Surface Chemical Analysis. Scanning-Probe Microscopy. Definition and Calibration of the Lateral Resolution of a Near-Field Optical Microscope PDF Download
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Author: British Standards Institute Staff
Publisher:
ISBN: 9780580588280
Category :
Languages : en
Pages : 30
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Book Description
Surface chemistry, Chemical analysis and testing, Surfaces, Optics, Optical instruments, Microscopic analysis, Calibration, Optical phenomena
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580588280
Category :
Languages : en
Pages : 30
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Book Description
Surface chemistry, Chemical analysis and testing, Surfaces, Optics, Optical instruments, Microscopic analysis, Calibration, Optical phenomena
Author: Roland Wiesendanger
Publisher: Springer Science & Business Media
ISBN: 3662036061
Category : Technology & Engineering
Languages : en
Pages : 238
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Book Description
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
Author: Ernst Meyer
Publisher: Springer Science & Business Media
ISBN: 3662098016
Category : Science
Languages : en
Pages : 215
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Book Description
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Author: Petr Klapetek
Publisher: Elsevier
ISBN: 0128133481
Category : Science
Languages : en
Pages : 418
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Book Description
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques
Author: OECD
Publisher: OECD Publishing
ISBN: 9264443681
Category :
Languages : en
Pages : 71
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Book Description
This Test Guideline, covering nanomaterials spanning from 1 nm to 1000 nm, is intended for particle size and particle size distribution measurements of nanomaterials.
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580677519
Category :
Languages : en
Pages : 26
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Book Description
Surface chemistry, Surface properties, Surfaces, Chemical analysis and testing, Calibration, Sampling methods, Data representation, Microscopes
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3540274537
Category : Technology & Engineering
Languages : en
Pages : 456
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Book Description
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Author: Dawn Bonnell
Publisher: John Wiley & Sons
ISBN: 047124824X
Category : Science
Languages : en
Pages : 520
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Book Description
A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
Author: Fritz H. Frimmel
Publisher: Springer Science & Business Media
ISBN: 3642103189
Category : Science
Languages : en
Pages : 243
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Book Description
As nanotechnology enters everyday life, engineered nanoparticles (ENP) will find their way into nature, including surface and groundwater. Here, distinguished experts of water chemistry present dedicated methods for the analysis of nanoparticles in the aquatic environment, their distribution and fate. This includes the influence of complex matrices such as wastewater, brown water with natural organic matter (NOM), and high salt concentrations as well as available and future standardized methods. The background of geogenic, natural nanoparticles is considered in a discussion of known environmental effects, including strategies to test for potential effects on human and environmental health.
Author: Seizo Morita
Publisher: Springer Science & Business Media
ISBN: 3540343156
Category : Technology & Engineering
Languages : en
Pages : 207
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Book Description
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
