Strain And Dislocation Gradients From Diffraction: Spatially-resolved Local Structure And Defects PDF Download
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Author: Rozaliya I Barabash
Publisher: World Scientific
ISBN: 190897964X
Category : Science
Languages : en
Pages : 478
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Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: Rozaliya I Barabash
Publisher: World Scientific
ISBN: 190897964X
Category : Science
Languages : en
Pages : 478
Get Book Here
Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: Arief Suriadi Budiman
Publisher: Springer Nature
ISBN: 9811567204
Category : Science
Languages : en
Pages : 254
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Book Description
This book addresses issues pertinent to mechanics and stress generation, especially in recent advanced cases of technology developments, spanning from micrometer interconnects in solar photovoltaics (PV), next-gen energy storage devices to multilayers of nano-scale composites enabling novel stretchable/flexible conductor technologies. In these cases, the mechanics of materials have been pushed to the extreme edges of human knowledge to enable cutting-edge, unprecedented functionalities and technological innovations. Synchrotron X-ray diffraction, in situ small-scale mechanical testing combined with physics-based computational modeling/simulation, has been widely used approaches to probe these mechanics of the materials at their extreme limits due to their recently discovered distinct advantages. The techniques discussed in this manuscript are highlights specially curated from the broad body of work recently reported in the literature, especially ones that the author had led the pursuits at the frontier himself. Extreme stress generation in these advanced material leads to often new failure modes, and hence, the reliability of the final product is directly affected. From the recent topics and various advanced case studies covered in this book, the reader gets an updated knowledge of how new mechanics can and has been applied in Design-for-Reliability (DfR) for some of the latest technological innovations known in our modern world. Further, this also helps in building better designs, which may avoid the pitfalls of the current practiced trends.
Author:
Publisher: Elsevier
ISBN: 0124166555
Category : Science
Languages : en
Pages : 703
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Book Description
This new volume of Methods in Enzymology continues the legacy of this premier serial with quality chapters authored by leaders in the field. This volume covers research methods in biomineralization science, and includes sections on such topics as determining solution chemistry, structure and nucleation; probing structure and dynamics at surfaces; and interfaces mapping biomineral and morphology and ultrastructure. Continues the legacy of this premier serial with quality chapters authored by leaders in the field Covers research methods in biomineralization science Contains sections on such topics as and includes sections on such topics as determining solution chemistry, structure and nucleation; probing structure and dynamics at surfaces; and interfaces mapping biomineral and morphology and ultrastructure
Author: Ronny Ramlau
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110560852
Category : Mathematics
Languages : en
Pages : 347
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Book Description
In 1917, Johann Radon published his fundamental work, where he introduced what is now called the Radon transform. Including important contributions by several experts, this book reports on ground-breaking developments related to the Radon transform throughout these years, and also discusses novel mathematical research topics and applications for the next century.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 88
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Book Description
Author:
Publisher: Elsevier
ISBN: 0080524680
Category : Science
Languages : en
Pages : 681
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Book Description
Dislocations are lines of irregularity in the structure of a solid analogous to the bumps in a badly laid carpet. Like these bumps they can be easily moved, and they provide the most important mechanism by which the solid can be deformed. They also have a strong influence on crystal growth and on the electronic properties of semiconductors. · Influence of dislocations on piezoelectric behavior· New mechanisms for hardening in twinned crystals· Bringing theories of martensite transformation into agreement· Atomic scale motion of dislocations in electron microscopy· Dislocation patterns deduced from X-ray diffraction· Role of dislocations in friction· Dislocation motion in quasicrystals
Author: Frank Reginald Nunes Nabarro
Publisher:
ISBN:
Category : Dislocations in crystals
Languages : en
Pages : 688
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Book Description
Author: John Michels (Journalist)
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1744
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Book Description
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
