Study Guide Vol 1 to accompany FAP Volume 1 (CH 1-12) PDF Download
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Author: John Wild
Publisher: McGraw-Hill/Irwin
ISBN: 9780073266435
Category : Business & Economics
Languages : en
Pages : 300
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Book Description
Covers each chapter and appendix with reviews of learning objectives, outlines of the chapters, summaries of chapter materials, and additional problems with solutions.
Author: John Wild
Publisher: McGraw-Hill/Irwin
ISBN: 9780073266435
Category : Business & Economics
Languages : en
Pages : 300
Get Book Here
Book Description
Covers each chapter and appendix with reviews of learning objectives, outlines of the chapters, summaries of chapter materials, and additional problems with solutions.
Author: John Wild
Publisher: McGraw-Hill/Irwin
ISBN: 9780077338176
Category : Accounting
Languages : en
Pages : 0
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Book Description
Covers each chapter and appendix with reviews of learning objectives, outlines of the chapters, summaries of chapter materials, and additional problems with solutions.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 180
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Book Description
Author: John Bonner
Publisher:
ISBN:
Category : United States
Languages : en
Pages : 945
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Book Description
Author:
Publisher:
ISBN:
Category : Bibliography
Languages : en
Pages : 878
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 720
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Book Description
Author: United States. Office of Education
Publisher:
ISBN:
Category : Education
Languages : en
Pages : 1226
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Book Description
Author:
Publisher:
ISBN:
Category : Bibliography
Languages : en
Pages : 1414
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Book Description
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author: Marco Dorigo
Publisher: MIT Press
ISBN: 9780262042192
Category : Computers
Languages : en
Pages : 324
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Book Description
An overview of the rapidly growing field of ant colony optimization that describes theoretical findings, the major algorithms, and current applications. The complex social behaviors of ants have been much studied by science, and computer scientists are now finding that these behavior patterns can provide models for solving difficult combinatorial optimization problems. The attempt to develop algorithms inspired by one aspect of ant behavior, the ability to find what computer scientists would call shortest paths, has become the field of ant colony optimization (ACO), the most successful and widely recognized algorithmic technique based on ant behavior. This book presents an overview of this rapidly growing field, from its theoretical inception to practical applications, including descriptions of many available ACO algorithms and their uses. The book first describes the translation of observed ant behavior into working optimization algorithms. The ant colony metaheuristic is then introduced and viewed in the general context of combinatorial optimization. This is followed by a detailed description and guide to all major ACO algorithms and a report on current theoretical findings. The book surveys ACO applications now in use, including routing, assignment, scheduling, subset, machine learning, and bioinformatics problems. AntNet, an ACO algorithm designed for the network routing problem, is described in detail. The authors conclude by summarizing the progress in the field and outlining future research directions. Each chapter ends with bibliographic material, bullet points setting out important ideas covered in the chapter, and exercises. Ant Colony Optimization will be of interest to academic and industry researchers, graduate students, and practitioners who wish to learn how to implement ACO algorithms.
