The Solid-solid Phase Transition in Vanadium Dioxide Thin Films PDF Download
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Author: Joyeeta Nag
Publisher:
ISBN:
Category : Electronic dissertations
Languages : en
Pages : 192
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Book Description
Author: Joyeeta Nag
Publisher:
ISBN:
Category : Electronic dissertations
Languages : en
Pages : 192
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Book Description
Author: Scott H. Beasor
Publisher:
ISBN:
Category : Metal-insulator transitions
Languages : en
Pages : 190
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Book Description
Author: Felipe Rivera
Publisher:
ISBN:
Category : Crystallization
Languages : en
Pages : 95
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Book Description
Crystalline films of vanadium dioxide were obtained through thermal annealing of amorphous vanadium dioxide thin films sputtered on silicon dioxide. An annealing process was found that yielded polycrystalline vanadium dioxide thin films, semi-continuous thin films, and films of isolated single-crystal particles. Orientation Imaging Microscopy (OIM) was used to characterize and study the phase and the orientation of the vanadium dioxide crystals obtained, as well as to differentiate them from other vanadium oxide stoichiometries that may have formed during the annealing process. There was no evidence of any other vanadium oxides present in the prepared samples. Indexing of the crystals for the orientation study was performed with the Kikuchi patterns for the tetragonal phase of vanadium dioxide, since it was observed that the Kikuchi patterns for the monoclinic and tetragonal phases of vanadium dioxide are indistinguishable by OIM. It was found that a particle size of 100 nm was in the lower limit of particles that could be reliably characterized with this technique. It was also found that all VO2 crystals large enough to be indexed by OIM had a preferred orientation with the C axis of the tetragonal phase parallel to the plane of the specimen.
Author: Martin I. Pech-Canul
Publisher: Springer
ISBN: 3030021718
Category : Technology & Engineering
Languages : en
Pages : 590
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Book Description
This book is a practical guide to optical, optoelectronic, and semiconductor materials and provides an overview of the topic from its fundamentals to cutting-edge processing routes to groundbreaking technologies for the most recent applications. The book details the characterization and properties of these materials. Chemical methods of synthesis are emphasized by the authors throughout the publication. Describes new materials and updates to older materials that exhibit optical, optoelectronic and semiconductor behaviors; Covers the structural and mechanical aspects of the optical, optoelectronic and semiconductor materials for meeting mechanical property and safety requirements; Includes discussion of the environmental and sustainability issues regarding optical, optoelectronic, and semiconductor materials, from processing to recycling.
Author: Yi Long
Publisher: CRC Press
ISBN: 1000393577
Category : Science
Languages : en
Pages : 416
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Book Description
The usage of building energy accounts for 30–40% of total energy consumption in developed countries, exceeding the amount for industry or transportation. Around 50% energy for building services is contributed by heating, ventilation, and air-conditioning (HVAC) systems. More importantly, both building and HVAC energy consumptions are predicted to increase in the next two decades. Windows are considered as the least energy-efficient components of buildings. Therefore, smart windows are becoming increasingly important as they are capable of reducing HVAC energy usage by tuning the transmitted sunlight in a smart and favoured way: blocking solar irradiation on hot days, while letting it pass through on cold days. Compared with other type of smart windows, thermochromic windows have the unique advantages of cost-effectiveness, rational stimulus, and passive response. This book covers fabrication of vanadium dioxide–based smart windows, discusses various strategies to enhance their performance, and shares perspectives from the top scientists in this particular field.
Author: Lukas Novotny
Publisher: Cambridge University Press
ISBN: 1107005469
Category : Science
Languages : en
Pages : 583
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Book Description
Fully revised and in its second edition, this standard reference on nano-optics is ideal for graduate students and researchers alike.
Author: D. Keith Bowen
Publisher: CRC Press
ISBN: 1420005650
Category : Technology & Engineering
Languages : en
Pages : 296
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Book Description
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.
Author: David Michael Lamb
Publisher:
ISBN:
Category : Optoelectronic devices
Languages : en
Pages : 128
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Book Description
Transition metal oxides have been the subject of intense study by material scientists and chemists for many years. They represent a unique solid state material which can undergo reversible phase transitions from insulators (or semiconductors) to metals when they undergo changes in ambient conditions. It has long been established that vanadium oxides undergo these reversible phase transitions. When irradiating infrared light on thin films of VO2, a phase transition from a semiconductor to a metal causes the IR light to go from transmitting to reflecting. This study investigates phase transitions of metal oxide thin films in which visible light can be changed from transmitting to reflecting. Such a device would broaden the field of optoelectronics, optical neural networks, and advanced detector systems. An optoelectronic device from a thin film heterostructure of vanadium and titanium oxides is fabricated in this study. When a voltage was applied to the device, HeNe light responded to a reversible phase transition from a semiconductor to a more metallic material. Light on the transmission side experienced a significant drop while simultaneously experiencing a corresponding increase in reflectivity.
Author:
Publisher:
ISBN:
Category : Solid state physics
Languages : en
Pages : 840
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Book Description
Author: Ilya Valmianski
Publisher:
ISBN:
Category :
Languages : en
Pages : 92
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Book Description
Vanadium oxides are a prototypical family of highly correlated oxides. In his dissertation, I present the study of two vanadium oxides in particular, V2O3 and VO2, which undergo simultaneously both a structural phase transition and a metal to insulator transition. While traditionally these phase transitions were studied in equilibrium, bulk, or in meso/macro-scale devices, in my work I focused on different modalities: fast, small, and strained. In my work on fast time scales during photoexcitation of V2O3 we found a novel meta-stable intermediate state that appears due to symmetry change in the monoclinic phase. This change occurs in the proximity of high temperature rhombohedral domains on length scales similar to those of electronic correlation. Our finding shows that the electronic and structural transitions in V2O3 have similar length scales but very different time scales. In VO2 and V2O3 nanoscale devices, we found a length-scale competition between Joule heating and electric field driven current induced metal to insulator transition. We proposed a novel thermoelectric model and performed simulations using finite element methods. Our modeling showed that the transition is highly inhomogeneous and the resulting filaments are surface bound with thermal gradients generating Seebeck electric fields on the order of 1000 V/cm. Finally, we studied pressurized and strained thin films in V2O3 and discovered strong strain relaxation for pressures of up to 500 MPa, which cause a deviation of thin film Pressure-Temperature phase diagram from bulk behavior. This strain relaxation relies on the difference between the structural and morphological length scales, which allows the formation of strain relaxing creases. Once those creases are fully strained, the thin films respond similarly to bulk samples.
