Author: Anwar Ul-Hamid
Publisher: Springer
ISBN: 3319984829
Category : Technology & Engineering
Languages : en
Pages : 422
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Book Description
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
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Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: Ludwig Reimer
Publisher: Springer
ISBN: 3540389679
Category : Science
Languages : en
Pages : 538
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Book Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Author: Rex B. Kline
Publisher: Guilford Publications
ISBN: 1462523005
Category : Social Science
Languages : en
Pages : 554
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Book Description
This book has been replaced by Principles and Practice of Structural Equation Modeling, Fifth Edition, ISBN 978-1-4625-5191-0.
Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author: Roland A. Fleck
Publisher: John Wiley & Sons
ISBN: 1118654064
Category : Science
Languages : en
Pages : 741
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Book Description
The go‐to resource for microscopists on biological applications of field emission gun scanning electron microscopy (FEGSEM) The evolution of scanning electron microscopy technologies and capability over the past few years has revolutionized the biological imaging capabilities of the microscope—giving it the capability to examine surface structures of cellular membranes to reveal the organization of individual proteins across a membrane bilayer and the arrangement of cell cytoskeleton at a nm scale. Most notable are their improvements for field emission scanning electron microscopy (FEGSEM), which when combined with cryo-preparation techniques, has provided insight into a wide range of biological questions including the functionality of bacteria and viruses. This full-colour, must-have book for microscopists traces the development of the biological field emission scanning electron microscopy (FEGSEM) and highlights its current value in biological research as well as its future worth. Biological Field Emission Scanning Electron Microscopy highlights the present capability of the technique and informs the wider biological science community of its application in basic biological research. Starting with the theory and history of FEGSEM, the book offers chapters covering: operation (strengths and weakness, sample selection, handling, limitations, and preparation); Commercial developments and principals from the major FEGSEM manufacturers (Thermo Scientific, JEOL, HITACHI, ZEISS, Tescan); technical developments essential to bioFEGSEM; cryobio FEGSEM; cryo-FIB; FEGSEM digital-tomography; array tomography; public health research; mammalian cells and tissues; digital challenges (image collection, storage, and automated data analysis); and more. Examines the creation of the biological field emission gun scanning electron microscopy (FEGSEM) and discusses its benefits to the biological research community and future value Provides insight into the design and development philosophy behind current instrument manufacturers Covers sample handling, applications, and key supporting techniques Focuses on the biological applications of field emission gun scanning electron microscopy (FEGSEM), covering both plant and animal research Presented in full colour An important part of the Wiley-Royal Microscopical Series, Biological Field Emission Scanning Electron Microscopy is an ideal general resource for experienced academic and industrial users of electron microscopy—specifically, those with a need to understand the application, limitations, and strengths of FEGSEM.
Author: Todd D. Little
Publisher: Guilford Publications
ISBN: 1462553141
Category : Business & Economics
Languages : en
Pages : 642
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Book Description
Beloved for its engaging, conversational style, this valuable book is now in a fully updated second edition that presents the latest developments in longitudinal structural equation modeling (SEM) and new chapters on missing data, the random intercepts cross-lagged panel model (RI-CLPM), longitudinal mixture modeling, and Bayesian SEM. Emphasizing a decision-making approach, leading methodologist Todd D. Little describes the steps of modeling a longitudinal change process. He explains the big picture and technical how-tos of using longitudinal confirmatory factor analysis, longitudinal panel models, and hybrid models for analyzing within-person change. User-friendly features include equation boxes that translate all the elements in every equation, tips on what does and doesn't work, end-of-chapter glossaries, and annotated suggestions for further reading. The companion website provides data sets for the examples--including studies of bullying and victimization, adolescents' emotions, and healthy aging--along with syntax and output, chapter quizzes, and the book’s figures. New to This Edition: *Chapter on missing data, with a spotlight on planned missing data designs and the R-based package PcAux. *Chapter on longitudinal mixture modeling, with Whitney Moore. *Chapter on the random intercept cross-lagged panel model (RI-CLPM), with Danny Osborne. *Chapter on Bayesian SEM, with Mauricio Garnier. *Revised throughout with new developments and discussions, such as how to test models of experimental effects.
Author: Joann E. Welton
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 272
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Book Description
Author: Joseph F. Hair Jr.
Publisher: Springer Nature
ISBN: 3030805190
Category : Business & Economics
Languages : en
Pages : 208
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Book Description
Partial least squares structural equation modeling (PLS-SEM) has become a standard approach for analyzing complex inter-relationships between observed and latent variables. Researchers appreciate the many advantages of PLS-SEM such as the possibility to estimate very complex models and the method’s flexibility in terms of data requirements and measurement specification. This practical open access guide provides a step-by-step treatment of the major choices in analyzing PLS path models using R, a free software environment for statistical computing, which runs on Windows, macOS, and UNIX computer platforms. Adopting the R software’s SEMinR package, which brings a friendly syntax to creating and estimating structural equation models, each chapter offers a concise overview of relevant topics and metrics, followed by an in-depth description of a case study. Simple instructions give readers the “how-tos” of using SEMinR to obtain solutions and document their results. Rules of thumb in every chapter provide guidance on best practices in the application and interpretation of PLS-SEM.
Author: Barbara M. Byrne
Publisher: Psychology Press
ISBN: 1135667683
Category : Psychology
Languages : en
Pages : 348
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Book Description
This book illustrates the ease with which AMOS 4.0 can be used to address research questions that lend themselves to structural equation modeling (SEM). This goal is achieved by: 1) presenting a nonmathematical introduction to the basic concepts and appli.
