Author: Publisher:
ISBN:
Category : Microscopy
Languages : en
Pages : 380
Book Description
The Journal of Microscopy and Natural Science
Author: Publisher:
ISBN:
Category : Microscopy
Languages : en
Pages : 380
Book Description
The Journal of Microscopy and Natural Science: the Journal of the Postal Microscopical Society
Author: Publisher:
ISBN:
Category : Microscopy
Languages : en
Pages : 322
Book Description
The Journal of Microscopy and Natural Science
Author: Postal Microscopical SocietyPublisher:
ISBN:
Category : Microscope and microscopy
Languages : en
Pages : 364
Book Description
Journal of Microscopy and Natural Science; the Journal of the Postal Microscopial Society and the Wesley Naturalists' Society
Author: Publisher:
ISBN:
Category : Microscopy
Languages : en
Pages : 322
Book Description
International Journal of Microscopy & Natural Science
Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 494
Book Description
The Journal of Microscopy and Natural Science
Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
The Microscope and how to Use it
Author: V.A. LathamPublisher:
ISBN:
Category :
Languages : en
Pages : 14
Book Description
Natural Science
Author: Publisher:
ISBN:
Category : Natural history
Languages : en
Pages : 458
Book Description
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Author: Gerd KauppPublisher: Springer Science & Business Media
ISBN: 3540284729
Category : Technology & Engineering
Languages : en
Pages : 302
Book Description
Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
Catalogue of the Periodicals and Other Serial Publications
Author: United States. Department of Agriculture. LibraryPublisher:
ISBN:
Category : Agriculture
Languages : en
Pages : 940
Book Description
