Structural and Electronic Characterization on Energy-related Materials Using TEM

Structural and Electronic Characterization on Energy-related Materials Using TEM PDF Author: Hee Joon Jung
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Book Description
The world's growing energy needs will involve not one but a harmonious collection of extremely efficient energy technologies that will work in concert to produce, store, and use the large amounts of energy that humans will soon demand. To provide a scientific establishment for break-out high-efficiency, cost-effective energy technologies, research activities have been focused on manipulation of materials at the nanometer scale to increase efficiency of energy conversion devices and exploitation of fundamental advances in charge transport, light absorption, and reaction thermodynamics and kinetics to improve performance and efficiency in energy conversion devices like solar cell, fuel cell, and photoelectrochemical (PEC) cell. To achieve these goals, we need to understand how nano-structuring modifies and governs the properties of materials, and how to control dimensionality and confinement to learn insights on model energy conversion materials, structures and devices. Transmission Electron Microscopy (TEM) with additional advanced functions enables us to approach profound understanding of the fundamental relationship between chemical / electronic / optical properties of materials and origin (crystal structure, composition, size, shape) of them through the characterization at atomic or nano/micro scale. This dissertation will mainly deal with the TEM characterization on the energy-related materials for the solar cell and fuel cell (especially, solid oxide fuel cell) using a variety of different TEM techniques. The most of sample was prepared by conventional TEM preparation method or site-specific lift-out technique using a focused ion beam (FIB). Subsequent TEM studies on these energy-related materials lead to have deep understanding of the relationship between the atomic scale structures with the other chemical/optical/electronic property. In the chapter 1, the brief concept and background of the solar cell and fuel cell will be included. In the chapter 2, the details of TEM/STEM background for imaging and diffraction with a variety of additional TEM spectroscopic techniques like X-ray energy dispersive (EDS) and electron energy loss spectroscopy (EELS) are included because this dissertation is mainly focused on TEM characterization. And the background of FIB/SEM and sample preparation using FIB is followed. In the chapter 3, the TEM characterization on the diverse kinds of materials of the 2nd and 3rd generation solar cells mainly made by atomic layer deposition (ALD) is dealt with using different types of spectroscopic techniques. ZnS, CdS, ZnxCd1-xS, PbS deposited by ALD for the 2nd and 3rd generation solar cell and the advanced bottom electrode structure are included. Each sub-chapter in the chapter 3 is based on the published papers as follows: Chapter 3-2: "Atomic layer deposition of ZnS via in situ production of H2S", J.R. Bakke, J.S. King, H.J. Jung, R. Sinclair, S.F. Bent, Thin Solid Films. 518. pp. 5400-5408 (2010). Chapter 3-3: "Atomic Layer Deposition of CdS Films", Jonathan R. Bakke, Hee Joon Jung, Jukka T. Tanskanen, Robert Sinclair, and Stacey F. Bent, Chem. Mater. 22, 4669-4678 (2010). Chapter 3-4: "Atomic Layer Deposition of CdxZn1-xS Films", Jonathan. R. Bakke, Jukka T. Tanskanen, Hee Joon Jung, Robert Sinclair, Stacey F. Bent, J. Mater. Chem., 21, 743-751 (2011). Chapter 3-5: "Scanning Tunneling Spectroscopy of Lead Sulfide Quantum Wells Fabricated by Atomic Layer Deposition for Band Gap Engineering", Wonyoung Lee, Neil P. Dasgupta, Hee Joon Jung, Jung-Rok Lee, Robert Sinclair and Fritz B. Prinz, Nanotechnology, 21, 485402, 4pp. (2010). Chapter 3-6: "Atomic Layer Deposition of Lead Sulfide Quantum Dots on Nanowire Surfaces", Hee Joon Jung, Neil Dasgupta, Orlando Trejo, Matthew T. McDowell, Aaron Hryciw, Mark Brongersma, Robert Sinclair and Fritz B. Prinz, Nano Lett., 11 (3), pp 934-940 (2011). Chapter 3-7: "Evidence For Shape-Induced Bandgap Variations Within a Single Quantum Dot", Hee Joon Jung, Neil P. Dasgupta, Philip B. Van Stockum, Ai Leen Koh, Robert Sinclair, Nature Nanotehchnol., (2012) under review. Chapter 3-8: "Nickel Silicide Nanowire Arrays for Anti-Reflective Electrodes in Photovoltaics", Neil P. Dasgupta, Shicheng Xu, Hee Joon Jung, Andrei Iancu, Rainer Fasching, Robert Sinclair, Fritz B. Prinz, Adv. Funct. Mater., Vol. 22, Issue 17, 3650-3657 (2012). In chapter 4, the TEM characterization on the materials of the solid oxide fuel cells which Yttrium-doped Barium Zirconate (BYZ) by the atomic layer deposition (ALD) and Gadolinia (Ge2O3)-doped Ceria (CeO2) by the pulsed laser deposition (PLD) is dealt with. Each sub-chapter in the chapter 4 is based on the published papers as follows: Chapter 4-2: "Effect of crystallinity on ionic conductivity of Y-doped Barium Zirconate", Y.B. Kim, T.M. Gur, H.J. Jung, S. Kang, R. Sinclair, F.B. Prinz, Solid State Ionics, Vol. 198, Issue 1, 19, 39-46 (2011). Chapter 4-3: "Oxygen Surface Exchange at Grain Boundaries of Oxide Ion Conductors", Wonyoung Lee, Hee Joon Jung, Min Hwan Lee, Young-Beom Kim, Joong Sun Park, Robert Sinclair, and Fritz B. Prinz, Adv. Funct. Mater., Vol. 22, Issue 5, 965--971 (2012).

Structural and Electronic Characterization on Energy-related Materials Using TEM

Structural and Electronic Characterization on Energy-related Materials Using TEM PDF Author: Hee Joon Jung
Publisher:
ISBN:
Category :
Languages : en
Pages :

Get Book Here

Book Description
The world's growing energy needs will involve not one but a harmonious collection of extremely efficient energy technologies that will work in concert to produce, store, and use the large amounts of energy that humans will soon demand. To provide a scientific establishment for break-out high-efficiency, cost-effective energy technologies, research activities have been focused on manipulation of materials at the nanometer scale to increase efficiency of energy conversion devices and exploitation of fundamental advances in charge transport, light absorption, and reaction thermodynamics and kinetics to improve performance and efficiency in energy conversion devices like solar cell, fuel cell, and photoelectrochemical (PEC) cell. To achieve these goals, we need to understand how nano-structuring modifies and governs the properties of materials, and how to control dimensionality and confinement to learn insights on model energy conversion materials, structures and devices. Transmission Electron Microscopy (TEM) with additional advanced functions enables us to approach profound understanding of the fundamental relationship between chemical / electronic / optical properties of materials and origin (crystal structure, composition, size, shape) of them through the characterization at atomic or nano/micro scale. This dissertation will mainly deal with the TEM characterization on the energy-related materials for the solar cell and fuel cell (especially, solid oxide fuel cell) using a variety of different TEM techniques. The most of sample was prepared by conventional TEM preparation method or site-specific lift-out technique using a focused ion beam (FIB). Subsequent TEM studies on these energy-related materials lead to have deep understanding of the relationship between the atomic scale structures with the other chemical/optical/electronic property. In the chapter 1, the brief concept and background of the solar cell and fuel cell will be included. In the chapter 2, the details of TEM/STEM background for imaging and diffraction with a variety of additional TEM spectroscopic techniques like X-ray energy dispersive (EDS) and electron energy loss spectroscopy (EELS) are included because this dissertation is mainly focused on TEM characterization. And the background of FIB/SEM and sample preparation using FIB is followed. In the chapter 3, the TEM characterization on the diverse kinds of materials of the 2nd and 3rd generation solar cells mainly made by atomic layer deposition (ALD) is dealt with using different types of spectroscopic techniques. ZnS, CdS, ZnxCd1-xS, PbS deposited by ALD for the 2nd and 3rd generation solar cell and the advanced bottom electrode structure are included. Each sub-chapter in the chapter 3 is based on the published papers as follows: Chapter 3-2: "Atomic layer deposition of ZnS via in situ production of H2S", J.R. Bakke, J.S. King, H.J. Jung, R. Sinclair, S.F. Bent, Thin Solid Films. 518. pp. 5400-5408 (2010). Chapter 3-3: "Atomic Layer Deposition of CdS Films", Jonathan R. Bakke, Hee Joon Jung, Jukka T. Tanskanen, Robert Sinclair, and Stacey F. Bent, Chem. Mater. 22, 4669-4678 (2010). Chapter 3-4: "Atomic Layer Deposition of CdxZn1-xS Films", Jonathan. R. Bakke, Jukka T. Tanskanen, Hee Joon Jung, Robert Sinclair, Stacey F. Bent, J. Mater. Chem., 21, 743-751 (2011). Chapter 3-5: "Scanning Tunneling Spectroscopy of Lead Sulfide Quantum Wells Fabricated by Atomic Layer Deposition for Band Gap Engineering", Wonyoung Lee, Neil P. Dasgupta, Hee Joon Jung, Jung-Rok Lee, Robert Sinclair and Fritz B. Prinz, Nanotechnology, 21, 485402, 4pp. (2010). Chapter 3-6: "Atomic Layer Deposition of Lead Sulfide Quantum Dots on Nanowire Surfaces", Hee Joon Jung, Neil Dasgupta, Orlando Trejo, Matthew T. McDowell, Aaron Hryciw, Mark Brongersma, Robert Sinclair and Fritz B. Prinz, Nano Lett., 11 (3), pp 934-940 (2011). Chapter 3-7: "Evidence For Shape-Induced Bandgap Variations Within a Single Quantum Dot", Hee Joon Jung, Neil P. Dasgupta, Philip B. Van Stockum, Ai Leen Koh, Robert Sinclair, Nature Nanotehchnol., (2012) under review. Chapter 3-8: "Nickel Silicide Nanowire Arrays for Anti-Reflective Electrodes in Photovoltaics", Neil P. Dasgupta, Shicheng Xu, Hee Joon Jung, Andrei Iancu, Rainer Fasching, Robert Sinclair, Fritz B. Prinz, Adv. Funct. Mater., Vol. 22, Issue 17, 3650-3657 (2012). In chapter 4, the TEM characterization on the materials of the solid oxide fuel cells which Yttrium-doped Barium Zirconate (BYZ) by the atomic layer deposition (ALD) and Gadolinia (Ge2O3)-doped Ceria (CeO2) by the pulsed laser deposition (PLD) is dealt with. Each sub-chapter in the chapter 4 is based on the published papers as follows: Chapter 4-2: "Effect of crystallinity on ionic conductivity of Y-doped Barium Zirconate", Y.B. Kim, T.M. Gur, H.J. Jung, S. Kang, R. Sinclair, F.B. Prinz, Solid State Ionics, Vol. 198, Issue 1, 19, 39-46 (2011). Chapter 4-3: "Oxygen Surface Exchange at Grain Boundaries of Oxide Ion Conductors", Wonyoung Lee, Hee Joon Jung, Min Hwan Lee, Young-Beom Kim, Joong Sun Park, Robert Sinclair, and Fritz B. Prinz, Adv. Funct. Mater., Vol. 22, Issue 5, 965--971 (2012).

Transmission Electron Microscopy Investigation of Fuel Cells Related Materials

Transmission Electron Microscopy Investigation of Fuel Cells Related Materials PDF Author: Joonsuk Park
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Book Description
This dissertation will mainly deal with the TEM characterization on the fuel cell using a variety of different TEM techniques. The most of sample was prepared by site-specific lift-out technique using a focused ion beam (FIB). Subsequent TEM studies on these energy-related materials lead to have deep understanding of the relationship between the atomic scale structures with the other chemical/electronic properties. To provide a scientific establishment for break-out high-efficiency, cost-effective energy technologies, research activities have been focused on manipulation of materials at the nanometer scale to increase efficiency of energy conversion devices and exploitation of fundamental advances in charge transport, light absorption, and reaction thermodynamics and kinetics to improve performance and efficiency in energy conversion devices like fuel cell. To achieve these goals, we need to understand how nano-structuring modifies and governs the properties of materials, and how to control dimensionality and confinement to learn insights on model energy conversion materials, structures and devices. Transmission Electron Microscopy (TEM) with additional advanced functions enables us to approach profound understanding of the fundamental relationship between chemical / electronic properties of materials and crystal structure, composition, size, shape of them through the characterization at atomic or nano/micro scale.

Microstructural Characterization of Materials

Microstructural Characterization of Materials PDF Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517

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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.

Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy PDF Author: Nigel D. Browning
Publisher: Cambridge University Press
ISBN: 1139429167
Category : Science
Languages : en
Pages : 409

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Book Description
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

Practical Materials Characterization

Practical Materials Characterization PDF Author: Mauro Sardela
Publisher: Springer
ISBN: 1461492815
Category : Technology & Engineering
Languages : en
Pages : 242

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Book Description
Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

Characterization of Electrochemical and Electronic Materials by in Situ and Aberration-corrected Transmission Electron Microscopy

Characterization of Electrochemical and Electronic Materials by in Situ and Aberration-corrected Transmission Electron Microscopy PDF Author: Megan Elizabeth Holtz
Publisher:
ISBN:
Category :
Languages : en
Pages : 426

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Book Description
Scanning transmission electron microscopy (STEM) is a key tool in the advancement of materials science. As nanoscale materials and atomically sharp interfaces become increasingly technologically relevant, STEM provides feedback on the individual atoms, defects and interfaces that matter in the material. Two areas where STEM characterization is critical for materials advancement are electrochemical energy materials, such as battery electrodes and fuel cell electrocatalysts, and complex oxide materials, which exhibit a diverse array of properties. Electrochemical energy systems, including battery electrodes and electrocatalysts for fuel cells, are critical for the future of clean transportation. For these materials, investigation of the nanoscale processes which occur in liquid electrolytes is critical for understanding their performance in real devices. Encapsulating a thin layer of liquid in the TEM for in situ characterization is an exciting approach for gaining a detailed understanding of the underlying mechanisms of energy conversion and storage. The first half of this dissertation discusses the development and use of liquid-cell and electrochemical-cell TEM. First, I discuss the limitations and opportunities of EELS in thick liquids. I further discuss an electrochemical cell for the TEM, and its application to fuel cell electrocatalysts and battery materials. I was able to observe Pt-Ni octahedral catalyst particles degrade and lose their shape, and detect lithium ions move in a charging and discharging battery cathode (LiFePO4) with nanoscale detail by mapping the electronic structure. The second part of the dissertation focuses on complex oxides, which host a wide range of electronic and magnetic properties. Oxide interfaces, such as thin-film heterostructures and domain walls, are often atomically abrupt and produce novel functionalities. In particular, ferroelectric domain walls are rich sources of emergent phenomena – such as two-dimensional conductive sheets that form in an otherwise insulating solid – due to their unusual electronic properties or symmetry breaking. We probed how ferroelectric distortions change at domain walls with STEM for ErMnO3. From the STEM images, we calculated the order parameter at many domain walls in ErMnO3 to create a statistical picture of the ferroelectricity at these topological defects, and also observed how the order parameter changes near vortex structures. We further apply these methods to lutetium ferrite superlattices, where we use feedback from STEM to design a near-room-temperature multiferroic material in which ferroelectricity enhances the magnetism. We find that there are confined charged domain walls in the superlattice that additionally boost magnetism.

Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy PDF Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 1441972005
Category : Technology & Engineering
Languages : en
Pages : 764

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Book Description
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Transmission Electron Microscopy Characterization of Nanomaterials

Transmission Electron Microscopy Characterization of Nanomaterials PDF Author: Challa S.S.R. Kumar
Publisher: Springer Science & Business Media
ISBN: 3642389341
Category : Science
Languages : en
Pages : 718

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Book Description
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

In-Situ Transmission Electron Microscopy

In-Situ Transmission Electron Microscopy PDF Author: Litao Sun
Publisher: Springer Nature
ISBN: 9811968454
Category : Technology & Engineering
Languages : en
Pages : 378

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Book Description
This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.

Fundamentals, Properties, and Applications of Polymer Nanocomposites

Fundamentals, Properties, and Applications of Polymer Nanocomposites PDF Author: Joseph H. Koo
Publisher: Cambridge University Press
ISBN: 1316094413
Category : Technology & Engineering
Languages : en
Pages : 719

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Book Description
This book is focused primarily on polymer nanocomposites, based on the author's research experience as well as open literature. The environmental health and safety aspects of nanomaterials and polymer nanocomposites, risk assessment and safety standards, and fire toxicity of polymer nanocomposites, are studied. In the final chapter, a brief overview of opportunities, trends, and challenges of polymer nanocomposites are included. Throughout the book, the theme is developed that polymer nanocomposites are a whole family of polymeric materials whose properties are capable of being tailored to meet specific applications. This volume serves as a general introduction to students and researchers just entering the field and to scholars from other subfields seeking information.