Reliability, Testing, and Characterization of MEMS/MOEMS PDF Download
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Category : Microelectromechanical systems
Languages : en
Pages : 0
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Author:
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ISBN:
Category : Microelectromechanical systems
Languages : en
Pages : 0
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Author: Rajeshuni Ramesham
Publisher: Society of Photo Optical
ISBN: 9780819442864
Category : Technology & Engineering
Languages : en
Pages : 296
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Author: Rajeshuni Ramesham
Publisher: Society of Photo Optical
ISBN: 9780819447807
Category : Technology & Engineering
Languages : en
Pages : 334
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Author:
Publisher:
ISBN:
Category : Microelectromechanical systems
Languages : en
Pages : 332
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Author: Danelle Mary Tanner
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819452511
Category : Technology & Engineering
Languages : en
Pages : 0
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Author: Allyson L. Hartzell
Publisher: Springer Science & Business Media
ISBN: 144196018X
Category : Technology & Engineering
Languages : en
Pages : 300
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Book Description
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
Author: Sonia Garcia-Blanco
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819484659
Category : Microelectromechanical systems
Languages : en
Pages : 256
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Book Description
Includes Proceedings Vol. 7821
Author: Richard C. Kullberg
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819479884
Category : Microelectromechanical systems
Languages : en
Pages : 344
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Includes Proceedings Vol. 7821
Author: Danelle Mary Tanner
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819456908
Category : Technology & Engineering
Languages : en
Pages : 272
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Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Author:
Publisher:
ISBN:
Category : Microelectromechanical systems
Languages : en
Pages :
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