Proceedings of the 6th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors PDF Download
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Author: Ettore Focardi
Publisher:
ISBN:
Category :
Languages : en
Pages : 184
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Book Description
Author: Ettore Focardi
Publisher:
ISBN:
Category :
Languages : en
Pages : 184
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Book Description
Author: Carlos Civinini
Publisher:
ISBN:
Category :
Languages : en
Pages : 10
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Author: Alberto Baldini
Publisher:
ISBN:
Category : Calorimetry
Languages : en
Pages : 218
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Author: A. Baldini
Publisher:
ISBN: 9788877940636
Category :
Languages : en
Pages :
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Book Description
Author: Carlos Civinini
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Carlo Civinini
Publisher:
ISBN:
Category : Calorimetry
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
Publisher:
ISBN:
Category :
Languages : en
Pages : 145
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Author: International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (5, 2001, Firenze)
Publisher:
ISBN:
Category :
Languages : en
Pages : 208
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Author: Maura Barone
Publisher: World Scientific
ISBN: 9789812381804
Category : Science
Languages : en
Pages : 864
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Book Description
This book features up-to-date technology applications to radiation detection. It synthesises several techniques of and approaches to radiation detection, covering a wide range of applications and addressing a large audience of experts and students. Many of the talks are in fact reviews of particular topics often not covered in standard books and other conferences, for instance, the medical physics section. To present these medical physics talks is crucial, since a large fraction of the community in medical physics are from the particle physics community. The same feature is true for astroparticle and space physics, which are relatively new fields. This book is unique in its scope. Except for IEEE, there is no other conference in the world that presents such a wide coverage of advanced technology applied to particle physics. However, unlike IEEE, more room is made in the book for reviews and general talks.
