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Languages : en
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Author: Gérard Ghibaudo
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780392038
Category : Semiconductors
Languages : en
Pages : 572
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Author: European Solid-State Device Research Conference
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780392038
Category :
Languages : en
Pages : 572
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Book Description
Author: Bernd O. Kolbesen
Publisher: The Electrochemical Society
ISBN: 9781566774284
Category : Science
Languages : en
Pages : 202
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Book Description
Author: João Antonio Martino
Publisher: The Electrochemical Society
ISBN: 1566775655
Category : Microelectronics
Languages : en
Pages : 615
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Book Description
The SBMicro symposium is a forum dedicated to fabrication and modeling of Microsystems, integrated circuits and devices. The goal of the symposium is to bring together researchers in the areas of processing, materials, characterization, modeling and TCAD of integrated circuits, microsensors, microactuators, and MEMS. This issue contains the papers presented at the 2007 conference.
Author: T. Q. Khan
Publisher: John Wiley & Sons
ISBN: 3527412123
Category : Science
Languages : en
Pages : 517
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Book Description
Promoting the design, application and evaluation of visually and electrically effective LED light sources and luminaires for general indoor lighting as well as outdoor and vehicle lighting, this book combines the knowledge of LED lighting technology with human perceptual aspects for lighting scientists and engineers. After an introduction to the human visual system and current radiometry, photometry and color science, the basics of LED chip and phosphor technology are described followed by specific issues of LED radiometry and the optical, thermal and electric modeling of LEDs. This is supplemented by the relevant practical issues of pulsed LEDs, remote phosphor LEDs and the aging of LED light sources. Relevant human visual aspects closely related to LED technology are described in detail for the photopic and the mesopic range of vision, including color rendering, binning, whiteness, Circadian issues, as well as flicker perception, brightness, visual performance, conspicuity and disability glare. The topic of LED luminaires is discussed in a separate chapter, including retrofit LED lamps, LED-based road and street luminaires and LED luminaires for museum and school lighting. Specific sections are devoted to the modularity of LED luminaires, their aging and the planning and evaluation methods of new LED installations. The whole is rounded off by a summary and a look towards future developments.
Author:
Publisher: The Electrochemical Society
ISBN: 9781566774260
Category : Electrochemistry
Languages : en
Pages : 574
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Author: Tibor Grasser
Publisher: Springer
ISBN: 3319089943
Category : Technology & Engineering
Languages : en
Pages : 518
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This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Author: Alexander Nichau
Publisher: Forschungszentrum Jülich
ISBN: 3893368981
Category :
Languages : en
Pages : 199
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Author: Michael Fulde
Publisher: Springer Science & Business Media
ISBN: 9048132800
Category : Technology & Engineering
Languages : en
Pages : 131
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Book Description
Since scaling of CMOS is reaching the nanometer area serious limitations enforce the introduction of novel materials, device architectures and device concepts. Multi-gate devices employing high-k gate dielectrics are considered as promising solution overcoming these scaling limitations of conventional planar bulk CMOS. Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies provides a technology oriented assessment of analog and mixed-signal circuits in emerging high-k and multi-gate CMOS technologies.
