Testing Semiconductor Memories PDF Download
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Author: A. J. van de Goor
Publisher:
ISBN: 9789080427617
Category : Semiconductor storage devices
Languages : en
Pages : 512
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Book Description
Author: A. J. van de Goor
Publisher:
ISBN: 9789080427617
Category : Semiconductor storage devices
Languages : en
Pages : 512
Get Book Here
Book Description
Author: Ashok K. Sharma
Publisher: Wiley-IEEE Press
ISBN: 9780780310001
Category : Technology & Engineering
Languages : en
Pages : 480
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Book Description
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
Author: Said Hamdioui
Publisher: Springer Science & Business Media
ISBN: 1475767064
Category : Technology & Engineering
Languages : en
Pages : 231
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Book Description
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Author: A. J. van de Goor
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 542
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Book Description
Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is introduced along with tests for these models. The author also presents algorithms of relevant fault models, together with proofs of their correctness. Special attention is given to why a fault model belongs to a particular class and why it is of interest. A software package, suitable for use on IBM PCs and compatibles, is also available which consists of a set of memory test programs and a simulation package demonstrating how the algorithms are executed and the relationship of the algorithm with the memory
Author: Ashok K. Sharma
Publisher: Wiley-IEEE Press
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 680
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Book Description
A valuable reference for the most vital microelectronic components in the marketplace DRAMs are the technology drivers of high volume semiconductor fabrication processes for new generation products that, in addition to computer markets, are finding increased usage in automotive, aviation, military and space, telecommunications, and wireless industries. A new generation of high-density and high-performance memory architectures evolving for mass storage devices, including embedded memories and nonvolatile flash memories, are serving a diverse range of applications. Comprehensive and up to date, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers professionals in the semiconductor and related industries an in-depth review of advanced semiconductor memories technology developments. It provides details on: Static Random Access Memory technologies including advanced architectures, low voltage SRAMs, fast SRAMs, SOI SRAMs, and specialty SRAMs (multiport, FIFOs, CAMs) High Performance Dynamic Random Access Memory-DDRs, synchronous DRAM/SGRAM features and architectures, EDRAM, CDRAM, Gigabit DRAM scaling issues and architectures, multilevel storage DRAMs, and SOI DRAMs Applications-specific DRAM architectures and designs - VRAMs, DDR SGRAMs, RDRAMs, SLDRAMs, 3-D RAM Advanced Nonvolatile Memory designs and technologies, including floating gate cell theory, EEPROM/flash memory cell design, and multilevel flash FRAMs and reliability issues Embedded memory designs and applications, including cache, merged processor, DRAM architectures, memory cards, and multimedia applications Future memory directions with megabytes to terabytes storage capacities using RTDs, single electron memories, etc. A continuation of the topics introduced in Semiconductor Memories: Technology, Testing, and Reliability, the author's earlier work, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers a much-needed reference to the major developments and future directions of advanced semiconductor memory technology.
Author: Andrea Redaelli
Publisher: Woodhead Publishing
ISBN: 0128209461
Category : Technology & Engineering
Languages : en
Pages : 364
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Book Description
Semiconductor Memories and Systems provides a comprehensive overview of the current state of semiconductor memory at the technology and system levels. After an introduction on market trends and memory applications, the book focuses on mainstream technologies, illustrating their current status, challenges and opportunities, with special attention paid to scalability paths. Technologies discussed include static random access memory (SRAM), dynamic random access memory (DRAM), non-volatile memory (NVM), and NAND flash memory. Embedded memory and requirements and system level needs for storage class memory are also addressed. Each chapter covers physical operating mechanisms, fabrication technologies, and the main challenges to scalability. Finally, the work reviews the emerging trends for storage class memory, mainly focusing on the advantages and opportunities of phase change based memory technologies. Features contributions from experts from leading companies in semiconductor memory Discusses physical operating mechanisms, fabrication technologies and paths to scalability for current and emerging semiconductor memories Reviews primary memory technologies, including SRAM, DRAM, NVM and NAND flash memory Includes emerging storage class memory technologies such as phase change memory
Author: Ashok K. Sharma
Publisher:
ISBN:
Category : Electronic book
Languages : en
Pages : 462
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Book Description
Author: Thomas Joseph Bilotta
Publisher:
ISBN:
Category :
Languages : en
Pages : 134
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Book Description
Author: Soft Test, Inc
Publisher:
ISBN: 9780965879774
Category : Technology & Engineering
Languages : en
Pages :
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Book Description
Engineering reference for testing semiconductor memory devices.
