Handbook of Practical X-Ray Fluorescence Analysis PDF Download
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Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
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Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
Get Book
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: Gerald R. Lachance
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 432
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Book Description
A systematic account concerning the basic theory of X-ray physics and spectrometer configurations leading to simple expressions quantifying primary and secondary fluorescence emissions. Discusses the fundamental parameters approach for converting intensities to concentrations in both its classical formalism and by a number of basic influence coefficient algorithms. Examines approximations underlying influence coefficient models and theoretical simulations are used to evaluate global methods. Includes numerous detailed examples as well as extensive tabulations of theoretical data.
Author: R. Tertian
Publisher: John Wiley & Sons
ISBN:
Category : Education
Languages : en
Pages : 412
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Book Description
Author: Gerald R. Lachance
Publisher:
ISBN:
Category :
Languages : en
Pages : 402
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Book Description
Author: Ron Jenkins
Publisher: CRC Press
ISBN: 1482273381
Category : Science
Languages : en
Pages : 502
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Book Description
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals
Author: Ron Jenkins
Publisher: Wiley-Interscience
ISBN: 9780471836759
Category : Science
Languages : en
Pages : 192
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Book Description
X-Ray Fluorescence Spectrometry, Ron Jenkins Written by the principal scientist for JCPDS, the International Centre for Diffraction Data, Swarthmore, Pennsylvania, this book focuses on the scientific and technological developments achieved in the field during the past decade. It offers comprehensive coverage of all crucial topics, including: the properties and uses of X-ray emission spectrometry in material analysis; its industrial applications; X-ray diffraction; instrumentation for X-ray fluorescence spectrometry; a comparison of wavelength and energy dispersive spectrometers; and use of X-ray spectrometry for qualitative analysis.
Author: Eva Margui
Publisher: Momentum Press
ISBN: 1606503936
Category : Technology & Engineering
Languages : en
Pages : 160
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Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Author: Gerald R. Lachance
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
Author: Rene Van Grieken
Publisher: CRC Press
ISBN: 9780203908709
Category : Science
Languages : en
Pages : 1016
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Book Description
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Author: Aaron N. Shugar
Publisher: Leuven University Press
ISBN: 9058679071
Category : Art
Languages : en
Pages : 480
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Book Description
This volume focuses specifically on the applications, possibilities, and limitations of handheld X-ray fluorescence devices in art conservation and archaeology.
