The Philosophical Magazine; A Journal of Theoretical, Experimental and Applied Physics PDF Download
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Author: Anonymous
Publisher: Arkose Press
ISBN: 9781345860894
Category :
Languages : en
Pages : 588
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Book Description
This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
Author: Anonymous
Publisher: Arkose Press
ISBN: 9781345860894
Category :
Languages : en
Pages : 588
Get Book Here
Book Description
This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
Author: Anonymous
Publisher: Arkose Press
ISBN: 9781343925762
Category :
Languages : en
Pages : 844
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Book Description
This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages :
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Book Description
Author: Sidney Yip
Publisher: MIT Press
ISBN: 0262048132
Category : Technology & Engineering
Languages : en
Pages : 287
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Book Description
A student-oriented introduction to understanding mechanisms at the atomistic level controlling macroscopic materials phenomena through molecular dynamics simulations. Machine-learning-based computation in materials innovation, performance optimization, and sustainability offers exciting opportunities at the mesoscale research frontier. Molecular Mechanisms in Materials presents research findings and insights about material behavior at the molecular level and its impact on macroscopic properties. The book’s fifteen essays represent author Sidney Yip’s work in atomistic modeling and materials simulation over more than five decades. The phenomena are grouped into five basic types: fluctuations in simple fluids, crystal melting, plasticity and fracture, glassy relaxations, and amorphous rheology, all focused on molecular mechanisms in base materials. The organizing principle of Molecular Mechanisms in Materials is multiscale modeling and simulation, where conceptual models and simulation techniques are linked across the micro-to-macro length and time scales to control the outcome of specific materials processes. Each essay addresses a specific standalone topic of materials phenomena while also recognizing the larger context of materials science and technology. Individual case studies serve both as standalone essays and companion pieces to each other. Indeed, the global transformation of science and technology is well underway: in his epilogue, Yip discusses the potential of artificial intelligence and machine learning to enhance future materials for societal benefits in the face of global challenges such as climate change, energy sustainability, infrastructure renewal, and nuclear arms control.
Author: Martin Hÿtch
Publisher: Elsevier
ISBN: 0323988644
Category : Technology & Engineering
Languages : en
Pages : 268
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Book Description
Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series - Updated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods
Author: Ioan R. Ionescu
Publisher: John Wiley & Sons
ISBN: 1786305313
Category : Science
Languages : en
Pages : 290
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Book Description
Chronicling the 11th US France Mechanics and physics of solids at macro- and nano-scales symposium, organized by ICACM (International Center for Applied Computational Mechanics) in Paris, June 2018, this book addresses the breadth of issues raised. It covers a comprehensive range of scientific and technological topics (from elementary plastic events in metals and materials in harsh environments to bio-engineered and bio-mimicking materials), offering a representative perspective on state-of-the-art research and materials. Expounding on the issues related to mesoscale modeling, the first part of the book addresses the representation of plastic deformation at both extremes of the scale between nano- and macro- levels. The second half of the book examines the mechanics and physics of soft materials, polymers and materials made from fibers or molecular networks.
Author: Siegfried Böhme
Publisher: Springer Science & Business Media
ISBN: 3662123169
Category : Science
Languages : en
Pages : 882
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Book Description
Author: Siegfried Böhme
Publisher: Springer Science & Business Media
ISBN: 3662123258
Category : Science
Languages : en
Pages : 851
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Book Description
Author: Siegfried Böhme
Publisher: Springer Science & Business Media
ISBN: 366212310X
Category : Science
Languages : en
Pages : 796
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Book Description
Astronomy and Astrophysics Abstracts, which has appeared in semi-annual volumes since 1969, is de voted to the recording, summarizing and indexing of astronomical publications throughout the world. It is prepared under the auspices of the International Astronomical Union (according to a resolution adopted at the 14th General Assembly in 1970). Astronomy and Astrophysics Abstracts aims to present a comprehensive documentation of literature in all fields of astronomy and astrophysics. Every effort will be made to ensure that the average time interval between the date of receipt of the original literature and publication of the abstracts will not exceed eight months. This time interval is near to that achieved by monthly abstracting journals, com pared to which our system of accumulating abstracts for about six months offers the advantage of greater convenience for the user. Volume 20 contains literature published in 1977 and received before February 20, 1978; some older literature which was received late and which is not recorded in earlier volumes is also included. We acknowledge with thanks contributions to this volume by Dr. J. BouSka, Prague, who surveyed journals and publications in Czech and supplied us with abstracts in English, and by Prof. P. Brosche, Bonn, who supplied us with literature concerning some border fields of astronomy.
Author: S. Böhme
Publisher: Springer Science & Business Media
ISBN: 366212307X
Category : Science
Languages : en
Pages : 869
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Book Description
Astronomy and Astrophysics Abstracts, which has appeared in semi-annual volumes since 1969, is de voted to the recording, summarizing and indexing of astronomical publications throughout the world. It is prepared under the auspices of the International Astronomical Union (according to a resolution adopted at the 14th General Assembly in 1970). Astronomy and Astrophysics Abstracts aims to present a comprehensive documentation of literature in all fields of astronomy and astrophysics. Every effort will be made to ensure that the average time interval between the date of receipt of the original literature and publication of the abstracts will not exceed eight months. This time interval is near to that achieved by monthly abstracting journals, com pared to which our system of accumulating abstracts for about six months offers the advantage of greater convenience for the user. Volume 18 contains literature published in 1976 and received before March 1, 1977; some older liter ature which was received late and which is not recorded in earlier volumes is also included.
