Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing PDF Download
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Author: Bernard Courtois
Publisher: IEEE Computer Society Press
ISBN: 9780769516172
Category : Computers
Languages : en
Pages : 202
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Book Description
Annotation MTDT 2002 explores the state-of-the-art in semiconductor memories. Over the last 10 years, the scope of the Workshop has been expanded to cover the fabrication technology and the memory design, test and reliability.
Author: Bernard Courtois
Publisher: IEEE Computer Society Press
ISBN: 9780769516172
Category : Computers
Languages : en
Pages : 202
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Book Description
Annotation MTDT 2002 explores the state-of-the-art in semiconductor memories. Over the last 10 years, the scope of the Workshop has been expanded to cover the fabrication technology and the memory design, test and reliability.
Author: David Lepejian
Publisher: IEEE Computer Society Press
ISBN:
Category : Cardiology
Languages : en
Pages : 524
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Book Description
Annotation The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc.
Author: Tom Wit
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769520049
Category : Computers
Languages : en
Pages : 116
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Book Description
"IEEE Computer Society Order Number PR02004"--T.p. verso.
Author: Bernard Courtois
Publisher: IEEE
ISBN: 9780769516172
Category : Electronic book
Languages : en
Pages : 182
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Book Description
This text contains information on designing and testing computer hardware as presented at the 2002 IEEE International Memory Technology, Design and Testing (MTDT 2002).
Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Author:
Publisher: Springer Science & Business Media
ISBN: 3540343857
Category : Computational complexity
Languages : en
Pages : 1128
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Book Description
Author: Vassil N. Alexandrov
Publisher: Springer
ISBN: 3540343865
Category : Computers
Languages : en
Pages : 1128
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Book Description
This is Volume IV of the four-volume set LNCS 3991-3994 constituting the refereed proceedings of the 6th International Conference on Computational Science, ICCS 2006. The 98 revised full papers and 29 revised poster papers of the main track presented together with 500 accepted workshop papers were carefully reviewed and selected for inclusion in the four volumes. The coverage spans the whole range of computational science.
Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
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Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 864
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Book Description
Author: Giovanni Campardo
Publisher: Springer Science & Business Media
ISBN: 9783540201984
Category : Computers
Languages : en
Pages : 616
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Book Description
VLSI-Design for Non-Volatile Memories is intended for electrical engineers and graduate students who want to enter into the integrated circuit design world. Non-volatile memories are treated as an example to explain general design concepts. Practical illustrative examples of non-volatile memories, including flash types, are showcased to give insightful examples of the discussed design approaches. A collection of photos is included to make the reader familiar with silicon aspects. Throughout all parts of this book, the authors have taken a practical and applications-driven point of view, providing a comprehensive and easily understood approach to all the concepts discussed. Giovanni Campardo and Rino Micheloni have a solid track record of leading design activities at the STMicroelectronics Flash Division. David Novosel is President and founder of Intelligent Micro Design, Inc., Pittsburg, PA.
