Scanning Tunneling Microscopy and Femtosecond Laser Photoemission Spectroscopy of Supported Cluster Structures: A New Experimental Approach PDF Download
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Author: Kira Jochmann
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Kira Jochmann
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: H. Neddermeyer
Publisher: Springer Science & Business Media
ISBN: 9401118124
Category : Science
Languages : en
Pages : 275
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Book Description
The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.
Author: Roland Wiesendanger
Publisher: Springer Science & Business Media
ISBN: 3642793665
Category : Science
Languages : en
Pages : 359
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Book Description
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.
Author: Roland Wiesendanger
Publisher: Springer Science & Business Media
ISBN: 3642973639
Category : Science
Languages : en
Pages : 316
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Book Description
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in Vol. I, these sudies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described inchapters on scanning force microscopy, magnetic force microscopy, scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Togehter, the two volumes give a comprehensive account of experimental aspcets of STM. They provide essentialreading and reference material for all students and researchers involvedin this field.
Author: Peter, Moritz
Publisher: KIT Scientific Publishing
ISBN: 3731504103
Category : Physics
Languages : en
Pages : 164
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Book Description
The present work introduces a new concept for magnetic resonance measurements in the GHz regime inside a scanning tunneling microscope. It is based on heterodyne detection in a spin-polarized tunneling barrier. The experimental requirements, including a new method to suppress transmission effects, are explained. Measurements on three model systems which were studied to validate the new technique are presented and compared to simulations.
Author: C. Julian Chen
Publisher: Oxford University Press, USA
ISBN: 0195071506
Category : Science
Languages : en
Pages : 469
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Book Description
A graduate-level introduction to scanning tunnelling microscopy, which explains how the method's ability to map microscopic surfaces non-destructively has found major applications in physics, surface science, materials science, biology, chemistry and engineering.
Author: Chunli Bai
Publisher: Springer Science & Business Media
ISBN: 9783540657156
Category : Medical
Languages : en
Pages : 392
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Book Description
This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe techniques and the instrumentation and methods, the book provides detailed accounts of STM applications. It examines limitations of the present-day investigations and provides insight into further trends. "I strongly recommend that Professor Bai's book be a part of any library that serves surface scientists, biochemists, biophysicists, material scientists, and students of any science or engineering field...There is no doubt that this is one of the better (most thoughtful) texts." Journal of the American Chemical Society (Review of 1/e)
Author: R.J. Behm
Publisher: Springer Science & Business Media
ISBN: 9401578710
Category : Science
Languages : en
Pages : 516
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Book Description
Proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy, Erice, Italy, April 17-29, 1989
Author: C. Julian Chen
Publisher: Oxford University Press
ISBN: 0192598562
Category : Technology & Engineering
Languages : en
Pages : 523
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Book Description
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.
Author: Hans-Joachim Güntherodt
Publisher: Springer Science & Business Media
ISBN: 3642973434
Category : Science
Languages : en
Pages : 252
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Book Description
Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment. In this volume the reader will find a detailed description of the technique itself and of its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original work will help to make accessible the vast body of knowledge already accumulated in this field.
