Practical Electron Microscopy in Materials Science PDF Download
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Author: Jeffrey William Edington
Publisher: Techbooks
ISBN: 9781878907356
Category : Crystallography
Languages : en
Pages : 0
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Book Description
Author: Jeffrey William Edington
Publisher: Techbooks
ISBN: 9781878907356
Category : Crystallography
Languages : en
Pages : 0
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Book Description
Author: David Bernard Williams
Publisher: Springer Science & Business Media
ISBN: 9780306452475
Category : Science
Languages : en
Pages : 818
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Book Description
This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Author: Brent Fultz
Publisher: Springer Science & Business Media
ISBN: 3662045168
Category : Science
Languages : en
Pages : 759
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Book Description
Aims and Scope of the Book This textbook was written for advanced un dergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials characterization research using TEM and XRD. There are, of course, many specialties that have attained a higher level of sophistication than presented here. The content of this book has been chosen in part to provide the background needed for a transition to these research specialties, or to other techniques such as neutron diffractometry. Although the book includes many practical details and examples, it does not cover some topics important for laboratory work. Perhaps the most obvious is the omission of specimen preparation methods for TEM. Beneath the details of principle and practice lies a larger goal of unifying the concepts common to both TEM and XRD. Coherence and wave interfer ence are conceptually similar for both x-ray waves and electron wavefunctions.
Author: David Bernard Williams
Publisher: Wiley-VCH
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 168
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Book Description
Author: Audry M. Glauert
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 464
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Book Description
Author: Elaine Evelyn Hunter
Publisher: Cambridge University Press
ISBN: 9780521385398
Category : Medical
Languages : en
Pages : 210
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Book Description
For this new edition, the chapters on photography and the electron microscope have been completely rewritten and two new chapters have been added--on immuno electron microscopy using colloidal gold and on useful specialized techniques.
Author: J.W. Edington
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: DAISUKE Shindo
Publisher: Springer Science & Business Media
ISBN: 4431669884
Category : Science
Languages : en
Pages : 162
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Book Description
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
Author: Daisuke Shindo
Publisher: Springer Science & Business Media
ISBN: 4431684220
Category : Technology & Engineering
Languages : en
Pages : 196
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Book Description
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Author: U Valdre
Publisher: Elsevier
ISBN: 0323142567
Category : Science
Languages : en
Pages : 785
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Book Description
Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.
