Author: Yü Feng
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48
Book Description
Test Pattern Generation for ILA Sequential Circuits
Author: Yü Feng
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48
Book Description
High Quality Test Pattern Generation and Boolean Satisfiability
Author: Stephan Eggersglüß
Publisher: Springer Science & Business Media
ISBN: 1441999760
Category : Technology & Engineering
Languages : en
Pages : 208
Book Description
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
Publisher: Springer Science & Business Media
ISBN: 1441999760
Category : Technology & Engineering
Languages : en
Pages : 208
Book Description
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 804
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 804
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Incremental Test Pattern Generation for Sequential Circuits
Author: Bogdan Madzar
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 228
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 228
Book Description
Masters Theses in the Pure and Applied Sciences
Author: Wade H. Shafer
Publisher: Springer Science & Business Media
ISBN: 1461519691
Category : Science
Languages : en
Pages : 426
Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS)* at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dis semination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all concerned if the printing and distribution of the volumes were handled by an international publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Corporation of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 38 (thesis year 1993) a total of 13,787 thesis titles from 22 Canadian and 164 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this impor tant annual reference work. While Volume 38 reports theses submitted in 1993, on occasion, certain uni versities do report theses submitted in previous years but not reported at the time.
Publisher: Springer Science & Business Media
ISBN: 1461519691
Category : Science
Languages : en
Pages : 426
Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS)* at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dis semination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all concerned if the printing and distribution of the volumes were handled by an international publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Corporation of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 38 (thesis year 1993) a total of 13,787 thesis titles from 22 Canadian and 164 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this impor tant annual reference work. While Volume 38 reports theses submitted in 1993, on occasion, certain uni versities do report theses submitted in previous years but not reported at the time.
Automatic test pattern generation for hierarchical sequential circuits
Author: Heinrich Theodor Vierhaus
Publisher:
ISBN:
Category :
Languages : de
Pages : 19
Book Description
Publisher:
ISBN:
Category :
Languages : de
Pages : 19
Book Description
Sequential Circuit Test Pattern Generation Using Empirical Partial Scan and Distributed Computation
Author: Kee Sup Kim
Publisher:
ISBN:
Category :
Languages : en
Pages : 386
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 386
Book Description
Test Pattern Generation for Sequential Circuits Using Multiple Clock Partitions
Author: Sridhar Ramakrishna
Publisher:
ISBN:
Category :
Languages : en
Pages : 50
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 50
Book Description
Performance of a Parallel Automatic Test Pattern Generation System for Sequential Circuits
Author: Jessica L. Handy
Publisher:
ISBN:
Category :
Languages : en
Pages : 156
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 156
Book Description
Automatic Test Pattern Generation for Synchronous Sequential Circuits
Author: Marinus Hendrik Konijnenburg
Publisher:
ISBN: 9789090120966
Category :
Languages : en
Pages : 226
Book Description
Publisher:
ISBN: 9789090120966
Category :
Languages : en
Pages : 226
Book Description