an undergraduate background in electrical engineering or physics with some experiences or graduate courses in RF circuits to understand easily.
Author: Ramon F. Hanssen
Publisher: Springer Science & Business Media
ISBN: 0306476339
Category : Technology & Engineering
Languages : en
Pages : 318
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Book Description
This book is the product of five and a half years of research dedicated to the und- standing of radar interferometry, a relatively new space-geodetic technique for m- suring the earth’s topography and its deformation. The main reason for undertaking this work, early 1995, was the fact that this technique proved to be extremely useful for wide-scale, fine-resolution deformation measurements. Especially the interf- ometric products from the ERS-1 satellite provided beautiful first results—several interferometric images appeared as highlights on the cover of journals such as Nature and Science. Accuracies of a few millimeters in the radar line of sight were claimed in semi-continuous image data acquired globally, irrespective of cloud cover or solar illumination. Unfortunately, because of the relative lack of supportive observations at these resolutions and accuracies, validation of the precision and reliability of the results remained an issue of concern. From a geodetic point of view, several survey techniques are commonly available to measure a specific geophysical phenomenon. To make an optimal choice between these techniques it is important to have a uniform and quantitative approach for describing the errors and how these errors propagate to the estimated parameters. In this context, the research described in this book was initiated. It describes issues involved with different types of errors, induced by the sensor, the data processing, satellite positioning accuracy, atmospheric propagation, and scattering character- tics. Nevertheless, as the first item in the subtitle “Data Interpretation and Error Analysis” suggests, data interpretation is not always straightforward.
Author: Fu-Kuo Chang
Publisher: DEStech Publications, Inc
ISBN: 9781932078206
Category : Technology & Engineering
Languages : en
Pages : 1592
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Book Description
Important new information on sensors, monitoring, prognosis, networking, and planning for safety and maintenance.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 456
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: Jacob Fraden
Publisher: Springer Science & Business Media
ISBN: 0387216049
Category : Technology & Engineering
Languages : en
Pages : 596
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Book Description
Seven years have passed since the publication of the previous edition of this book. During that time, sensor technologies have made a remarkable leap forward. The sensitivity of the sensors became higher, the dimensions became smaller, the sel- tivity became better, and the prices became lower. What have not changed are the fundamental principles of the sensor design. They are still governed by the laws of Nature. Arguably one of the greatest geniuses who ever lived, Leonardo Da Vinci, had his own peculiar way of praying. He was saying, “Oh Lord, thanks for Thou do not violate your own laws. ” It is comforting indeed that the laws of Nature do not change as time goes by; it is just our appreciation of them that is being re?ned. Thus, this new edition examines the same good old laws of Nature that are employed in the designs of various sensors. This has not changed much since the previous edition. Yet, the sections that describe the practical designs are revised substantially. Recent ideas and developments have been added, and less important and nonessential designs were dropped. Probably the most dramatic recent progress in the sensor technologies relates to wide use of MEMS and MEOMS (micro-electro-mechanical systems and micro-electro-opto-mechanical systems). These are examined in this new edition with greater detail. This book is about devices commonly called sensors. The invention of a - croprocessor has brought highly sophisticated instruments into our everyday lives.
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1360
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Book Description
Author: Xizheng Ke
Publisher: Springer Nature
ISBN: 9819715229
Category :
Languages : en
Pages : 1881
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Book Description
Author: Ramon F. Hanssen
Publisher:
ISBN: 9789401741484
Category :
Languages : en
Pages : 328
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Book Description
Author: Robert B. Northrop
Publisher: CRC Press
ISBN: 1420057855
Category : Technology & Engineering
Languages : en
Pages : 760
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Book Description
Knowledge of instrumentation is critical in light of the highly sensitive and precise requirements of modern processes and systems. Rapid development in instrumentation technology coupled with the adoption of new standards makes a firm, up-to-date foundation of knowledge more important than ever in most science and engineering fields. Understanding this, Robert B. Northrop produced the best-selling Introduction to Instrumentation and Measurements in 1997. The second edition continues to provide in-depth coverage of a wide array of modern instrumentation and measurement topics, updated to reflect advances in the field. See What's New in the Second Edition: Anderson Current Loop technology Design of optical polarimeters and their applications Photonic measurements with photomultipliers and channel-plate photon sensors Sensing of gas-phase analytes (electronic "noses") Using the Sagnac effect to measure vehicle angular velocity Micromachined, vibrating mass, and vibrating disk rate gyros Analysis of the Humphrey air jet gyro Micromachined IC accelerometers GPS and modifications made to improve accuracy Substance detection using photons Sections on dithering, delta-sigma ADCs, data acquisition cards, the USB, and virtual instruments and PXI systems Based on Northrop's 40 years of experience, Introduction to Instrumentation and Measurements, Second Edition is unequalled in its depth and breadth of coverage.
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 0429532652
Category : Technology & Engineering
Languages : en
Pages : 692
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Book Description
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
