Physical Methods for Materials Characterisation PDF Download
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Author: Peter E. J. Flewitt
Publisher: CRC Press
ISBN: 1315363232
Category : Science
Languages : en
Pages : 725
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Book Description
This completely revised and expanded new edition covers the full range of techniques now available for the investigation of materials structure and accurate quantitative determination of microstructural features within materials. It continues to provide the best introductory resource for understanding the interrelationship between microstructure and physical, mechanical, and chemical properties, as well as selection and application of techniques for both basic and applied studies. In particular, changes have been made to reflect developments in analysis of nanoscale and biological materials.
Author: Peter E. J. Flewitt
Publisher: CRC Press
ISBN: 1315363232
Category : Science
Languages : en
Pages : 725
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Book Description
This completely revised and expanded new edition covers the full range of techniques now available for the investigation of materials structure and accurate quantitative determination of microstructural features within materials. It continues to provide the best introductory resource for understanding the interrelationship between microstructure and physical, mechanical, and chemical properties, as well as selection and application of techniques for both basic and applied studies. In particular, changes have been made to reflect developments in analysis of nanoscale and biological materials.
Author: Martin Berz
Publisher: CRC Press
ISBN: 9780750308083
Category : Science
Languages : en
Pages : 624
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Book Description
The field of beam physics touches many areas of physics, engineering, and the sciences. In general terms, beams describe ensembles of particles with initial conditions similar enough to be treated together as a group so that the motion is a weakly nonlinear perturbation of a chosen reference particle. Particle beams are used in a variety of areas, ranging from electron microscopes, particle spectrometers, medical radiation facilities, powerful light sources, and astrophysics to large synchrotrons and storage rings such as the LHC at CERN. An Introduction to Beam Physics is based on lectures given at Michigan State University’s Department of Physics and Astronomy, the online VUBeam program, the U.S. Particle Accelerator School, the CERN Academic Training Programme, and various other venues. It is accessible to beginning graduate and upper-division undergraduate students in physics, mathematics, and engineering. The book begins with a historical overview of methods for generating and accelerating beams, highlighting important advances through the eyes of their developers using their original drawings. The book then presents concepts of linear beam optics, transfer matrices, the general equations of motion, and the main techniques used for single- and multi-pass systems. Some advanced nonlinear topics, including the computation of aberrations and a study of resonances, round out the presentation.
Author: P. E. J. Flewitt
Publisher: Inst of Physics Pub Incorporated
ISBN: 9780750302036
Category : Technology & Engineering
Languages : en
Pages : 517
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Book Description
This important textbook provides a comprehensive description of the large range of techniques used to characterize the microstructure of materials. The book carefully explains the interactions between various radiations with materials, and shows how these interactions form the basis of the specific evaluation and measurement methods. Sections of the text deal with basic science and technology, such as diffraction laws, vacuum techniques and radiation sources. The characterization techniques are divided on the basis of the interrogating radiation source, and cover optical and x-ray techniques, electron microscopy and spectroscopy, ion and particle microscopy and spectroscopy. Computer applications in instrument control, data acquisition and analysis are discussed, together with coverage of simulation techniques.
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: Sam Zhang
Publisher: CRC Press
ISBN: 1420042955
Category : Science
Languages : en
Pages : 344
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Book Description
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche
Author: Boris Imelik
Publisher: Springer Science & Business Media
ISBN: 1475795890
Category : Science
Languages : en
Pages : 720
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Book Description
to the Fundamental and Applied Catalysis Series Catalysis is important academically and industrially. It plays an essential role in the manufacture of a wide range of products, from gasoline and plastics to fertilizers and herbicides, which would otherwise be unobtainable or prohibitive ly expensive. There are few chemical-or oil-based material items in modern society that do not depend in some way on a catalytic stage in their manufacture. Apart from manufacturing processes, catalysis is finding other important and over-increasing uses; for example, successful applications of catalysis in the control ofpollution and its use in environmental control are certain to in crease in the future. The commercial import an ce of catalysis and the diverse intellectual challenges of catalytic phenomena have stimulated study by a broad spectrum of scientists including chemists, physicists, chemical engineers, and material scientists. Increasing research activity over the years has brought deeper levels of understanding, and these have been associated with a continually growing amount of published material. As recentlyas sixty years ago, Rideal and Taylor could still treat the subject comprehensively in a single volume, but by the 19 50s Emmett required six volumes, and no conventional multivolume text could now cover the whole of catalysis in any depth.
Author: Surender Kumar Sharma
Publisher: Springer
ISBN: 3319929550
Category : Technology & Engineering
Languages : en
Pages : 613
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Book Description
This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
Author: A.K. Tyagi
Publisher: Trans Tech Publications Ltd
ISBN: 303813323X
Category : Technology & Engineering
Languages : en
Pages : 528
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Book Description
Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.
Author: Kannan M. Krishnan
Publisher: Oxford University Press
ISBN: 0192566083
Category : Science
Languages : en
Pages : 550
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Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Author: Ramiro Pérez Campos
Publisher: Springer
ISBN: 3319152041
Category : Technology & Engineering
Languages : en
Pages : 219
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Book Description
This book covers novel research results for process and techniques of materials characterization for a wide range of materials. The authors provide a comprehensive overview of the aspects of structural and chemical characterization of these materials. The articles contained in this book covers state of the art and experimental techniques commonly used in modern materials characterization. The book includes theoretical models and numerous illustrations of structural and chemical characterization properties.
