Principles and Applications of Ion Scattering Spectrometry PDF Download
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Author: J. Wayne Rabalais
Publisher: Wiley-Interscience
ISBN:
Category : Science
Languages : en
Pages : 350
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Book Description
The first authoritative account of ion scattering spectrometry for both students and researchers Ion scattering spectrometry, a powerful analytical tool used to determine the structure and composition of a substance, addresses critical problems in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces (including the large battery industry). Principles and Applications of Ion Scattering Spectrometry: Surface Chemical and Structural Analysis represents the first and only book on this exciting field, seamlessly merging theoretical fundamentals with cutting-edge practical applications. Author J. Wayne Rabalais, the world's leading expert in ion scattering spectrometry, recognizes both the pedagogic and research needs of such a text and divides his work accordingly. Chapters 1 through 5 address senior undergraduates and beginning graduate students in chemical physics and include figures and illustrative diagrams intended to exemplify the discussions. Chapters 6 through 9 comprise material on the brink of current research and contain specific references to other sources at the end of each; further, chapter 10 is a bibliography of ion scattering publications. Topics covered include: * Introductory, theoretical, and experimental aspects of ion scattering * General features and structural analysis * The recent technique of scattering and recoiling imaging spectrometry * Examples of structural analysis * Ion-surface charge exchange phenomena * Hyperthermal ion-surface interactions Engineers, researchers, professors, and postdoctoral associates involved in surface analysis, surface science, and studies of surfaces of materials will find Rabalais' incomparable study a seminal moment in the advance of ion scattering spectrometry.
Author: J. Wayne Rabalais
Publisher: Wiley-Interscience
ISBN:
Category : Science
Languages : en
Pages : 350
Get Book Here
Book Description
The first authoritative account of ion scattering spectrometry for both students and researchers Ion scattering spectrometry, a powerful analytical tool used to determine the structure and composition of a substance, addresses critical problems in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces (including the large battery industry). Principles and Applications of Ion Scattering Spectrometry: Surface Chemical and Structural Analysis represents the first and only book on this exciting field, seamlessly merging theoretical fundamentals with cutting-edge practical applications. Author J. Wayne Rabalais, the world's leading expert in ion scattering spectrometry, recognizes both the pedagogic and research needs of such a text and divides his work accordingly. Chapters 1 through 5 address senior undergraduates and beginning graduate students in chemical physics and include figures and illustrative diagrams intended to exemplify the discussions. Chapters 6 through 9 comprise material on the brink of current research and contain specific references to other sources at the end of each; further, chapter 10 is a bibliography of ion scattering publications. Topics covered include: * Introductory, theoretical, and experimental aspects of ion scattering * General features and structural analysis * The recent technique of scattering and recoiling imaging spectrometry * Examples of structural analysis * Ion-surface charge exchange phenomena * Hyperthermal ion-surface interactions Engineers, researchers, professors, and postdoctoral associates involved in surface analysis, surface science, and studies of surfaces of materials will find Rabalais' incomparable study a seminal moment in the advance of ion scattering spectrometry.
Author: John C. Riviere
Publisher: CRC Press
ISBN: 1420007807
Category : Science
Languages : en
Pages : 682
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Book Description
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear
Author: Ragnar Hellborg
Publisher: Springer Science & Business Media
ISBN: 364200623X
Category : Technology & Engineering
Languages : en
Pages : 450
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Book Description
Energetic ion beam irradiation is the basis of a wide plethora of powerful research- and fabrication-techniques for materials characterisation and processing on a nanometre scale. Materials with tailored optical, magnetic and electrical properties can be fabricated by synthesis of nanocrystals by ion implantation, focused ion beams can be used to machine away and deposit material on a scale of nanometres and the scattering of energetic ions is a unique and quantitative tool for process development in high speed electronics and 3-D nanostructures with extreme aspect radios for tissue engineering and nano-fluidics lab-on-a-chip may be machined using proton beams. This book will benefit practitioners, researchers and graduate students working in the field of ion beams and application and more generally everyone concerned with the broad field of nanoscience and technology.
Author: Mike S. Lee
Publisher: John Wiley & Sons
ISBN: 1118180720
Category : Science
Languages : en
Pages : 1362
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Book Description
Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.
Author: G¿nter Gauglitz
Publisher: John Wiley & Sons
ISBN: 3527654720
Category : Science
Languages : en
Pages : 2011
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Book Description
This second, thoroughly revised, updated and enlarged edition provides a straightforward introduction to spectroscopy, showing what it can do and how it does it, together with a clear, integrated and objective account of the wealth of information that may be derived from spectra. It also features new chapters on spectroscopy in nano-dimensions, nano-optics, and polymer analysis. Clearly structured into sixteen sections, it covers everything from spectroscopy in nanodimensions to medicinal applications, spanning a wide range of the electromagnetic spectrum and the physical processes involved, from nuclear phenomena to molecular rotation processes. In addition, data tables provide a comparison of different methods in a standardized form, allowing readers to save valuable time in the decision process by avoiding wrong turns, and also help in selecting the instrumentation and performing the experiments. These four volumes are a must-have companion for daily use in every lab.
Author: Alan M. Spool
Publisher: Momentum Press
ISBN: 1606507745
Category : Technology & Engineering
Languages : en
Pages : 267
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Book Description
Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.
Author: John C. Vickerman
Publisher: John Wiley & Sons
ISBN: 1119965519
Category : Technology & Engineering
Languages : en
Pages : 690
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Book Description
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Author: Kannan M. Krishnan
Publisher: Oxford University Press
ISBN: 0192566083
Category : Science
Languages : en
Pages : 869
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Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Author: Michel Che
Publisher: John Wiley & Sons
ISBN: 3527326871
Category : Technology & Engineering
Languages : en
Pages : 1313
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Book Description
This two-volume book provides an overview of physical techniques used to characterize the structure of solid materials, on the one hand, and to investigate the reactivity of their surface, on the other. Therefore this book is a must-have for anyone working in fields related to surface reactivity. Among the latter, and because of its most important industrial impact, catalysis has been used as the directing thread of the book. After the preface and a general introduction to physical techniques by M. Che and J.C. Vedrine, two overviews on physical techniques are presented by G. Ertl and Sir J.M. Thomas for investigating model catalysts and porous catalysts, respectively. The book is organized into four parts: Molecular/Local Spectroscopies, Macroscopic Techniques, Characterization of the Fluid Phase (Gas and/ or Liquid), and Advanced Characterization. Each chapter focuses upon the following important themes: overview of the technique, most important parameters to interpret the experimental data, practical details, applications of the technique, particularly during chemical processes, with its advantages and disadvantages, conclusions.
Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118916778
Category : Science
Languages : en
Pages : 412
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Book Description
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
