POF Performance, Reliability and Challenges PDF Download
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Author:
Publisher: Information Gatekeepers Inc
ISBN:
Category :
Languages : en
Pages : 24
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Book Description
Author:
Publisher: Information Gatekeepers Inc
ISBN:
Category :
Languages : en
Pages : 24
Get Book Here
Book Description
Author:
Publisher: Information Gatekeepers Inc
ISBN:
Category :
Languages : en
Pages : 158
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Book Description
Author:
Publisher: Information Gatekeepers Inc
ISBN:
Category :
Languages : en
Pages : 256
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Book Description
Author: Mohammad Modarres
Publisher: John Wiley & Sons
ISBN: 1119388686
Category : Technology & Engineering
Languages : en
Pages : 289
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Book Description
The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.
Author: R. K. Saket
Publisher: John Wiley & Sons
ISBN: 1394226748
Category : Technology & Engineering
Languages : en
Pages : 581
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Book Description
A reader-friendly introduction to reliability analysis and its power systems applications The subset of probability theory known as reliability theory analyzes the likelihood of failure in a given component or system under given conditions. It is a critical aspect of engineering as it concerns systems of all kinds, not least modern power systems, with their essential role in sustaining the technologies on which modern life relies. Reliability Analysis of Modern Power Systems is a thorough, accessible book introducing the core concepts of reliability theory as they apply to power systems engineering, as well as the advanced technologies currently driving new frontiers in reliability analysis. It is a must-own for anyone looking to understand and improve the systems that power our world. Readers will also find: Detailed discussion of reliability modeling and simulation of composite systems using Typhoon HIL 404 Reliability assessment of generation systems, transmission systems, distribution systems, and more Information on renewable energy integration for more sustainable power grids Reliability Analysis of Modern Power Systems is ideal for professionals, engineers, and researchers in power system design and reliability engineering, as well as for advanced undergraduate and graduate students in these and related subjects.
Author: W.D. van Driel
Publisher: Springer Science & Business Media
ISBN: 1461430674
Category : Technology & Engineering
Languages : en
Pages : 619
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Book Description
Solid State Lighting Reliability: Components to Systems begins with an explanation of the major benefits of solid state lighting (SSL) when compared to conventional lighting systems including but not limited to long useful lifetimes of 50,000 (or more) hours and high efficacy. When designing effective devices that take advantage of SSL capabilities the reliability of internal components (optics, drive electronics, controls, thermal design) take on critical importance. As such a detailed discussion of reliability from performance at the device level to sub components is included as well as the integrated systems of SSL modules, lamps and luminaires including various failure modes, reliability testing and reliability performance. A follow-up, Solid State Lighting Reliability Part 2, was published in 2017.
Author:
Publisher: Information Gatekeepers Inc
ISBN:
Category :
Languages : en
Pages : 90
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Book Description
Author: Norman Pascoe
Publisher: John Wiley & Sons
ISBN: 1119991366
Category : Technology & Engineering
Languages : en
Pages : 420
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Book Description
A unique book that describes the practical processes necessary to achieve failure free equipment performance, for quality and reliability engineers, design, manufacturing process and environmental test engineers. This book studies the essential requirements for successful product life cycle management. It identifies key contributors to failure in product life cycle management and particular emphasis is placed upon the importance of thorough Manufacturing Process Capability reviews for both in-house and outsourced manufacturing strategies. The readers? attention is also drawn to the many hazards to which a new product is exposed from the commencement of manufacture through to end of life disposal. Revolutionary in focus, as it describes how to achieve failure free performance rather than how to predict an acceptable performance failure rate (reliability technology rather than reliability engineering) Author has over 40 years experience in the field, and the text is based on classroom tested notes from the reliability technology course he taught at Massachusetts Institute of Technology (MIT), USA Contains graphical interpretations of mathematical models together with diagrams, tables of physical constants, case studies and unique worked examples
Author:
Publisher: Information Gatekeepers Inc
ISBN:
Category :
Languages : en
Pages : 22
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Book Description
Author: Joseph B. Bernstein
Publisher: John Wiley & Sons
ISBN: 1394210930
Category : Technology & Engineering
Languages : en
Pages : 404
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Book Description
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
