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Languages : en
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Author: Lawrence C. Wagner
Publisher: Springer Science & Business Media
ISBN: 1461549191
Category : Technology & Engineering
Languages : en
Pages : 256
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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
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Category : Integrated circuits
Languages : en
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ISBN: 9781728135526
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Languages : en
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Author: IEEE Staff
Publisher:
ISBN: 9781467382601
Category :
Languages : en
Pages :
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IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies
Author: IEEE Staff
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ISBN: 9781538649305
Category :
Languages : en
Pages :
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IPFA 2018 is devoted to the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability
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ISBN: 9781538649299
Category :
Languages : en
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Category : Integrated circuits
Languages : en
Pages : 438
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Author:
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ISBN:
Category : Integrated circuits
Languages : en
Pages : 378
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Author: IEEE Singapore Section
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Languages : en
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