Author: Manoj Franklin
Publisher:
ISBN:
Category :
Languages : en
Pages : 180
Book Description
Row/column Pattern Sensitive Faults in Random Access Memories
Author: Manoj Franklin
Publisher:
ISBN:
Category :
Languages : en
Pages : 180
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 180
Book Description
Defect Oriented Testing for CMOS Analog and Digital Circuits
Author: Manoj Sachdev
Publisher: Springer Science & Business Media
ISBN: 1475749260
Category : Technology & Engineering
Languages : en
Pages : 317
Book Description
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal
Publisher: Springer Science & Business Media
ISBN: 1475749260
Category : Technology & Engineering
Languages : en
Pages : 317
Book Description
Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal
High Performance Memory Testing
Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
An Algorithm for the Detection of Row/column Pattern Sensitive Faults in Rams
Author: Manoj Franklin
Publisher:
ISBN:
Category :
Languages : en
Pages : 30
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 30
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category : Computer storage devices
Languages : en
Pages : 1032
Book Description
Publisher:
ISBN:
Category : Computer storage devices
Languages : en
Pages : 1032
Book Description
An Optimal Algorithm for Detecting Pattern Sensitive Faults
Author: Richard Ira Subrin
Publisher:
ISBN:
Category : Pattern recognition systems
Languages : en
Pages : 170
Book Description
Publisher:
ISBN:
Category : Pattern recognition systems
Languages : en
Pages : 170
Book Description
Digital Circuit Testing and Testability
Author: Parag K. Lala
Publisher: Academic Press
ISBN: 9780124343306
Category : Computers
Languages : en
Pages : 222
Book Description
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Publisher: Academic Press
ISBN: 9780124343306
Category : Computers
Languages : en
Pages : 222
Book Description
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Fault-tolerance and Reliability Techniques for High-density Random-access Memories
Author: Kanad Chakraborty
Publisher: Prentice Hall PTR
ISBN:
Category : Computers
Languages : en
Pages : 456
Book Description
This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and explains what needs to be done and why for each of the techniques.
Publisher: Prentice Hall PTR
ISBN:
Category : Computers
Languages : en
Pages : 456
Book Description
This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and explains what needs to be done and why for each of the techniques.
Testing Static Random Access Memories
Author: Said Hamdioui
Publisher: Springer Science & Business Media
ISBN: 1475767064
Category : Technology & Engineering
Languages : en
Pages : 231
Book Description
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Publisher: Springer Science & Business Media
ISBN: 1475767064
Category : Technology & Engineering
Languages : en
Pages : 231
Book Description
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
A Test Algorithm to Detect Pattern Sensitive Disturb Faults in Random Access Memories
Author: Daniel Ramsey Sides
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 76
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 76
Book Description