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Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 307
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Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 307
Get Book
Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: Sergei N. Magonov
Publisher: John Wiley & Sons
ISBN: 3527615105
Category : Technology & Engineering
Languages : en
Pages : 335
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Book Description
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Author: John C. Vickerman
Publisher: John Wiley & Sons
ISBN: 1119965519
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Author: D. Briggs
Publisher: Cambridge University Press
ISBN: 0521352223
Category : Science
Languages : en
Pages : 215
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Book Description
This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
Author: Giancarlo Dal Moro
Publisher: Elsevier
ISBN: 0128011408
Category : Science
Languages : en
Pages : 252
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Book Description
Seismic Wave Analysis for Near Surface Applications presents the foundational tools necessary to properly analyze surface waves acquired according to both active and passive techniques. Applications range from seismic hazard studies, geotechnical surveys and the exploration of extra-terrestrial bodies. Surface waves have become critical to near-surface geophysics both for geotechnical goals and seismic-hazard studies. Included in this book are the related theories, approaches and applications which the lead editor has assembled from a range of authored contributions carefully selected from the latest developments in research. A unique blend of theory and practice, the book’s concepts are based on exhaustive field research conducted over the past decade from the world’s leading seismologists and geophysicists. Edited by a geophysicist with nearly 20 years of experience in research, consulting, and geoscience software development. Nearly 100 figures, photographs, and examples aid in the understanding of fundamental concepts and techniques Presents the latest research in seismic wave characteristics and analysis, the fundamentals of signal processing, wave data acquisition and inversion, and the latest developments in horizontal-to-vertical spectral ratio (HVSR). Each chapter features a real-world case study—13 in all—to bring the book’s key principles to life.
Author: D.J. O'Connor
Publisher: Springer Science & Business Media
ISBN: 366205227X
Category : Technology & Engineering
Languages : en
Pages : 588
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Book Description
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
Author: J. C. Vickerman
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 457
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Book Description
Author: J. M. Walls
Publisher: CUP Archive
ISBN: 9780521386906
Category : Science
Languages : en
Pages : 356
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Book Description
Author: Tery Lynn Barr
Publisher: ASTM International
ISBN: 9780803102774
Category : Science
Languages : en
Pages : 220
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Book Description
Author: Symposium on Progress in Quantitative Surface Analysis
Publisher: ASTM International
ISBN: 9780803105430
Category : Analytical chemistry
Languages : en
Pages : 220
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Book Description
