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Author: Tom R Thomas
Publisher: World Scientific
ISBN: 1783262362
Category : Science
Languages : en
Pages : 296
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Book Description
This book is intended for scientists and engineers who need to know about surface roughness, how to measure and describe it and what practical problems it might cause them. The original Rough Surfaces was widely accepted as the definitive work on the subject; this is a completely new edition, updated to take account of recent major advances in measurement and characterisation. Modern instruments are introduced, including laser interferometers and AFM's, and there are sections on fractals and motif analysis. Problems of 3D surface measurement and description are extensively treated. Manufacturing and production engineers, optical and QC engineers, tribologists and many other applied scientists will find this book an essential addition to their libraries.
Author: Tom R Thomas
Publisher: World Scientific
ISBN: 1783262362
Category : Science
Languages : en
Pages : 296
Get Book
Book Description
This book is intended for scientists and engineers who need to know about surface roughness, how to measure and describe it and what practical problems it might cause them. The original Rough Surfaces was widely accepted as the definitive work on the subject; this is a completely new edition, updated to take account of recent major advances in measurement and characterisation. Modern instruments are introduced, including laser interferometers and AFM's, and there are sections on fractals and motif analysis. Problems of 3D surface measurement and description are extensively treated. Manufacturing and production engineers, optical and QC engineers, tribologists and many other applied scientists will find this book an essential addition to their libraries.
Author: T. R. Thomas
Publisher: Longman Publishing Group
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 288
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Book Description
Author: Kun-Shan Chen
Publisher: CRC Press
ISBN: 1351011561
Category : Technology & Engineering
Languages : en
Pages : 323
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Book Description
Radar scattering and imaging of rough surfaces is an active interdisciplinary area of research with many practical applications in fields such as mineral and resource exploration, ocean and physical oceanography, military and national defense, planetary exploration, city planning and land use, environmental science, and many more. By focusing on the most advanced analytical and numerical modeling and describing both forward and inverse modeling, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB® connects the scattering process to imaging techniques by vivid examples through numerical and experimental demonstrations and provides computer codes and practical uses. This book is unique in its simultaneous treatment of radar scattering and imaging. Key Features Bridges physical modeling with simulation for resolving radar imaging problems (the first comprehensive work to do so) Provides excellent basic and advanced information for microwave remote-sensing professionals in various fields of science and engineering Covers most advanced analytical and numerical modeling for both backscattering and bistatic scattering Includes MATLAB® codes useful not only for academics but also for radar engineers and scientists to develop tools applicable in different areas of earth studies Covering both the theoretical and the practical, Radar Scattering and Imaging of Rough Surfaces: Modeling and Applications with MATLAB® is an invaluable resource for professionals and students using remote sensing to study and explain the Earth and its processes. University and research institutes, electrical and radar engineers, remote-sensing image users, application software developers, students, and academics alike will benefit from this book. The author, Kun-Shan Chen, is an internationally known and respected engineer and scientist and an expert in the field of electromagnetic modeling.
Author: Alexander G. Voronovich
Publisher: Springer Science & Business Media
ISBN: 3642599362
Category : Technology & Engineering
Languages : en
Pages : 239
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Book Description
Since the fIrst edition of this book was published in the 1994, the theory of wave scattering from rough surfaces has continued to develop intensively. The community of researchers working in this area keeps growing, which provides justifIcation for issuing this second edition. In preparing the second edition, I was challenged by the problem of se lecting new material from the many important results obtained recently. Even tually, a new section was added to the central Chap. 6 of this book. This sec tion describes the operator expansion technique put forward by M. Milder, which conforms well with the general approach adopted in the book and which to my mind is one of the most promising. Remote sensing of the terrain and ocean surface represents one of the most important and interesting challenges to the theory of wave scattering from rough surfaces. Rapid progress in electronics results in sensors with new capabilities. New powerful computers and data communication systems allow more sophisticated data processing techniques. What information about soil or air-sea interaction processes can be obtained from gigaflops of data streaming from air-or space-borne radars? To use this information efficiently, one cannot rely entirely on heuristic approaches and needs adequate theory. I hope that this book will contribute to progress in this important area.
Author: Dick Bedeaux
Publisher: World Scientific
ISBN: 1783260742
Category : Technology & Engineering
Languages : en
Pages : 464
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Book Description
This invaluable book represents a substantial body of work describing the theory of the optical properties of thin island films and rough surfaces. In both cases the feature sizes are small compared to the wavelength of light. The approach is extremely rigorous and theoretically very thorough. The reflection, transmission and absorption of light are described. Computer programs that provide exact solutions for theoretical properties of thin island films are available, and this makes the book of great practical use. The early chapters present a comprehensive theoretical framework. In this new edition a chapter on reflection from gyrotropic media has been added. Contributions due to the gyrotropic nature of the interfacial layer are discussed. Contents:Excess Currents, Charge Densities and FieldMaxwell's Equations with Singular FieldsReflection and TransmissionIsland Films in the Low Coverage LimitSpheroidal Island Films in the Low Coverage LimitIsland Films for a Finite CoverageFilms of Truncated Spheres for a Low CoverageFilms of Truncated Spheroids in the Low Coverage LimitFilms of Truncated Spheres or Spheroids for Finite CoverageStratified LayersThe Wave Equation and Its General SolutionGeneral Linear Response Theory for SurfacesSurface RoughnessReflection of a Gyrotropic Medium Readership: Graduate students, academics, researchers and practitioners in optics, nano-optics and surface science. Key Features:An extremely rigorous theoretical descriptionFor thin films computer programs are available for obtaining the optical properties exactlyPresents optical properties of rough surfaces, including capillary waves and oxide layersProvides a new discussion on reflection from a gyrotropic surfaceDescribes reflection from a self-affine rough surfaceKeywords:Optical Properties of Surfaces;Reflection;Transmission;Ellipsometry;Thin Island Films;Rough Surfaces;Gyrotropic Surfaces;Symmetry Relations;Boundary Conditions;Interfacial Polarization and Magnetization
Author: Nicolas Pinel
Publisher: John Wiley & Sons
ISBN: 1118579461
Category : Science
Languages : en
Pages : 122
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Book Description
Electromagnetic wave scattering from random rough surfaces is an active, interdisciplinary area of research with myriad practical applications in fields such as optics, acoustics, geoscience and remote sensing. Focusing on the case of random rough surfaces, this book presents classical asymptotic models used to describe electromagnetic wave scattering. The authors begin by outlining the basic concepts relevant to the topic before moving on to look at the derivation of the scattered field under asymptotic models, based on the Kirchhoff-tangent plane, in order to calculate both the scattered field and the statistical average intensity. More elaborated asymptotic models are also described for dealing with specific cases, and numerical results are presented to illustrate these models. Comparisons with a reference numerical method are made to confirm and refine the theoretical validity domains. The final chapter derives the expressions of the scattering intensities of random rough surfaces under the asymptotic models. Its expressions are given for their incoherent contributions, from statistical calculations. These results are then compared with numerical computations using a Monte-Carlo process, as well as with experimental models, for sea surface backscattering. Contents 1. Electromagnetic Wave Scattering from Random Rough Surfaces: Basics. 2. Derivation of the Scattered Field under Asymptotic Models. 3. Derivation of the Normalized Radar Cross-Section under Asymptotic Models. APPENDIX 1. Far-Field Scattered Fields under the Method of Stationary Phase. APPENDIX 2. Calculation of the Scattering Coefficients under the GO for 3D Problems. About the Authors Nicolas Pinel worked as a Research Engineer at the IETR (Institut d’Electronique et de Télécommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) before joining Alyotech Technologies in Rennes, France, in July 2013. His research interests are in the areas of radar and optical remote sensing, scattering and propagation. In particular, he works on asymptotic methods of electromagnetic wave scattering from random rough surfaces and layers. Christophe Bourlier works at the IETR (Institut d’Electronique et de Télécommunications de Rennes) laboratory at Polytech Nantes (University of Nantes, France) and is also a Researcher at the French National Center for Scientific Research (CNRS) on electromagnetic wave scattering from rough surfaces and objects for remote sensing applications and radar signatures. He is the author of more than 160 journal articles and conference papers.
Author:
Publisher: Elsevier
ISBN: 0080531385
Category : Technology & Engineering
Languages : en
Pages : 437
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Book Description
The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not always smooth. In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods in the Physical Sciences, Volume 37, Characterization of Amorphous and Crystalline Rough Surface-Principles and Applications will focus on the basic principles of real and diffraction techniques for quantitative characterization of the rough surfaces. The book thus includes the latest development on the characterization and measurements of a wide variety of rough surfaces. The complementary nature of the real space and diffraction techniques is fully displayed. Key Features * An accessible description of quantitative characterization of random rough surfaces and growth/etch fronts * A detailed description of the principles, experimentation, and limitations of advanced real-space imaging techniques (such as atomic force microscopy) and diffraction techniques (such as light scattering, X-ray diffraction, and electron diffraction) * Characterization of a variety of rough surfaces (e.g., self-affine, mounded, anisotropic, and two-level surfaces) accompanied by quantitative examples to illustrate the essence of the principles * An insightful description of how rough surfaces are formed * Presentation of the most recent examples of the applications of rough surfaces in various areas
Author: William E. Boyes
Publisher: Society of Manufacturing Engineers
ISBN: 0872633659
Category : Technology & Engineering
Languages : en
Pages : 1192
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Book Description
This book explains both basic principles and advanced designs and applications for today's flexible systems and controlled machines. Chapters include: Predesign Analysis and Fixture Design Procedures Tooling for Numerical Control Geometric Dimensioning and Tolerancing Tooling for Drilling and Reaming Grinding Fixtures Tooling for Flexible Manufacturing Systems and more!
Author: Gohar Ramsey
Publisher: World Scientific
ISBN: 1911298879
Category : Technology & Engineering
Languages : en
Pages : 464
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Book Description
Elastohydrodynamic lubrication (EHL) is a difficult topic, embracing several disciplines, which can cause many problems for engineers and scientists. This up-to-date volume explains the subject both theoretically and experimentally. Moreover, with a refreshing approach and using several novel techniques of application, it provides lucid coverage of new and important findings.Here, in one volume, are the results of much research over the last forty years. The author's clear explanation of the theory of EHL is authoritatively applied to a wide range of related topics, with physical explanations wherever possible.Many of the experimental techniques described were carried out at the Imperial College Lubrication Laboratory, where the application of interferometry (a means of measuring the EHL film thickness) was pioneered./a
Author: Manuel Nieto-Vesperinas
Publisher: World Scientific Publishing Company
ISBN: 9813106522
Category : Science
Languages : en
Pages : 456
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Book Description
This book presents a comprehensive tutorial on propagation, diffraction and scattering problems from the basic principles of physical optics. Beginning with the fundamental differential and integral equations for wavefields, the text presents an exhaustive discussion on the extinction theorem as a non-local boundary condition; this has been extensively employed for the rigorous solution of scattering and diffraction problems. There is also an in-depth presentation of the topic of scattering from rough surfaces, in particular the phenomenon of enhanced backscattering, as well as a detailed development of the angular spectrum representation of fields leading to questions on non-diffraction beams. Of key interest in near field optical microscopy and nanooptics, the S-matrix theory based on the angular spectrum for propagating components and the recently discovered properties of the S-matrix for evanescent components of wavefields are considered. In addition, the book deals with the healing effect of phase conjugation on waves, and focuses on some applications concerning the relationship with time reversal. Readers will also find discussions on image recovery from partial information data (phase problems and super-resolution problems), as well as a chapter on the fundamentals of near field optical microscopy techniques, including the hot topic of propagation in negative index media.
