Light Scattering and Nanoscale Surface Roughness PDF Download
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Author: Alexei A. Maradudin
Publisher: Springer Science & Business Media
ISBN: 0387356592
Category : Science
Languages : en
Pages : 513
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Book Description
This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.
Author: Alexei A. Maradudin
Publisher: Springer Science & Business Media
ISBN: 0387356592
Category : Science
Languages : en
Pages : 513
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Book Description
This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.
Author: Jean M. Bennett
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 128
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Book Description
Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
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Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author: J. A. Ogilvy
Publisher: CRC Press
ISBN:
Category : Art
Languages : en
Pages : 300
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Book Description
A review of theories developed for the study of acoustic, elastic and electromagnetic wave scattering from randomly rough surfaces, and a comprehensive summary of the latest techniques. Different theories are illustrated by experimental data.With applications in radar, sonar, ultrasonics and optics this book will be invaluable to graduate students, researchers and engineers.
Author: Alexander G. Voronovich
Publisher: Springer Science & Business Media
ISBN: 3642599362
Category : Technology & Engineering
Languages : en
Pages : 239
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Book Description
Since the fIrst edition of this book was published in the 1994, the theory of wave scattering from rough surfaces has continued to develop intensively. The community of researchers working in this area keeps growing, which provides justifIcation for issuing this second edition. In preparing the second edition, I was challenged by the problem of se lecting new material from the many important results obtained recently. Even tually, a new section was added to the central Chap. 6 of this book. This sec tion describes the operator expansion technique put forward by M. Milder, which conforms well with the general approach adopted in the book and which to my mind is one of the most promising. Remote sensing of the terrain and ocean surface represents one of the most important and interesting challenges to the theory of wave scattering from rough surfaces. Rapid progress in electronics results in sensors with new capabilities. New powerful computers and data communication systems allow more sophisticated data processing techniques. What information about soil or air-sea interaction processes can be obtained from gigaflops of data streaming from air-or space-borne radars? To use this information efficiently, one cannot rely entirely on heuristic approaches and needs adequate theory. I hope that this book will contribute to progress in this important area.
Author: Zu-Han Gu
Publisher: Society of Photo Optical
ISBN: 9780819428813
Category : Technology & Engineering
Languages : en
Pages : 382
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Publisher:
ISBN: 9781557522610
Category :
Languages : en
Pages :
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Zu-Han Gu
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819425638
Category : Science
Languages : en
Pages : 0
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