Author: D. C. Jones
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 122
Book Description
Report on Transient Radiation Effects on Electronic Components and Semiconductor Devices
Author: D. C. Jones
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 122
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 122
Book Description
Report on Space-radiation Damage to Electronic Components and Materials
Author: W. E. Chapin
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 76
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 76
Book Description
Testing at the Speed of Light
Author: National Academies of Sciences, Engineering, and Medicine
Publisher: National Academies Press
ISBN: 030947082X
Category : Science
Languages : en
Pages : 89
Book Description
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Publisher: National Academies Press
ISBN: 030947082X
Category : Science
Languages : en
Pages : 89
Book Description
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 992
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 992
Book Description
Radiation Effects on Semiconductor Devices
Author: Los Alamos Scientific Laboratory
Publisher:
ISBN:
Category : Radiation
Languages : en
Pages : 80
Book Description
Publisher:
ISBN:
Category : Radiation
Languages : en
Pages : 80
Book Description
U.S. Government Research Reports
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1076
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1076
Book Description
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 764
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 764
Book Description
Technical Abstract Bulletin
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 912
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 912
Book Description
Bibliography of Scientific and Industrial Reports
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 922
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 922
Book Description
Energy Research Abstracts
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 760
Book Description
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 760
Book Description