Test Pattern Generation for Sequential Circuits Using Multiple Clock Partitions PDF Download
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Author: Sridhar Ramakrishna
Publisher:
ISBN:
Category :
Languages : en
Pages : 50
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Author: Sridhar Ramakrishna
Publisher:
ISBN:
Category :
Languages : en
Pages : 50
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Author: Kee Sup Kim
Publisher:
ISBN:
Category :
Languages : en
Pages : 386
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Author: David Huang
Publisher: The Electrochemical Society
ISBN: 1566777038
Category : Science
Languages : en
Pages : 1124
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ISTC/CSTIC is an annual semiconductor technology conference covering all the aspects of semiconductor technology and manufacturing, including devices, design, lithography, integration, materials, processes, manufacturing as well as emerging semiconductor technologies and silicon material applications. ISTC/CSTIC 2009 was merged by ISTC (International Semiconductor Technology Conference) and CSTIC (China Semiconductor Technology International Conference), the two industry leading technical conferences in China, and consisted of one plenary session and nine technical symposia. This issue of ECS Transactions contains 159 papers from the conference.
Author: Venkat N. Koripalli
Publisher:
ISBN:
Category :
Languages : en
Pages : 74
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The increase in speed and the shrinking of technology has led to modern day ICs becoming more sensitive to timing related defects. These defects must be rectified to prevent hazards in the circuit. The timing related defects can be identified with At-Speed Testing using the path delay fault model. A subset of the total number of paths known as critical paths cannot be sequentially activated i.e. we cannot find two successive vectors that activate a fault along the path. The elimination of untestable paths helps us to save a lot of time. In this report a new method, called the Launch-on-Shift is used to determine the testability of critical paths. The method uses a vector pair in which the first vector is the scan in steady state vector and the second vector is the function of the first vector.
Author: Yong Chang Kim
Publisher:
ISBN:
Category :
Languages : en
Pages : 172
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Author: Yervant Zorian
Publisher: Springer Science & Business Media
ISBN: 1461561078
Category : Technology & Engineering
Languages : en
Pages : 161
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MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Author: Ajith Abraham
Publisher: Springer Nature
ISBN: 3031648471
Category :
Languages : en
Pages : 523
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Author: Soo Y. Lee
Publisher:
ISBN:
Category :
Languages : en
Pages : 252
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Author: United States. Patent and Trademark Office
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1512
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Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1360
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