X-Ray Line Profile Analysis in Materials Science PDF Download
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Author: Gubicza, Jen?
Publisher: IGI Global
ISBN: 1466658533
Category : Technology & Engineering
Languages : en
Pages : 359
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Book Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author: Gubicza, Jen?
Publisher: IGI Global
ISBN: 1466658533
Category : Technology & Engineering
Languages : en
Pages : 359
Get Book Here
Book Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author: H. Oechsner
Publisher: Springer Science & Business Media
ISBN: 3642464998
Category : Technology & Engineering
Languages : en
Pages : 214
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Book Description
The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.
Author: Brij Masand
Publisher: Springer
ISBN: 3540449345
Category : Computers
Languages : en
Pages : 190
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Book Description
After the advent of data mining and its successful application on conventional data, Web-related information has been an appropriate and increasingly popular target of knowledge discovery. Depending on whether the data used in the knowledge discovery process concerns the Web itself in terms of content or the usage of the content, one distinguishes between Web content mining and Web usage mining. This book is the first one entirely devoted to Web usage mining. It originates from the WEBKDD'99 Workshop held during the 1999 KDD Conference. The ten revised full papers presented together with an introductory survey by the volume editors documents the state of the art in this exciting new area. The book presents topical sections on Modeling the User, Discovering Rules and Patterns of Navigation, and Measuring interestingness in Web Usage Mining.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: Coastal Engineering Research Center (U.S.)
Publisher:
ISBN:
Category : Beach erosion
Languages : en
Pages : 98
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Book Description
Includes various editions of some numbers.
Author: Rassoul Noorossana
Publisher: John Wiley & Sons
ISBN: 1118071972
Category : Technology & Engineering
Languages : en
Pages : 298
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Book Description
A one-of-a-kind presentation of the major achievements in statistical profile monitoring methods Statistical profile monitoring is an area of statistical quality control that is growing in significance for researchers and practitioners, specifically because of its range of applicability across various service and manufacturing settings. Comprised of contributions from renowned academicians and practitioners in the field, Statistical Analysis of Profile Monitoring presents the latest state-of-the-art research on the use of control charts to monitor process and product quality profiles. The book presents comprehensive coverage of profile monitoring definitions, techniques, models, and application examples, particularly in various areas of engineering and statistics. The book begins with an introduction to the concept of profile monitoring and its applications in practice. Subsequent chapters explore the fundamental concepts, methods, and issues related to statistical profile monitoring, with topics of coverage including: Simple and multiple linear profiles Binary response profiles Parametric and nonparametric nonlinear profiles Multivariate linear profiles monitoring Statistical process control for geometric specifications Correlation and autocorrelation in profiles Nonparametric profile monitoring Throughout the book, more than two dozen real-world case studies highlight the discussed topics along with innovative examples and applications of profile monitoring. Statistical Analysis of Profile Monitoring is an excellent book for courses on statistical quality control at the graduate level. It also serves as a valuable reference for quality engineers, researchers and anyone who works in monitoring and improving statistical processes.
Author:
Publisher: DIANE Publishing
ISBN: 9781422318058
Category :
Languages : en
Pages : 26
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Book Description
Author: Dietrich von Rosen
Publisher: Springer
ISBN: 3319787845
Category : Mathematics
Languages : en
Pages : 473
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Book Description
This book expands on the classical statistical multivariate analysis theory by focusing on bilinear regression models, a class of models comprising the classical growth curve model and its extensions. In order to analyze the bilinear regression models in an interpretable way, concepts from linear models are extended and applied to tensor spaces. Further, the book considers decompositions of tensor products into natural subspaces, and addresses maximum likelihood estimation, residual analysis, influential observation analysis and testing hypotheses, where properties of estimators such as moments, asymptotic distributions or approximations of distributions are also studied. Throughout the text, examples and several analyzed data sets illustrate the different approaches, and fresh insights into classical multivariate analysis are provided. This monograph is of interest to researchers and Ph.D. students in mathematical statistics, signal processing and other fields where statistical multivariate analysis is utilized. It can also be used as a text for second graduate-level courses on multivariate analysis.
Author: Gerald Elton Fosbroke
Publisher:
ISBN:
Category : Characters and characteristics
Languages : en
Pages : 268
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Book Description
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 572
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Book Description
