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Author: Claude Weisbuch
Publisher: Springer Science & Business Media
ISBN: 1475700911
Category : Science
Languages : en
Pages : 414
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Book Description
Low-dimensional materials are of fundamental interest in physics and chemistry and have also found a wide variety of technological applica tions in fields ranging from microelectronics to optics. Since 1986, several seminars and summer schools devoted to low-dimensional systems have been supported by NATO. The present one, Physics, Fabrication and Applications of Multilayered structures, brought together specialists from different fields in order to review fabrication techniques, charac terization methods, physics and applications. Artificially layered materials are attractive because alternately layering two (or more) elements, by evaporation or sputtering, is a way to obtain new materials with (hopefully) new physical properties that pure materials or alloys do not allow. These new possibilities can be ob tained in electronic transport, optics, magnetism or the reflectivity of x-rays and slow neutrons. By changing the components and the thickness of the layers one can track continuously how the new properties appear and follow the importance of the multilayer structure of the materials. In addition, with their large number of interfaces the study of inter face properties becomes easier in multilayered structures than in mono layers or bilayers. As a rule, the role of the interface quality, and also the coupling between layers, increases as the thickness of the layer decreases. Several applications at the development stage require layer thicknesses of just a few atomic layers.
Author: Claude Weisbuch
Publisher: Springer Science & Business Media
ISBN: 1475700911
Category : Science
Languages : en
Pages : 414
Get Book Here
Book Description
Low-dimensional materials are of fundamental interest in physics and chemistry and have also found a wide variety of technological applica tions in fields ranging from microelectronics to optics. Since 1986, several seminars and summer schools devoted to low-dimensional systems have been supported by NATO. The present one, Physics, Fabrication and Applications of Multilayered structures, brought together specialists from different fields in order to review fabrication techniques, charac terization methods, physics and applications. Artificially layered materials are attractive because alternately layering two (or more) elements, by evaporation or sputtering, is a way to obtain new materials with (hopefully) new physical properties that pure materials or alloys do not allow. These new possibilities can be ob tained in electronic transport, optics, magnetism or the reflectivity of x-rays and slow neutrons. By changing the components and the thickness of the layers one can track continuously how the new properties appear and follow the importance of the multilayer structure of the materials. In addition, with their large number of interfaces the study of inter face properties becomes easier in multilayered structures than in mono layers or bilayers. As a rule, the role of the interface quality, and also the coupling between layers, increases as the thickness of the layer decreases. Several applications at the development stage require layer thicknesses of just a few atomic layers.
Author: Claude Weisbuch
Publisher: Springer
ISBN: 9781475700930
Category : Science
Languages : en
Pages : 416
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Book Description
Low-dimensional materials are of fundamental interest in physics and chemistry and have also found a wide variety of technological applica tions in fields ranging from microelectronics to optics. Since 1986, several seminars and summer schools devoted to low-dimensional systems have been supported by NATO. The present one, Physics, Fabrication and Applications of Multilayered structures, brought together specialists from different fields in order to review fabrication techniques, charac terization methods, physics and applications. Artificially layered materials are attractive because alternately layering two (or more) elements, by evaporation or sputtering, is a way to obtain new materials with (hopefully) new physical properties that pure materials or alloys do not allow. These new possibilities can be ob tained in electronic transport, optics, magnetism or the reflectivity of x-rays and slow neutrons. By changing the components and the thickness of the layers one can track continuously how the new properties appear and follow the importance of the multilayer structure of the materials. In addition, with their large number of interfaces the study of inter face properties becomes easier in multilayered structures than in mono layers or bilayers. As a rule, the role of the interface quality, and also the coupling between layers, increases as the thickness of the layer decreases. Several applications at the development stage require layer thicknesses of just a few atomic layers.
Author: Rodenburg
Publisher: CRC Press
ISBN: 9780750304412
Category : Technology & Engineering
Languages : en
Pages : 716
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Book Description
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Author: M. J. Kelly
Publisher: Clarendon Press
ISBN: 0191590096
Category : Science
Languages : en
Pages : 569
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Book Description
This text is a first attempt to pull together the whole of semiconductor science and technology since 1970 in so far as semiconductor multilayers are concerned. Material, technology, physics and device issues are described with approximately equal emphasis, and form a single coherant point of view. The subject matter is the concern of over half of today's active semiconductor scientists and technologists, the remainder working on bulk semiconductors and devices. It is now routine to design and the prepare semiconductor multilayers at a time, with independent control over the dropping and composition in each layer. In turn these multilayers can be patterned with features that as a small as a few atomic layers in lateral extent. The resulting structures open up many new ares of exciting solid state and quantum physics. They have also led to whole new generations of electronic and optoelectronic devices whose superior performance relates back to the multilayer structures. The principles established in the field have several decades to go, advancing towards the ultimate of materials engineering, the design and preparation of solids atom by atom. The book should appeal equally to physicists, electronic engineers and materials scientists.
Author: Paul H. Holloway
Publisher: Cambridge University Press
ISBN: 0080946143
Category : Technology & Engineering
Languages : en
Pages : 937
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Book Description
This book reviews the recent advances and current technologies used to produce microelectronic and optoelectronic devices from compound semiconductors. It provides a complete overview of the technologies necessary to grow bulk single-crystal substrates, grow hetero-or homoepitaxial films, and process advanced devices such as HBT's, QW diode lasers, etc.
Author: John M. Rodenburg
Publisher: CRC Press
ISBN: 1000112306
Category : Science
Languages : en
Pages : 708
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Book Description
Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
Author: Lawrence Herman Bennett
Publisher: World Scientific
ISBN: 9789810217679
Category : Science
Languages : en
Pages : 400
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Book Description
This book focuses on an increasingly important area of materials science and technology, namely, the fabrication and properties of artificial materials where slabs of magnetized materials are sandwiched between slabs of nonmagnetized materials. It includes reviews by experts on the theory and descriptions of the various experimental techniques such as those using nuclear or electron spin probes, as well as optical, X-ray or neutron probes. It also reviews potential applications such as the giant magnetoresistance, and one specialized preparation technique, the electrodeposition. The various chapters are tutorial in nature, making the subject accessible to nonspecialists, as well as useful to researchers in the field.
Author: G. Hooft
Publisher: Springer Science & Business Media
ISBN: 1461307295
Category : Science
Languages : en
Pages : 603
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Book Description
During the past 15 years, quantum field theory and classical statistical mechanics have merged into a single field, and the need for nonperturbative methods for the description of critical phenomena in statistical mechanics as well as for problems in elementary particle physics are generally acknowledged. Such methods formed the central theme of the 1987 Cargese Advanced Study Institut. e on "Nonpert. urbat. ive Quantum Field Theory." The use of conformal symmet. ry has been of central interest in recent years, and was a main subject at. t. he ASI. Conformal invariant quantum field theory describes statistical mechanical systems exactly at a critical point, and can be analysed to a remarkable ext. ent. by group t. heoretical methods. Very strong results have been obtained for 2-dimensional systems. Conformal field theory is also the basis of string theory, which offers some hope of providing a unified t. heory of all interactions between elementary particles. Accordingly, a number of lectures and seminars were presented on these two topics. After syst. ematic introductory lectures, conformal field theory on Riemann surfaces, orbifolds, sigma models, and application of loop group theory and Grassmannians were discussed, and some ideas on modular geometry were presented. Other lectures combined' traditional techniques of constructive quant. um field theory with new methods such as the use of index-t. heorems and infinite dimensional (Kac Moody) symmetry groups. The problems encountered in a quantum mechanical description of black holes were discussed in detail.
Author: Klaus D. Sattler
Publisher: CRC Press
ISBN: 1420075519
Category : Science
Languages : en
Pages : 782
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Book Description
Many bottom-up and top-down techniques for nanomaterial and nanostructure generation have enabled the development of applications in nanoelectronics and nanophotonics. Handbook of Nanophysics: Nanoelectronics and Nanophotonics explores important recent applications of nanophysics in the areas of electronics and photonics. Each peer-reviewed c
Author: D. Wolf
Publisher: Springer Science & Business Media
ISBN: 9780412412707
Category : Technology & Engineering
Languages : en
Pages : 748
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Book Description
Many of the most important properties of materials in high-technology applications are strongly influenced or even controlled by the presence of solid interfaces. In this work, leading international authorities review the broad range of subjects in this field focusing on the atomic level properties of solid interfaces.
