Author: Terrance E. Conners
Publisher: CRC Press
ISBN: 1000693473
Category : Science
Languages : en
Pages : 357
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Book Description
First published in 1995, Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper. Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods. Each chapter contains: An introduction A description of the technique A discussion of the type of information that can be obtained with the particular technique Practical examples to demonstrate the advantages of the technique
Author: Eero Sjöström
Publisher: Springer Science & Business Media
ISBN: 9783540631026
Category : Science
Languages : en
Pages : 344
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Book Description
In its broadest sense, and according to the traditional conception, wood chemistry is a comprehensive discipline, ranging from fundamental studies to practical applications. The manifold constituents, located in different morphological regions in the wood, results in an extreme complexity of wood chemistry. Ever more sophisticated endeavors needing fundamental studies and advanced analytical methods are necessary in order to delve deeper into various problems in pulping and papermaking. Gradually, new, improved ana lytical methods, originally developed for research purposes, are currently replacing many of the old "routine" methods in practical applications. Because of the expanse of the subject, an attempt to write a book of this size about analytical methods seems, perhaps, too ambitious. Of course, a whole book series of several volumes would be necessary to cover this topic completely. However, there is undoubtedly a need for a more condensed presentation which does not go into experimental details, but is limited to the basic principles of the analytical methods and illustrates their applica tions. The emphasis is on more advanced and potential methods, and partic ularly on those based on different types of spectroscopy and chromatography.
Author: Sergei N. Magonov
Publisher: John Wiley & Sons
ISBN: 3527615105
Category : Technology & Engineering
Languages : en
Pages : 335
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Book Description
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: Mitra Abbaspour
Publisher: Museum of Modern Art, New York
ISBN: 9780870709418
Category : Photography
Languages : en
Pages : 400
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Book Description
OBJECT:PHOTO shifts the dialogue about modernist photography from an emphasis on the subject and the image to the actual photographic object, created by a certain artist at a particular time and present today in its unique physicality. This shift is especially significant for a study of the period during which photography developed a distinctive formal language. A growing awareness of the rarity of images made between the two world wars has altered historians' considerations, encouraging new approaches privileging the originality of each work and the density of references each contains. This richly illustrated publication culminates a four-year collaborative research endeavor between The Museum of Modern Art's Departments of Photography and Conservation, and nearly 30 visiting scholars, on the material and aesthetic evolution of avant-garde photography in the early twentieth century. The 341 modernist photographs known as The Thomas Walther Collection, a major museum acquisition made in 2001, is presented in its entirety, establishing a new standard of depth for the medium. Essays by curators, researchers, and conservators consider the history of collecting from this era to the present and how deepening knowledge has shifted the perspective on the medium; the material facts of the Walther pictures as a baseline for understanding the development of photographic materials in this era; and how the intellectual formation of the writers of critical photographic publications of the era and the societal and cultural pressures of that historical moment inflected the photography's sense of its own history. Together with thematic, object-based case studies of groups of pictures that demonstrate new approaches in specific, divergent examples, these contributions reanimate the dialogue on this formative era in photography.
Author: Terrance E. Conners
Publisher: CRC Press
ISBN: 9780849389924
Category : Science
Languages : en
Pages : 378
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Book Description
Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Modern techniques, including ion mass spectrometry, infrared spectroscopy, and optical profilometry are reviewed in a straightforward manner. This new book provides details on widely used methods and instruments, and discusses how they can be used to attain, for example, contour maps of the microscopic constituents on paper surfaces and accurate analyses of the physical properties of paper. Organized into three sections, Surface Analysis of Paper provides thorough coverage of the physical characteristics of paper, and a clear picture of new and emerging analytical methods. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods. Each chapter contains: An introduction A description of the technique A discussion of the type of information that can be obtained with the particular technique Practical examples to demonstrate the advantages of the technique
Author: John O'Connor
Publisher: Springer Science & Business Media
ISBN: 9783540413301
Category : Science
Languages : en
Pages : 626
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Book Description
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Author: J. Brander
Publisher: Springer Science & Business Media
ISBN: 9400914571
Category : Technology & Engineering
Languages : en
Pages : 283
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Book Description
With the exception of a slight hiccup during the height of the recent environmental movement (during the early 1990s), when for a year or two consumers were prepared to pay a price premium for lower quality recycled paper than for the virgin product, the inexorable improvement in the quality demanded of paper products continues. This demand for quality covers not only the aesthetics ofthe product but also its performance. Moreover, it is becoming increasingly the case that papers designed for a particular use must, as it were incidentally, also perform well in alternative applications. An example is that of office and printing papers, which are expected to perform as well in copier machines as in all the various forms of impact and non-impact printers. But even greater demands are made in other product areas, where board designed for dry foods can also be expected to protect moist and fatty materials and be made of 100% recycled fibre. The need to isolate foodstuffs from some of the contaminants that can affect recycled board is a· serious challenge. Thus, papermakers are constantly striving to meet a broadening spectrum of demands on their products; often while accepting declining quality of raw materials. The product design philosophy that has arisen in response to this is increasingly to isolate the bulk of a paper from its uses: to engineer the needed performance characteristics into the paper surfaces while more or less ignoring what happens inside.
Author: A.W. Czanderna
Publisher: Elsevier
ISBN: 0444596453
Category : Science
Languages : en
Pages : 496
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Book Description
Methods of Surface Analysis deals with the determination of the composition of surfaces and the identification of species attached to the surface. The text applies methods of surface analysis to obtain a composition depth profile after various stages of ion etching or sputtering. The composition at the solid—solid interface is revealed by systematically removing atomic planes until the interface of interest is reached, in which the investigator can then determine its composition. The book reviews the effect of ion etching on the results obtained by any method of surface analysis including the effect of the rate of etching, incident energy of the bombarding ion, the properties of the solid, the effect of the ion etching on generating an output signal of electrons, ions, or neutrals. The text also describes the effect of the residual gases in the vacuum environment. The book considers the influence of the sample geometry, of the type (metal, insulator, semiconductor, organic), and of the atomic number can have on surface analysis. The text describes in detail low energy ion scattering spectroscopy, X-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectroscopy, and infrared reflection-absorption spectroscopy. The book can prove useful for researchers, technicians, and scientists whose works involve organic chemistry, analytical chemistry, and other related fields of chemistry, such as physical chemistry or inorganic chemistry.
Author: Henry Enfield Roscoe
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 494
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Book Description
