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Author: Olaf Stenzel
Publisher: Springer Science & Business Media
ISBN: 3540231471
Category : Science
Languages : en
Pages : 285
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Book Description
The present monograph represents itself as a tutorial to the ?eld of optical properties of thin solid ?lms. It is neither a handbook for the thin ?lm prac- tioner,noranintroductiontointerferencecoatingsdesign,norareviewonthe latest developments in the ?eld. Instead, it is a textbook which shall bridge the gap between ground level knowledge on optics, electrodynamics, qu- tummechanics,andsolidstatephysicsononehand,andthemorespecialized level of knowledge presumed in typical thin ?lm optical research papers on the other hand. In writing this preface, I feel it makes sense to comment on three points, which all seem to me equally important. They arise from the following (- tually interconnected) three questions: 1. Who can bene?t from reading this book? 2. What is the origin of the particular material selection in this book? 3. Who encouraged and supported me in writing this book? Let me start with the ?rst question, the intended readership of this book. It should be of use for anybody, who is involved into the analysis of - tical spectra of a thin ?lm sample, no matter whether the sample has been prepared for optical or other applications. Thin ?lm spectroscopy may be r- evant in semiconductor physics, solar cell development, physical chemistry, optoelectronics, and optical coatings development, to give just a few ex- ples. The book supplies the reader with the necessary theoretical apparatus for understanding and modelling the features of the recorded transmission and re?ection spectra.
Author: Olaf Stenzel
Publisher: Springer Science & Business Media
ISBN: 3540231471
Category : Science
Languages : en
Pages : 285
Get Book Here
Book Description
The present monograph represents itself as a tutorial to the ?eld of optical properties of thin solid ?lms. It is neither a handbook for the thin ?lm prac- tioner,noranintroductiontointerferencecoatingsdesign,norareviewonthe latest developments in the ?eld. Instead, it is a textbook which shall bridge the gap between ground level knowledge on optics, electrodynamics, qu- tummechanics,andsolidstatephysicsononehand,andthemorespecialized level of knowledge presumed in typical thin ?lm optical research papers on the other hand. In writing this preface, I feel it makes sense to comment on three points, which all seem to me equally important. They arise from the following (- tually interconnected) three questions: 1. Who can bene?t from reading this book? 2. What is the origin of the particular material selection in this book? 3. Who encouraged and supported me in writing this book? Let me start with the ?rst question, the intended readership of this book. It should be of use for anybody, who is involved into the analysis of - tical spectra of a thin ?lm sample, no matter whether the sample has been prepared for optical or other applications. Thin ?lm spectroscopy may be r- evant in semiconductor physics, solar cell development, physical chemistry, optoelectronics, and optical coatings development, to give just a few ex- ples. The book supplies the reader with the necessary theoretical apparatus for understanding and modelling the features of the recorded transmission and re?ection spectra.
Author: Olaf Stenzel
Publisher: Springer
ISBN: 3319753258
Category : Science
Languages : en
Pages : 474
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Book Description
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Author: OpenStax
Publisher:
ISBN: 9781680920451
Category : Science
Languages : en
Pages : 622
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Book Description
University Physics is a three-volume collection that meets the scope and sequence requirements for two- and three-semester calculus-based physics courses. Volume 1 covers mechanics, sound, oscillations, and waves. Volume 2 covers thermodynamics, electricity and magnetism, and Volume 3 covers optics and modern physics. This textbook emphasizes connections between between theory and application, making physics concepts interesting and accessible to students while maintaining the mathematical rigor inherent in the subject. Frequent, strong examples focus on how to approach a problem, how to work with the equations, and how to check and generalize the result. The text and images in this textbook are grayscale.
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author: Martin W Mccall
Publisher: World Scientific
ISBN: 178326537X
Category : Science
Languages : en
Pages : 468
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Book Description
Birefringent Thin Films and Polarizing Elements (2nd Edition) includes the significant advances that have been made since the first book on tilted-columnar films was published. The major discovery of serial bideposition has led to a normal-columnar nanostructure with enhanced birefringence and in turn to nanoengineered handed films with properties matching the left-circular reflectors of scarab beetles. A second version of the Matlab software that accompanies the book includes algorithms for computing material, electromagnetic and optical properties of isotropic, birefringent and chiral films. A set of numerical and experimental examples chosen to illustrate and generate interest in these new fields will be of interest to graduate students and to researchers in optics.
Author: Claude Amra
Publisher: Cambridge University Press
ISBN: 1108809758
Category : Science
Languages : en
Pages : 396
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Book Description
Three experts in the field of thin-film optics present a detailed and self-contained theoretical study of planar multilayers and how they can be effectively exploited in both traditional and modern applications. Starting with a discussion of the relevant electromagnetic optics, the fundamental optical properties of multilayers are introduced using an electromagnetic approach based on a direct solving of Maxwell's equations by Fourier transforms. This powerful approach is illustrated through the comprehensive description of two of the most important phenomena in multilayers, i.e. giant field enhancement in dielectric stacks and light scattering from thin-film optical filters. The same approach is extended to the description of the operation of planar microcavities and the balance of energy between radiated and trapped light. This book will be valuable to researchers, engineers and graduate students with interests in nanophotonics, optical telecommunications, observational astronomy and gravitational wave detection.
Author: Victor G. Karpov
Publisher: Wiley-Interscience
ISBN: 9780470110140
Category : Technology & Engineering
Languages : en
Pages : 350
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Book Description
The overall objective of this book to give a self-contained in-depth discussion of the physics of thin-film systems in a manner accessible to both researchers and students, so that the readers gain a sound perspective on the past and a foundation for projecting future trends. It starts with a brief general introduction to renewable energy, photovoltaics, and thin-film technology challenges. It covers most aspects of the physics of thin-film photovoltaic devices, including device operations, material structure and parameters, thin-film junction formation, analytical and numerical modeling, recently developed concepts of large area effects and lateral non-uniformities, physics of shunting (both shunt growth and effects), and the physics underlying device degradation. Also, it reviews a variety of physical diagnostic techniques proven in thin-film photovoltaic technology.
Author: Hans Lüth
Publisher: Springer Science & Business Media
ISBN: 3662043521
Category : Technology & Engineering
Languages : en
Pages : 566
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Book Description
This book emphasises both experimental and theoretical aspects of surface, interface and thin film physics. Compa- red to the earlier editions, which bore the title "Surfaces and Interfaces of Solid Materials", the book now places more emphasis on thin films, including also their superconducting and ferromagnetic properties. The present 4th edition thus presents techniques of preparing well-defined solid surfaces and interfaces, fundamental aspects of adsorption and layer growth, as well as basic models for the descripti- on of structural, vibronic and electronic properties of sur- faces, interfaces and thin films. Because of their importan- ce for modern information technology, significant attention is paid to the electronic properties of semiconductor inter- faces and heterostructures. Collective phenomena , such as superconductivity and ferromagnetism, also feature promi- nently. Experimental sections covering essential measurement and preparation techniques are presented in separate panels.
Author: O. S. Heavens
Publisher: Courier Corporation
ISBN: 0486669246
Category : Science
Languages : en
Pages : 276
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Book Description
Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.
Author: Sushil Kumar
Publisher: Springer Nature
ISBN: 9811561168
Category : Technology & Engineering
Languages : en
Pages : 721
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Book Description
This volume comprises the expert contributions from the invited speakers at the 17th International Conference on Thin Films (ICTF 2017), held at CSIR-NPL, New Delhi, India. Thin film research has become increasingly important over the last few decades owing to the applications in latest technologies and devices. The book focuses on current advances in thin film deposition processes and characterization including thin film measurements. The chapters cover different types of thin films like metal, dielectric, organic and inorganic, and their diverse applications across transistors, resistors, capacitors, memory elements for computers, optical filters and mirrors, sensors, solar cells, LED's, transparent conducting coatings for liquid crystal display, printed circuit board, and automobile headlamp covers. This book can be a useful reference for students, researchers as well as industry professionals by providing an up-to-date knowledge on thin films and coatings.
