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Languages : en
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Book Description
An automated wavelength-dispersive x-ray fluorescence spectrometer is operational for analysis of major elements in rocks and minerals. Procedures for trace-element analysis are being developed. Sample preparation methods and analytical techniques are similar to those commonly used elsewhere, but data reduction is conducted by the Fundamental Parameters program developed by Criss. Unlike empirically derived calibration curves, this data reduction method considers x-ray absorption and secondary fluorescence, which vary with differences in sample composition. X-ray intensities for each element from several standards are averaged to develop a theoretical standard for comparison with samples of unknown composition. Accurate data for samples with wide compositional ranges result from these data reduction and standardization techniques.
