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Author: Zhong Lin Wang
Publisher: Cambridge University Press
ISBN: 0521482666
Category : Science
Languages : en
Pages : 457
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Book Description
A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Author: Zhong Lin Wang
Publisher: Cambridge University Press
ISBN: 0521482666
Category : Science
Languages : en
Pages : 457
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Book Description
A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Author: P.K. Larsen
Publisher: Springer Science & Business Media
ISBN: 146845580X
Category : Science
Languages : en
Pages : 526
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Book Description
This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.
Author: J. M. Blakely
Publisher: Elsevier
ISBN: 148315680X
Category : Science
Languages : en
Pages : 274
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Book Description
Introduction to the Properties of Crystal Surfaces is an introductory text on crystal surfaces and their properties. A variety of phenomena, including electron emission, adsorption and oxidation, adhesion, friction, nucleation and epitaxial growth, and heterogeneous catalysis, are described by considering the details of the atomic and electronic structure in the surface region. This volume is comprised of seven chapters and begins with a discussion on the thermodynamics of surfaces, along with the equilibrium configuration at the intersection of interfaces and the effects of curvature of crystalline surfaces. The next chapter examines the properties of interfaces in multi-component systems, followed by an analysis of experimental measurements of surface tension in solids. The atomic structure of crystal surfaces and some theoretical aspects of surface studies are also considered, and experimental methods in used in such studies are outlined. The final chapter deals with two atomic processes that are involved in a number of reactions at crystal surfaces: surface atomic diffusion and adsorption. This book is intended for senior undergraduates in a materials science type of curriculum or those beginning research work in the field or associated areas.
Author: H. Ibach
Publisher: Academic Press
ISBN: 1483259455
Category : Science
Languages : en
Pages : 379
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Book Description
Electron Energy Loss Spectroscopy and Surface Vibrations is devoted to electron energy loss spectroscopy as a probe of the crystal surface. Electrons with energy in the range of a few electron volts sample only a few atomic layers. As they approach or exit from the crystal, they interact with the vibrational modes of the crystal surface, or possibly with other elementary excitations localized there. The energy spectrum of electrons back-reflected from the surface is thus a rich source of information on its dynamics. The book opens with a detailed analysis of the physics that controls the operation of the monochromator, which is the core of the experimental apparatus. Separate chapters follow on the interaction of electrons with vibrational modes of the surface region and with other elementary excitations in the vicinity; the lattice dynamics of clean and adsorbate-covered surfaces, with emphasis on those features of particular relevance to surface vibrational spectroscopy; and selected applications vibration spectroscopy in surface physics and chemistry.
Author: K. Sangwal
Publisher: Trans Tech Publications Ltd
ISBN: 3035703043
Category : Technology & Engineering
Languages : en
Pages : 412
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Book Description
GADEST IV
Author: S. Amelinckx
Publisher: John Wiley & Sons
ISBN: 3527614559
Category : Technology & Engineering
Languages : en
Pages : 527
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Book Description
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Author: Nan Yao
Publisher: Springer Science & Business Media
ISBN: 1402080069
Category : Technology & Engineering
Languages : en
Pages : 745
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Book Description
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Author: P.M. Duxbury
Publisher: Springer Science & Business Media
ISBN: 0306470713
Category : Technology & Engineering
Languages : en
Pages : 248
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Book Description
This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, and engineering, with length scales ranging from Ångstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M. F. Thorpe, Series Editor E-mail: thorpe@pa. msu. edu v PREFACE th th During the period 4 -8 August 1996, a conference with the same title as this book was held in Traverse City, Michigan. That conference was organized as a sequel to an interesting and successful WEM workshop in a similar area run by Profs. Hans Bonzel and Bill Mullins in May 1995. This book contains papers presented at the Traverse City conference. The book focuses on: atomic processes, step structure and dynamics; and their effect on surface and interface structures and on the relaxation kinetics of larger leng- scale nonequilibrium morphologies.
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 540
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Book Description
Author: Zhong-lin Wang
Publisher: Springer Science & Business Media
ISBN: 1489915796
Category : Science
Languages : en
Pages : 461
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Book Description
Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.
