Simulation-based Planning of Machine Vision Inspection Systems with an Application to Laser Triangulation PDF Download
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Author: Mohammadikaji, Mahsa
Publisher: KIT Scientific Publishing
ISBN: 373150989X
Category : Computers
Languages : en
Pages : 238
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Book Description
Author: Mohammadikaji, Mahsa
Publisher: KIT Scientific Publishing
ISBN: 373150989X
Category : Computers
Languages : en
Pages : 238
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Book Description
Author: Henrik I. Christensen
Publisher: Springer Nature
ISBN: 3031441370
Category : Computers
Languages : en
Pages : 466
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Book Description
This volume LNCS 14253 constitutes the refereed proceedings of the 14th International Conference, ICVS 2023, in Vienna, Austria, in September 2023.. The 37 full papers presented were carefully reviewed and selected from 74 submissions. The conference focuses on Humans and Hands; Medical and Health Care; Farming and Forestry; Automation and Manufacturing; Mobile Robotics and Autonomous Systems; and Performance and Robustness.
Author: Li, Zheng
Publisher: KIT Scientific Publishing
ISBN: 3731511886
Category : Science
Languages : en
Pages : 178
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Book Description
Diffractive lens arrays are proposed in this work for application in reflected-light confocal microscopes. They have overcome the limitations between fields of view and resolution of traditional objectives. Experiments of multi-spot confocal imaging in surface metrology and fluorescence microscopy have been demonstrated based on the proposed concepts, which have shown capabilities of high-resolution measurement over a large area.
Author: Luo, Ding
Publisher: KIT Scientific Publishing
ISBN: 3731510618
Category : Computers
Languages : en
Pages : 202
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Book Description
An adaptive microscope with axial chromatic encoding is designed and developed, namely the AdaScope. With the ability to confocally address any locations within the measurement volume, the AdaScope provides the hardware foundation for a cascade measurement strategy to be developed, dramatically accelerating the speed of 3D confocal microscopy.
Author: Leszek Borzemski
Publisher: Springer
ISBN: 3319672207
Category : Technology & Engineering
Languages : en
Pages : 369
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Book Description
This three-volume set of books presents advances in the development of concepts and techniques in the area of new technologies and contemporary information system architectures. It guides readers through solving specific research and analytical problems to obtain useful knowledge and business value from the data. Each chapter provides an analysis of a specific technical problem, followed by the numerical analysis, simulation and implementation of the solution to the problem. The books constitute the refereed proceedings of the 2017 38th International Conference “Information Systems Architecture and Technology,” or ISAT 2017, held on September 17–19, 2017 in Szklarska Poręba, Poland. The conference was organized by the Computer Science and Management Systems Departments, Faculty of Computer Science and Management, Wroclaw University of Technology, Poland. The papers have been organized into topical parts: Part I— includes discourses on topics including, but not limited to, Artificial Intelligence Methods, Knowledge Discovery and Data Mining, Big Data, Knowledge Discovery and Data Mining, Knowledge Based Management, Internet of Things, Cloud Computing and High Performance Computing, Distributed Computer Systems, Content Delivery Networks, and Service Oriented Computing. Part II—addresses topics including, but not limited to, System Modelling for Control, Recognition and Decision Support, Mathematical Modelling in Computer System Design, Service Oriented Systems and Cloud Computing and Complex Process Modeling. Part III—deals with topics including, but not limited to, Modeling of Manufacturing Processes, Modeling an Investment Decision Process, Management of Innovation, Management of Organization.
Author: Beyerer, Juergen
Publisher: KIT Scientific Publishing
ISBN: 373150779X
Category :
Languages : en
Pages : 115
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Book Description
Author: Zheng Liu
Publisher: Springer
ISBN: 1447167414
Category : Computers
Languages : en
Pages : 541
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Book Description
This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications. Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.
Author: Benoit Eynard
Publisher: Springer
ISBN: 3319457810
Category : Technology & Engineering
Languages : en
Pages : 1208
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Book Description
This book gathers papers presented at the International Joint Conference on Mechanics, Design Engineering and Advanced Manufacturing (JCM 2016), held on 14-16 September, 2016, in Catania, Italy. It reports on cutting-edge topics in product design and manufacturing, such as industrial methods for integrated product and process design; innovative design; and computer-aided design. Further topics covered include virtual simulation and reverse engineering; additive manufacturing; product manufacturing; engineering methods in medicine and education; representation techniques; and nautical, aeronautics and aerospace design and modeling. The book is divided into eight main sections, reflecting the focus and primary themes of the conference. The contributions presented here will not only provide researchers, engineers and experts in a range of industrial engineering subfields with extensive information to support their daily work; they are also intended to stimulate new research directions, advanced applications of the methods discussed, and future interdisciplinary collaborations.
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
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Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Author: William K. Schum
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 482
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Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
