Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 32
Book Description
The major aim of our research has been a theoretical investigation of (1) important point defect complexes in low-temperature-grown (LT) GaAs and (2) the microscopic processes occurring at the surface during growth of GaAs films, which determine how much excess arsenic will be incorporated into the material.
Theoretical Investigation of Point Defects and Defect Complexes in Low-Temperature-Grown GaAs
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 32
Book Description
The major aim of our research has been a theoretical investigation of (1) important point defect complexes in low-temperature-grown (LT) GaAs and (2) the microscopic processes occurring at the surface during growth of GaAs films, which determine how much excess arsenic will be incorporated into the material.
Publisher:
ISBN:
Category :
Languages : en
Pages : 32
Book Description
The major aim of our research has been a theoretical investigation of (1) important point defect complexes in low-temperature-grown (LT) GaAs and (2) the microscopic processes occurring at the surface during growth of GaAs films, which determine how much excess arsenic will be incorporated into the material.
Niels Steensen
Author: Valdemar Meisen
Publisher:
ISBN:
Category :
Languages : en
Pages : 269
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 269
Book Description
Defect Studies in Low-temperature-grown GaAs
Author: David Emory Bliss
Publisher:
ISBN:
Category :
Languages : en
Pages : 406
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 406
Book Description
Proceedings of the Twenty-fourth State-of-the-Art Program on Compound Semiconductors
Author: F. Ren
Publisher: The Electrochemical Society
ISBN: 9781566771528
Category : Technology & Engineering
Languages : en
Pages : 294
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566771528
Category : Technology & Engineering
Languages : en
Pages : 294
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1102
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1102
Book Description
Diffusion and Defect Data
Author:
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 962
Book Description
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 962
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1148
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1148
Book Description
Uniaxial Stress/DLTS Studies on Deep Level Defects in N-GaAs
Author: S. J. Hartnett
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Defects in Semiconductors
Author: Gordon Davies
Publisher: Scitec Publications
ISBN:
Category : Science
Languages : en
Pages : 644
Book Description
Modern Technology depends upon silicon chips, and life as we know it would hardly be possible without semiconductor devices. Control over a given semiconductor's electronic properties is achieved via defect engineering, and the scientific and technical challenges in this field are manifold.
Publisher: Scitec Publications
ISBN:
Category : Science
Languages : en
Pages : 644
Book Description
Modern Technology depends upon silicon chips, and life as we know it would hardly be possible without semiconductor devices. Control over a given semiconductor's electronic properties is achieved via defect engineering, and the scientific and technical challenges in this field are manifold.
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1216
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1216
Book Description