Author: Gregg S. Hagashi
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 576
Book Description
The focus of semiconductor wafer processing is rapidly changing. Pure device performance is no longer sufficient to ensure a technology's success as IC chips approach 1GB. Yield, reliability, cost and manufacturability are principal drivers of the industry. Great strides have been made in understanding the science and impact of front-end (pre-metal) chemical surface preparations and are beginning to influence the 'real' technology and its evolution. Efforts in understanding particle and metals removal, along with Si surface etching and microroughness are prime examples of areas where work is beginning to pay off together with processes related to the back-end (post-metal). The focus of this book is to report new findings and to discuss surface preparation with an emphasis on gaining a mechanistic understanding of the underlying science upon which the technology is based. Topics include: megasonic cleaning; SC1 technology; surface preparation and gate oxide reliability; CMP/CMP cleaning; post-etch processing; surface microroughness; wet chemical cleaning and gate oxide integrity; analytical studies of surfaces; wet chemical cleaning/etching; dry wafer cleaning; and environmentally friendly processing.
Science and Technology of Semiconductor Surface Preparation: Volume 477
Author: Gregg S. Hagashi
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 576
Book Description
The focus of semiconductor wafer processing is rapidly changing. Pure device performance is no longer sufficient to ensure a technology's success as IC chips approach 1GB. Yield, reliability, cost and manufacturability are principal drivers of the industry. Great strides have been made in understanding the science and impact of front-end (pre-metal) chemical surface preparations and are beginning to influence the 'real' technology and its evolution. Efforts in understanding particle and metals removal, along with Si surface etching and microroughness are prime examples of areas where work is beginning to pay off together with processes related to the back-end (post-metal). The focus of this book is to report new findings and to discuss surface preparation with an emphasis on gaining a mechanistic understanding of the underlying science upon which the technology is based. Topics include: megasonic cleaning; SC1 technology; surface preparation and gate oxide reliability; CMP/CMP cleaning; post-etch processing; surface microroughness; wet chemical cleaning and gate oxide integrity; analytical studies of surfaces; wet chemical cleaning/etching; dry wafer cleaning; and environmentally friendly processing.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 576
Book Description
The focus of semiconductor wafer processing is rapidly changing. Pure device performance is no longer sufficient to ensure a technology's success as IC chips approach 1GB. Yield, reliability, cost and manufacturability are principal drivers of the industry. Great strides have been made in understanding the science and impact of front-end (pre-metal) chemical surface preparations and are beginning to influence the 'real' technology and its evolution. Efforts in understanding particle and metals removal, along with Si surface etching and microroughness are prime examples of areas where work is beginning to pay off together with processes related to the back-end (post-metal). The focus of this book is to report new findings and to discuss surface preparation with an emphasis on gaining a mechanistic understanding of the underlying science upon which the technology is based. Topics include: megasonic cleaning; SC1 technology; surface preparation and gate oxide reliability; CMP/CMP cleaning; post-etch processing; surface microroughness; wet chemical cleaning and gate oxide integrity; analytical studies of surfaces; wet chemical cleaning/etching; dry wafer cleaning; and environmentally friendly processing.
Specimen Preparation for Transmission Electron Microscopy of Materials IV
Author: Ron M. Anderson
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 320
Book Description
Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This book from MRS, the fourth in a successful series, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the book are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semiconducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 320
Book Description
Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This book from MRS, the fourth in a successful series, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the book are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semiconducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.
Low-dielectric Constant Materials
Author:
Publisher:
ISBN:
Category : Electric insulators and insulation
Languages : en
Pages : 320
Book Description
Publisher:
ISBN:
Category : Electric insulators and insulation
Languages : en
Pages : 320
Book Description
Gallium Nitride and Related Materials
Author:
Publisher:
ISBN:
Category : Electroluminescent devices
Languages : en
Pages : 538
Book Description
Publisher:
ISBN:
Category : Electroluminescent devices
Languages : en
Pages : 538
Book Description
III-V Nitrides
Author: Fernando A. Ponce
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1290
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1290
Book Description
Advanced Catalytic Materials
Author:
Publisher:
ISBN:
Category : Catalysts
Languages : en
Pages : 334
Book Description
Publisher:
ISBN:
Category : Catalysts
Languages : en
Pages : 334
Book Description
Rapid Thermal and Integrated Processing
Author:
Publisher:
ISBN:
Category : Rapid thermal processing
Languages : en
Pages : 460
Book Description
Publisher:
ISBN:
Category : Rapid thermal processing
Languages : en
Pages : 460
Book Description
Materials Reliability in Microelectronics
Author:
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 488
Book Description
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 488
Book Description
High-temperature Ordered Intermetallic Alloys
Author:
Publisher:
ISBN:
Category : Heat resistant alloys
Languages : en
Pages : 808
Book Description
Publisher:
ISBN:
Category : Heat resistant alloys
Languages : en
Pages : 808
Book Description
Thermoelectric Materials
Author:
Publisher:
ISBN:
Category : Electric power production
Languages : en
Pages : 374
Book Description
Publisher:
ISBN:
Category : Electric power production
Languages : en
Pages : 374
Book Description