Author: A.G Fitzgerald
Publisher: Routledge
ISBN: 1351420526
Category : Science
Languages : en
Pages : 563
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Book Description
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
Author: Glyn Love
Publisher: Springer Science & Business Media
ISBN: 3709175062
Category : Technology & Engineering
Languages : en
Pages : 376
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Book Description
This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.
Author: Abraham Boekestein
Publisher: Springer Science & Business Media
ISBN: 3709166799
Category : Science
Languages : en
Pages : 271
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Book Description
This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by members from almost all European countries, in order to stimulate research, applications and development of all forms of microbeam methods. One of the most important activities EMAS is the organisation of biannual workshops for demonstrating the current status and developing trends of microbeam methods. For this meeting, EMAS chose to highlight the following topics: electron-beam microanalysis (EPMA) of thin films and quantitative analysis of ultra-light elements, Auger electron spectroscopy (AES), electron energy loss spec trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of research in Europe were duly represented, but a definite trend is discernible. EPMA with wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS) is the method with by far the widest range of applications, followed by TEM with EELS and then AES. There are also interesting suggestions for the further development of new appa ratus with new fields of application. Applications are heavily biased towards materials science (thin films in microelectronics and semicon ductors), ceramics and metallurgy, followed by analysis of biological and mineral samples.
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580483394
Category :
Languages : en
Pages : 32
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Book Description
Chemical analysis and testing, Microanalysis, Quantitative analysis, Spectroscopy, Electron beams, Electron microscopes, Instrumental methods of analysis, X-rays
Author: Daniele Benoit
Publisher: Springer Science & Business Media
ISBN: 3709165555
Category : Science
Languages : en
Pages : 628
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Book Description
The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.
Author: D Williams
Publisher: CRC Press
ISBN: 9780750306850
Category : Science
Languages : en
Pages : 546
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Book Description
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
Author: K. Kiss
Publisher: Elsevier
ISBN: 0444597476
Category : Science
Languages : en
Pages : 415
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Book Description
This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments.The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques.
Author: K.F.J. Heinrich
Publisher: Springer Science & Business Media
ISBN: 1489926178
Category : Science
Languages : en
Pages : 397
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Book Description
In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author: British Standards Institute Staff
Publisher:
ISBN: 9780580841217
Category :
Languages : en
Pages : 22
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Book Description
Electron beams, Microanalysis, Chemical analysis and testing, X-ray fluorescence spectrometry, Spectrophotometry, Spectroscopy, Instrumental methods of analysis, Dispersion (waves), Wavelengths, Electron microscopes
Author: Microbeam Analysis Society
Publisher:
ISBN:
Category : Ann Arbor, MI
Languages : en
Pages : 236
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Book Description
