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Author: Yunfei Ge
Publisher:
ISBN:
Category : Heat
Languages : en
Pages : 223
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Book Description
Author: Yunfei Ge
Publisher:
ISBN:
Category : Heat
Languages : en
Pages : 223
Get Book Here
Book Description
Author: Yun Zhang
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
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Book Description
Author: Jean Spièce
Publisher: Springer Nature
ISBN: 3030308138
Category : Science
Languages : en
Pages : 153
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Book Description
The thesis tackles one of the most difficult problems of modern nanoscale science and technology - exploring what governs thermal phenomena at the nanoscale, how to measure the temperatures in devices just a few atoms across, and how to manage heat transport on these length scales. Nanoscale heat generated in microprocessor components of only a few tens of nanometres across cannot be effectively fed away, thus stalling the famous Moore's law of increasing computer speed, valid now for more than a decade. In this thesis, Jean Spièce develops a novel comprehensive experimental and analytical framework for high precision measurement of heat flows at the nanoscale using advanced scanning thermal microscopy (SThM) operating in ambient and vacuum environment, and reports the world’s first operation of cryogenic SThM. He applies the methodology described in the thesis to novel carbon-nanotube-based effective heat conductors, uncovers new phenomena of thermal transport in two- dimensional (2D) materials such as graphene and boron nitride, thereby discovering an entirely new paradigm of thermoelectric cooling and energy production using geometrical modification of 2D materials.
Author: Petr Klapetek
Publisher: William Andrew
ISBN: 1455730599
Category : Science
Languages : en
Pages : 335
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Book Description
Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available)
Author: Jaime Andres Perez Taborda
Publisher: BoD – Books on Demand
ISBN: 1789848709
Category : Technology & Engineering
Languages : en
Pages : 288
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Book Description
The field of coatings and thin-film technologies is rapidly advancing to keep up with new uses for semiconductor, optical, tribological, thermoelectric, solar, security, and smart sensing applications, among others. In this sense, thin-film coatings and structures are increasingly sophisticated with more specific properties, new geometries, large areas, the use of heterogeneous materials and flexible and rigid coating substrates to produce thin-film structures with improved performance and properties in response to new challenges that the industry presents. This book aims to provide the reader with a complete overview of the current state of applications and developments in thin-film technology, discussing applications, health and safety in thin films, and presenting reviews and experimental results of recognized experts in the area of coatings and thin-film technologies.
Author:
Publisher: World Scientific
ISBN: 9811235155
Category : Science
Languages : en
Pages : 2475
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Book Description
World Scientific Reference on Plasmonic Nanomaterials: Principles, Design and Bio-applications is a book collection that encompasses multiple aspects of the exciting and timely field of nanoplasmonics, under the coordination of international plasmonic nanomaterials expert, Dr Luis Liz-Marzán. Plasmonics has a long history, from stained glass in ancient cathedrals, through pioneering investigations by Michael Faraday, all the way into the nanotechnology era, where it blossomed into an extremely active field of research with potential applications in a wide variety of technologies.Given the breadth of the materials, phenomena and applications related to plasmonics, this Reference Set offers a collection of chapters within dedicated volumes, focusing on the description of selected phenomena, with an emphasis in chemistry as an enabling tool for the fabrication of, often sophisticated, plasmonic nanoarchitectures and biomedicine as the target application.Basic principles of surface plasmon resonances are described, as well as those mechanisms related to related phenomena such as surface-enhanced spectroscopies or plasmonic chirality. Under the guidance of theoretical models, wet chemistry methods have been implemented toward the synthesis of a wide variety of nanoparticles with different compositions and tailored morphology. But often the optimal nanoarchitecture requires post-synthesis treatments, including functionalization of nanoparticle surfaces, application of external stimuli toward self-assembly into well-defined supraparticle structures and so-called supercrystals. All such nanomaterials can find applications in various biomedical aspects, most often in relation to diagnosis, through either the detection of disease biomarkers at extremely low concentrations or the design of bioimaging methods for in vivo monitoring. Additionally, novel therapeutic tools can also profit from plasmonic nanomaterials, such as photothermal therapy or nanocatalysis.The reference set thus offers comprehensive information of an extremely active subset within the world of plasmonic nanomaterials and their applications, which aims at not just collecting existing knowledge but also promoting further research and technology transfer into the market and the clinic.
Author: Yu Huang (M.S. in Engineering)
Publisher:
ISBN:
Category :
Languages : en
Pages : 142
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Book Description
Since its introduction, Scanning Thermal Microscopy (SThM) has been widely used to measure surface temperature and thermal properties of nano-scale materials and structures with high spatial resolution. However, discrepancy exits between the temperature read by the SThM probe and the actual temperature of sample measured. In addition, the temperature of the measured sample can be affected by the presence of the SThM probe. In this thesis work, we used Ansys Fluent to develop a SThM model to establish calibration between the temperature read by the SThM probe and the actual temperature of measurement. The effects of the probe on the temperature of sample is also quantified. We use Bayesian inference to calibrate the unknown thermal conductivities of the polymer (substrate). This model is validated by comparing its predictions with experiment observations. We also quantify the uncertainties in the Quantity of Interest (QoI), the probe tip temperature, due to the uncertainty in the simulation input parameters. This is accomplished by using a generalized polynomial chaos (gPC) formalism. A response surface relating the QoI to model inputs is constructed through stochastic collocation. A Smolyak sparse grid is used to reduce the computation expense. The response surface is sampled based on the PDFs of the input parameters to obtain the PDF of the QoI. We find the uncertainty in the cross-plane thermal conductivity of the liquid polymer and the diameter of the probe tip have large contributions to the overall uncertainty in the QoI.
Author: P. Ciarlini
Publisher: World Scientific
ISBN: 9812566740
Category : Computers
Languages : en
Pages : 386
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Book Description
This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology. Contents: Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Baer et al.); Mereotipological Approach for Measurement Software (E Benoit & R Dapoigny); Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.); Box-Cox Transformations Versus Robust Control Charts in Statistical Process Control (M I Gomes & F O Figueiredo); Decision Making Using Sensor's Data Fusion and Kohonen Self Organizing Maps (P S Girao et al.); Generic System Design for Measurement Databases Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gro et al.); Repeated Measurements: Evaluation of Their Uncertainty from the Viewpoints of Classical and Bayesian Statistics (I Lira & W Woger); Detection of Outliers in Interlaboratory Testing and Some Thoughts About Multivariate Precision (C Perruchet); On Appropriate Methods for the Validation of Metrological Software (D Richter et al.); Data Analysis-A Dialogue (D S Sivia); Validation of a Virtual Sensor for Monitoring Ambient Parameters (P Ciarlini et al.); Evaluation of Standard Uncertainties in Nested Structures (E Filipe); Linking GUM and ISO 5725 (A B Forbes); Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.); Some Problems Concerning the Estimate of the Uncertainty of the Degree of Equivalence in MRA Key Comparisons (F Pavese); Preparing for a European Research Area Network in Metrology: Where are We Now? (M Kuhne et al.); and other papers. Readership: Researchers, graduate students, academics and professionals in metrology.
Author: ASM International
Publisher: ASM International
ISBN: 1615030859
Category : Technology & Engineering
Languages : en
Pages : 456
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Book Description
Author: IEEE Electron Devices Society
Publisher: IEEE Standards Office
ISBN: 9780780362581
Category : Technology & Engineering
Languages : en
Pages : 576
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Book Description
This text constitutes the proceedings from the 25th IEEE International Symposium on Compound Semiconductors, which took place in 2000. Topics covered include emitter science and technology, heterostructure devices and quantum effect materials and devices.
