Polarization Interferometers: Applications in Microscopy and Macroscopy PDF Download
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Author: Maurice Françon
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 188
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Book Description
Author: Maurice Françon
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 188
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Book Description
Author: Theodore G. Rochow
Publisher: Springer Science & Business Media
ISBN: 1489915133
Category : Science
Languages : en
Pages : 462
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Book Description
Following three printings of the First Edition (1978), the publisher has asked for a Second Edition to bring the contents up to date. In doing so the authors aim to show how the newer microscopies are related to the older types with respect to theoretical resolving power (what you pay for) and resolution (what you get). The book is an introduction to students, technicians, technologists, and scientists in biology, medicine, science, and engineering. It should be useful in academic and industrial research, consulting, and forensics; how ever, the book is not intended to be encyclopedic. The authors are greatly indebted to the College of Textiles of North Carolina State University at Raleigh for support from the administration there for typing, word processing, stationery, mailing, drafting diagrams, and general assistance. We personally thank Joann Fish for word process ing, Teresa M. Langley and Grace Parnell for typing services, Mark Bowen for drawing graphs and diagrams, Chuck Gardner for photographic ser vices, Deepak Bhattavahalli for his work with the proofs, and all the other people who have given us their assistance. The authors wish to acknowledge the many valuable suggestions given by Eugene G. Rochow and the significant editorial contributions made by Elizabeth Cook Rochow.
Author: P. Hariharan
Publisher: Elsevier
ISBN: 0080473644
Category : Technology & Engineering
Languages : en
Pages : 368
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Book Description
When the first edition of Optical Interferometry was published, interferometry was regarded as a rather esoteric method of making measurements, largely confined to the laboratory. Today, however, besides its use in several fields of research, it has applications in fields as diverse as measurement of length and velocity, sensors for rotation, acceleration, vibration and electrical and magnetic fields, as well as in microscopy and nanotechnology. Most topics are discussed first at a level accessible to anyone with a basic knowledge of physical optics, then a more detailed treatment of the topic is undertaken, and finally each topic is supplemented by a reference list of more than 1000 selected original publications in total. - Historical development of interferometry - The laser as a light source - Two-beam interference - Techniques for frequency stabilization - Coherence - Electronic phase measurements - Multiple-beam interference - Quantum effects in optical interference - Extensive coverage of the applications of interferometry, such as measurements of length, optical testing, interference microscopy, interference spectroscopy, Fourier-transform spectroscopy, interferometric sensors, nonlinear interferometers, stellar interferometry, and studies of space-time and gravitation
Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1324
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Book Description
Author: Rajpal Sirohi
Publisher: CRC Press
ISBN: 1420017764
Category : Technology & Engineering
Languages : en
Pages : 316
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Book Description
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
Author: Rajpal S. Sirohi
Publisher: CRC Press
ISBN: 1351831119
Category : Technology & Engineering
Languages : en
Pages : 353
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Book Description
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Author: G. G. Shepherd
Publisher: Academic Press
ISBN: 9780126394818
Category : Medical
Languages : en
Pages : 358
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Book Description
Traces the historical development of both spectral and imaging methods, placing them in a unified framework relevant to observations of the troposphere, stratosphere, mesosphere, and thermosphere.
Author: Michael Bukshtab
Publisher: Springer Science & Business Media
ISBN: 940072165X
Category : Science
Languages : en
Pages : 726
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Book Description
Applied Photometry, Radiometry, and Measurements of Optical Losses reviews and analyzes physical concepts of radiation transfer, providing quantitative foundation for the means of measurements of optical losses, which affect propagation and distribution of light waves in various media and in diverse optical systems and components. The comprehensive analysis of advanced methodologies for low-loss detection is outlined in comparison with the classic photometric and radiometric observations, having a broad range of techniques examined and summarized: from interferometric and calorimetric, resonator and polarization, phase-shift and ring-down decay, wavelength and frequency modulation to pulse separation and resonant, acousto-optic and emissive - subsequently compared to direct and balancing methods for studying free-space and polarization optics, fibers and waveguides. The material is focused on applying optical methods and procedures for evaluation of transparent, reflecting, scattering, absorbing, and aggregated objects, and for determination of power and energy parameters of radiation and color properties of light.
Author: Tadeusz Pustelny
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 446
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Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Author: Frank Träger
Publisher: Springer Science & Business Media
ISBN: 3642194095
Category : Science
Languages : en
Pages : 1704
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Book Description
This new edition features numerous updates and additions. Especially 4 new chapters on Fiber Optics, Integrated Optics, Frequency Combs and Interferometry reflect the changes since the first edition. In addition, major complete updates for the chapters: Optical Materials and Their Properties, Optical Detectors, Nanooptics, and Optics far Beyond the Diffraction Limit. Features Contains over 1000 two-color illustrations. Includes over 120 comprehensive tables with properties of optical materials and light sources. Emphasizes physical concepts over extensive mathematical derivations. Chapters with summaries, detailed index Delivers a wealth of up-to-date references.
