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Author: Manfred Dietrich
Publisher: Springer Science & Business Media
ISBN: 1441966218
Category : Technology & Engineering
Languages : en
Pages : 261
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Book Description
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Author: Manfred Dietrich
Publisher: Springer Science & Business Media
ISBN: 1441966218
Category : Technology & Engineering
Languages : en
Pages : 261
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Book Description
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Author: Vasilis F. Pavlidis
Publisher: Newnes
ISBN: 0124104843
Category : Technology & Engineering
Languages : en
Pages : 770
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Book Description
Three-Dimensional Integrated Circuit Design, Second Eition, expands the original with more than twice as much new content, adding the latest developments in circuit models, temperature considerations, power management, memory issues, and heterogeneous integration. 3-D IC experts Pavlidis, Savidis, and Friedman cover the full product development cycle throughout the book, emphasizing not only physical design, but also algorithms and system-level considerations to increase speed while conserving energy. A handy, comprehensive reference or a practical design guide, this book provides effective solutions to specific challenging problems concerning the design of three-dimensional integrated circuits. Expanded with new chapters and updates throughout based on the latest research in 3-D integration: - Manufacturing techniques for 3-D ICs with TSVs - Electrical modeling and closed-form expressions of through silicon vias - Substrate noise coupling in heterogeneous 3-D ICs - Design of 3-D ICs with inductive links - Synchronization in 3-D ICs - Variation effects on 3-D ICs - Correlation of WID variations for intra-tier buffers and wires - Offers practical guidance on designing 3-D heterogeneous systems - Provides power delivery of 3-D ICs - Demonstrates the use of 3-D ICs within heterogeneous systems that include a variety of materials, devices, processors, GPU-CPU integration, and more - Provides experimental case studies in power delivery, synchronization, and thermal characterization
Author: Amith Singhee
Publisher: Springer Science & Business Media
ISBN: 1441966064
Category : Technology & Engineering
Languages : en
Pages : 254
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Book Description
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can ?nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5–6s (0.
Author: Victor Champac
Publisher: Springer
ISBN: 3319754653
Category : Technology & Engineering
Languages : en
Pages : 195
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Book Description
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.
Author: Martin Wirnshofer
Publisher: Springer Science & Business Media
ISBN: 9400761961
Category : Technology & Engineering
Languages : en
Pages : 91
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Book Description
Increasing performance demands in integrated circuits, together with limited energy budgets, force IC designers to find new ways of saving power. One innovative way is the presented adaptive voltage scaling scheme, which tunes the supply voltage according to the present process, voltage and temperature variations as well as aging. The voltage is adapted “on the fly” by means of in-situ delay monitors to exploit unused timing margin, produced by state-of-the-art worst-case designs. This book discusses the design of the enhanced in-situ delay monitors and the implementation of the complete control-loop comprising the monitors, a control-logic and an on-chip voltage regulator. An analytical Markov-based model of the control-loop is derived to analyze its robustness and stability. Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits provides an in-depth assessment of the proposed voltage scaling scheme when applied to an arithmetic and an image processing circuit. This book is written for engineers interested in adaptive techniques for low-power CMOS circuits.
Author: Xin Li
Publisher: Now Publishers Inc
ISBN: 1601980566
Category : Computers
Languages : en
Pages : 161
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Book Description
Statistical Performance Modeling and Optimization reviews various statistical methodologies that have been recently developed to model, analyze and optimize performance variations at both transistor level and system level in integrated circuit (IC) design. The following topics are discussed in detail: sources of process variations, variation characterization and modeling, Monte Carlo analysis, response surface modeling, statistical timing and leakage analysis, probability distribution extraction, parametric yield estimation and robust IC optimization. These techniques provide the necessary CAD infrastructure that facilitates the bold move from deterministic, corner-based IC design toward statistical and probabilistic design. Statistical Performance Modeling and Optimization reviews and compares different statistical IC analysis and optimization techniques, and analyzes their trade-offs for practical industrial applications. It serves as a valuable reference for researchers, students and CAD practitioners.
Author: Pooyan Sakian
Publisher: Springer Science & Business Media
ISBN: 1461421217
Category : Technology & Engineering
Languages : en
Pages : 181
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Book Description
This book discusses wireless receiver design challenges, given the shrinking of circuitry into ever-smaller sizes and resulting complications on manufacturability, production yield and end price of the products. Includes countermeasures for RF designers.
Author: Giovanni DeMicheli
Publisher: Springer Science & Business Media
ISBN: 1441902554
Category : Technology & Engineering
Languages : en
Pages : 186
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Book Description
Nanosystems use new, nanoscopic electrical and/or mechanical devices which, as constituents of electronic and electromechanical systems, find application primarily in computing, embedded control and biomedical data acquisition. In particular, this book will deal with the characterization and patterning of these materials from an engineering perspective, with the objective of creating operational prototypes and products. The book will integrate various nano technologies on materials, devices and systems and identify key areas and results. The book will describe different design aspects for integrated systems on silicon, as well as on heterogeneous platforms including, but not limited to, electrical, optical, micromechanical and biological components in various forms and mixtures. By associating research topics from differing horizons, the book will provide a unique opportunity to bridge the gap between electronics/electrical engineering and materials science. The book will include topics at the intersection of these disciplines, and will interface with computer science, biology and medicine.
Author: Edgar Weippl
Publisher: Springer Nature
ISBN: 3031023382
Category : Computers
Languages : en
Pages : 103
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Book Description
In our digital world, integrated circuits are present in nearly every moment of our daily life. Even when using the coffee machine in the morning, or driving our car to work, we interact with integrated circuits. The increasing spread of information technology in virtually all areas of life in the industrialized world offers a broad range of attack vectors. So far, mainly software-based attacks have been considered and investigated, while hardware-based attacks have attracted comparatively little interest. The design and production process of integrated circuits is mostly decentralized due to financial and logistical reasons. Therefore, a high level of trust has to be established between the parties involved in the hardware development lifecycle. During the complex production chain, malicious attackers can insert non-specified functionality by exploiting untrusted processes and backdoors. This work deals with the ways in which such hidden, non-specified functionality can be introduced into hardware systems. After briefly outlining the development and production process of hardware systems, we systematically describe a new type of threat, the hardware Trojan. We provide a historical overview of the development of research activities in this field to show the growing interest of international research in this topic. Current work is considered in more detail. We discuss the components that make up a hardware Trojan as well as the parameters that are relevant for an attack. Furthermore, we describe current approaches for detecting, localizing, and avoiding hardware Trojans to combat them effectively. Moreover, this work develops a comprehensive taxonomy of countermeasures and explains in detail how specific problems are solved. In a final step, we provide an overview of related work and offer an outlook on further research in this field.
Author: Ashish Srivastava
Publisher: Springer Science & Business Media
ISBN: 0387265287
Category : Technology & Engineering
Languages : en
Pages : 284
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Book Description
Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues
