Author: Alok Barua
Publisher:
ISBN: 9780750317320
Category : Analog-to-digital converters
Languages : en
Pages : 0
Book Description
Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering.
Pipelined Analog to Digital Converter and Fault Diagnosis
Author: Alok Barua
Publisher:
ISBN: 9780750317320
Category : Analog-to-digital converters
Languages : en
Pages : 0
Book Description
Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering.
Publisher:
ISBN: 9780750317320
Category : Analog-to-digital converters
Languages : en
Pages : 0
Book Description
Pipelined architecture analog-to-digital converters (ADCs) have become the architecture of choice for high speed and moderate to high resolution devices. Subsequently, different techniques of the fault diagnosis by built in self-test (BIST) system have been developed. This book gives a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed. Chapter 1 discusses a 1.8V 10-bit 500 mega samples-per-second parallel pipelined ADC, describing the design of high speed, low power, low voltage ADC in CMOS technology. Chapter 2 introduces a BIST system where both the circuit and its diagnosis tool are implemented on the same chip. Chapter 3 examines the design of an oscillation-based BIST system for a 1.8V 8-bit 125-mega samples per second pipelined ADC. Chapter 4 focuses on the evaluation of dynamic parameters of a pipelined ADC with an oscillation-based BIST. Chapter 5 covers reconfigurable BIST architecture for pipelined ADCs. The book is an ideal reference for graduate students and researchers within electrical, electronics and computer engineering.
Pipelined Analog to Digital Converter and Fault Diagnosis
Author: Alok Barua
Publisher:
ISBN: 9780750317689
Category :
Languages : en
Pages : 184
Book Description
Pipelined analog to digital converters (ADCs) have become the architecture of choice for high-speed and moderate- to high-resolution devices. Subsequently, different techniques of fault diagnosis by the built-in self-test (BIST) system have been developed. An ideal reference for graduate students and researchers within electrical, electronics and computer engineering, this book provides a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed.
Publisher:
ISBN: 9780750317689
Category :
Languages : en
Pages : 184
Book Description
Pipelined analog to digital converters (ADCs) have become the architecture of choice for high-speed and moderate- to high-resolution devices. Subsequently, different techniques of fault diagnosis by the built-in self-test (BIST) system have been developed. An ideal reference for graduate students and researchers within electrical, electronics and computer engineering, this book provides a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI). In each chapter a unique fault diagnosis technique for pipelined ADC has been proposed.
IEEE VLSI Test Symposium
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 552
Book Description
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 552
Book Description
Science Abstracts
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1360
Book Description
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1360
Book Description
Efficient Testability Design Methodology for Analog/mixed Signal Integrated Circuits
Author: Cheng-Ping Wang
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 378
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 378
Book Description
Index to IEEE Publications
Author: Institute of Electrical and Electronics Engineers
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1468
Book Description
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1468
Book Description
Of Clocks and Time
Author: Lutz Hüwel
Publisher: Morgan & Claypool Publishers
ISBN: 1681740966
Category : Science
Languages : en
Pages : 186
Book Description
Of Clocks and Time takes readers on a five-stop journey through the physics and technology (and occasional bits of applications and history) of timekeeping. On the way, conceptual vistas and qualitative images abound, but since mathematics is spoken everywhere the book visits equations, quantitative relations, and rigorous definitions are offered as well. The expedition begins with a discussion of the rhythms produced by the daily and annual motion of sun, moon, planets, and stars. Centuries worth of observation and thinking culminate in Newton's penetrating theoretical insights since his notion of space and time are still influential today. During the following two legs of the trip, tools are being examined that allow us to measure hours and minutes and then, with ever growing precision, the tiniest fractions of a second. When the pace of travel approaches the ultimate speed limit, the speed of light, time and space exhibit strange and counter-intuitive traits. On this fourth stage of the journey, Einstein is the local tour guide whose special and general theories of relativity explain the behavior of clocks under these circumstances. Finally, the last part of the voyage reverses direction, moving ever deeper into the past to explore how we can tell the age of "things" - including that of the universe itself.
Publisher: Morgan & Claypool Publishers
ISBN: 1681740966
Category : Science
Languages : en
Pages : 186
Book Description
Of Clocks and Time takes readers on a five-stop journey through the physics and technology (and occasional bits of applications and history) of timekeeping. On the way, conceptual vistas and qualitative images abound, but since mathematics is spoken everywhere the book visits equations, quantitative relations, and rigorous definitions are offered as well. The expedition begins with a discussion of the rhythms produced by the daily and annual motion of sun, moon, planets, and stars. Centuries worth of observation and thinking culminate in Newton's penetrating theoretical insights since his notion of space and time are still influential today. During the following two legs of the trip, tools are being examined that allow us to measure hours and minutes and then, with ever growing precision, the tiniest fractions of a second. When the pace of travel approaches the ultimate speed limit, the speed of light, time and space exhibit strange and counter-intuitive traits. On this fourth stage of the journey, Einstein is the local tour guide whose special and general theories of relativity explain the behavior of clocks under these circumstances. Finally, the last part of the voyage reverses direction, moving ever deeper into the past to explore how we can tell the age of "things" - including that of the universe itself.
Documentation Abstracts
Author:
Publisher:
ISBN:
Category : Documentation
Languages : en
Pages : 498
Book Description
Publisher:
ISBN:
Category : Documentation
Languages : en
Pages : 498
Book Description
Electrical & Electronics Abstracts
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 2240
Book Description
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 2240
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1124
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1124
Book Description