Author: Petr Klapetek
Publisher: Elsevier
ISBN: 0128133481
Category : Science
Languages : en
Pages : 418
Get Book Here
Book Description
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ - Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques - Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy - Worked examples show quantitative data processing for different SPM analytical techniques
Author: https://www.chinesestandard.net
Publisher: https://www.chinesestandard.net
ISBN:
Category : Social Science
Languages : en
Pages : 2263
Get Book Here
Book Description
This document provides the comprehensive list of Chinese National Standards - Category: GB/T; GBT.
Author: https://www.chinesestandard.net
Publisher: https://www.chinesestandard.net
ISBN:
Category : Social Science
Languages : en
Pages : 110
Get Book Here
Book Description
This document provides the comprehensive list of Chinese National Standards - Category: GB, GB/T Series of year 2024.
Author: https://www.chinesestandard.net
Publisher: https://www.chinesestandard.net
ISBN:
Category : Law
Languages : en
Pages : 7263
Get Book Here
Book Description
This document provides the comprehensive list of Chinese National Standards and Industry Standards (Total 17,000 standards).
Author: Ichiko Misumi
Publisher:
ISBN: 9780750331913
Category : Nanotechnology
Languages : en
Pages : 0
Get Book Here
Book Description
The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.
Author: Jeanne Ayache
Publisher: Springer Science & Business Media
ISBN: 0387981829
Category : Technology & Engineering
Languages : en
Pages : 267
Get Book Here
Book Description
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author: Richard Leach
Publisher:
ISBN: 9780750325240
Category : Metrology
Languages : en
Pages : 0
Get Book Here
Book Description
Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Author: Richard G Compton
Publisher: World Scientific
ISBN: 1786345285
Category : Science
Languages : en
Pages :
Get Book Here
Book Description
he power of electrochemical measurements in respect of thermodynamics, kinetics and analysis is widely recognised but the subject can be unpredictable to the novice even if they have a strong physical and chemical background, especially if they wish to pursue quantitative measurements. Accordingly, some significant experiments are perhaps wisely never attempted while the literature is sadly replete with flawed attempts at rigorous voltammetry. This textbook considers how to implement designing, explaining and interpreting experiments centered on various forms of voltammetry (cyclic, microelectrode, hydrodynamic, etc.). The reader is assumed to have knowledge of physical chemistry equivalent to Master's level but no exposure to electrochemistry in general, or voltammetry in particular. While the book is designed to stand alone, references to important research papers are given to provide an introductory entry into the literature. The third edition contains new material relating to electron transfer theory, experimental requirements, scanning electrochemical microscopy, adsorption, electroanalysis and nanoelectrochemistry.
Author: Sergei V. Kalinin
Publisher: Springer Science & Business Media
ISBN: 0387286683
Category : Technology & Engineering
Languages : en
Pages : 1002
Get Book Here
Book Description
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Author: Frances Harrison Marr
Publisher:
ISBN:
Category : Christian poetry, American
Languages : en
Pages : 194
Get Book Here
Book Description
