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Author: Christine Tursky
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 344
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Book Description
Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractional-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.
Author: Christine Tursky
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 344
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Book Description
Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractional-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.
Author: Alex Xu
Publisher: Independently Published
ISBN:
Category :
Languages : en
Pages : 280
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Book Description
The system design interview is considered to be the most complex and most difficult technical job interview by many. Those questions are intimidating, but don't worry. It's just that nobody has taken the time to prepare you systematically. We take the time. We go slow. We draw lots of diagrams and use lots of examples. You'll learn step-by-step, one question at a time.Don't miss out.What's inside?- An insider's take on what interviewers really look for and why.- A 4-step framework for solving any system design interview question.- 16 real system design interview questions with detailed solutions.- 188 diagrams to visually explain how different systems work.
Author: John Ousterhout
Publisher: Yaknyam Publishing
ISBN: 9781732102200
Category :
Languages : en
Pages :
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Book Description
Author: Erik Larsson
Publisher: Springer Science & Business Media
ISBN: 9781402032073
Category : Technology & Engineering
Languages : en
Pages : 418
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Book Description
Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective. Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893
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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author: Zainalabedin Navabi
Publisher: Springer Science & Business Media
ISBN: 1441975489
Category : Technology & Engineering
Languages : en
Pages : 452
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Book Description
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Author: Steve Freeman
Publisher: Pearson Education
ISBN: 0321699769
Category : Computers
Languages : en
Pages : 762
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Book Description
Test-Driven Development (TDD) is now an established technique for delivering better software faster. TDD is based on a simple idea: Write tests for your code before you write the code itself. However, this "simple" idea takes skill and judgment to do well. Now there's a practical guide to TDD that takes you beyond the basic concepts. Drawing on a decade of experience building real-world systems, two TDD pioneers show how to let tests guide your development and “grow” software that is coherent, reliable, and maintainable. Steve Freeman and Nat Pryce describe the processes they use, the design principles they strive to achieve, and some of the tools that help them get the job done. Through an extended worked example, you’ll learn how TDD works at multiple levels, using tests to drive the features and the object-oriented structure of the code, and using Mock Objects to discover and then describe relationships between objects. Along the way, the book systematically addresses challenges that development teams encounter with TDD—from integrating TDD into your processes to testing your most difficult features. Coverage includes Implementing TDD effectively: getting started, and maintaining your momentum throughout the project Creating cleaner, more expressive, more sustainable code Using tests to stay relentlessly focused on sustaining quality Understanding how TDD, Mock Objects, and Object-Oriented Design come together in the context of a real software development project Using Mock Objects to guide object-oriented designs Succeeding where TDD is difficult: managing complex test data, and testing persistence and concurrency
Author: Simon Amey
Publisher: Packt Publishing Ltd
ISBN: 1804614734
Category : Computers
Languages : en
Pages : 426
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Book Description
A guide to writing comprehensive test plans covering exploratory testing and feature specification; black and white box testing; security, usability, and maintainability; and load and stress testing Key FeaturesCover all key forms of testing for modern applications systematicallyUnderstand anti-patterns and pitfalls in system design with the help of practical examplesLearn the strengths and weaknesses of different forms of testing and how to combine them effectivelyBook Description Software Test Design details best practices for testing software applications and writing comprehensive test plans. Written by an expert with over twenty years of experience in the high-tech industry, this guide will provide you with training and practical examples to improve your testing skills. Thorough testing requires a thorough understanding of the functionality under test, informed by exploratory testing and described by a detailed functional specification. This book is divided into three sections, the first of which will describe how best to complete those tasks to start testing from a solid foundation. Armed with the feature specification, functional testing verifies the visible behavior of features by identifying equivalence partitions, boundary values, and other key test conditions. This section explores techniques such as black- and white-box testing, trying error cases, finding security weaknesses, improving the user experience, and how to maintain your product in the long term. The final section describes how best to test the limits of your application. How does it behave under failure conditions and can it recover? What is the maximum load it can sustain? And how does it respond when overloaded? By the end of this book, you will know how to write detailed test plans to improve the quality of your software applications. What you will learnUnderstand how to investigate new features using exploratory testingDiscover how to write clear, detailed feature specifi cationsExplore systematic test techniques such as equivalence partitioningUnderstand the strengths and weaknesses of black- and white-box testingRecognize the importance of security, usability, and maintainability testingVerify application resilience by running destructive testsRun load and stress tests to measure system performanceWho this book is for This book is for anyone testing software projects for mobile, web, or desktop applications. That includes Dedicated QA engineers managing software quality, Test and test automation engineers writing formal test plans, Test and QA managers running teams responsible for testing, Product owners responsible for product delivery, and Developers who want to improve the testing of their code.
Author: Matteo Sonza Reorda
Publisher: Springer Science & Business Media
ISBN: 1846281458
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Author: Peter Marwedel
Publisher: Springer Science & Business Media
ISBN: 9400702574
Category : Technology & Engineering
Languages : en
Pages : 400
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Book Description
Until the late 1980s, information processing was associated with large mainframe computers and huge tape drives. During the 1990s, this trend shifted toward information processing with personal computers, or PCs. The trend toward miniaturization continues and in the future the majority of information processing systems will be small mobile computers, many of which will be embedded into larger products and interfaced to the physical environment. Hence, these kinds of systems are called embedded systems. Embedded systems together with their physical environment are called cyber-physical systems. Examples include systems such as transportation and fabrication equipment. It is expected that the total market volume of embedded systems will be significantly larger than that of traditional information processing systems such as PCs and mainframes. Embedded systems share a number of common characteristics. For example, they must be dependable, efficient, meet real-time constraints and require customized user interfaces (instead of generic keyboard and mouse interfaces). Therefore, it makes sense to consider common principles of embedded system design. Embedded System Design starts with an introduction into the area and a survey of specification models and languages for embedded and cyber-physical systems. It provides a brief overview of hardware devices used for such systems and presents the essentials of system software for embedded systems, like real-time operating systems. The book also discusses evaluation and validation techniques for embedded systems. Furthermore, the book presents an overview of techniques for mapping applications to execution platforms. Due to the importance of resource efficiency, the book also contains a selected set of optimization techniques for embedded systems, including special compilation techniques. The book closes with a brief survey on testing. Embedded System Design can be used as a text book for courses on embedded systems and as a source which provides pointers to relevant material in the area for PhD students and teachers. It assumes a basic knowledge of information processing hardware and software. Courseware related to this book is available at http://ls12-www.cs.tu-dortmund.de/~marwedel.
