Practical Electron Microscopy Of Lattice Defects PDF Download
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Author: Hiroyasu Saka
Publisher: World Scientific
ISBN: 981123471X
Category : Science
Languages : en
Pages : 309
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Book Description
'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Author: Hiroyasu Saka
Publisher: World Scientific
ISBN: 981123471X
Category : Science
Languages : en
Pages : 309
Get Book Here
Book Description
'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Author: Jeffrey William Edington
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 390
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Book Description
Author: S. Amelinckx
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 754
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Book Description
Author: M. H. Loretto
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 152
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Book Description
Author: A.K. Head
Publisher: Elsevier
ISBN: 0444601473
Category : Computers
Languages : en
Pages : 413
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Book Description
Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.
Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 0387765018
Category : Technology & Engineering
Languages : en
Pages : 805
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Book Description
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
Author: Kunio Suzuki
Publisher:
ISBN:
Category :
Languages : en
Pages : 21
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Book Description
Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662215799
Category : Science
Languages : en
Pages : 560
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Book Description
The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy.
Author: Materials Research Society
Publisher: Pittsburgh, Pa. : Materials Research Society
ISBN:
Category : Science
Languages : en
Pages : 424
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Kunio Suzuki
Publisher:
ISBN:
Category :
Languages : en
Pages : 21
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Book Description
