Report on Transient Radiation Effects on Electronic Components and Semiconductor Devices PDF Download
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Author: D. C. Jones
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 122
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Author: D. C. Jones
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 122
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Author: W. E. Chapin
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 76
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 992
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Author: National Academies of Sciences, Engineering, and Medicine
Publisher: National Academies Press
ISBN: 030947082X
Category : Science
Languages : en
Pages : 89
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Book Description
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Author: Los Alamos Scientific Laboratory
Publisher:
ISBN:
Category : Radiation
Languages : en
Pages : 80
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Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1076
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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 764
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Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 912
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Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 922
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Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 760
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