Particle size analysis 1985 PDF Download
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Author: P. J. Lloyd
Publisher:
ISBN:
Category :
Languages : en
Pages : 669
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Book Description
Author: P. J. Lloyd
Publisher:
ISBN:
Category :
Languages : en
Pages : 669
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Book Description
Author: I. Claus Bernhardt
Publisher: Springer Science & Business Media
ISBN: 940111238X
Category : Technology & Engineering
Languages : en
Pages : 438
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Book Description
teacher Professor Ernst-Joachim Ivers to whom I still owe many insights 20 years after the end of his working life. This English edition is not an unedited translation of the German edition of 1990. The text has been substantially revised in some chapters, taking into account the literature published in the mean time. I wish to thank Dr.-Ing. H. Finken, Freiberg, who has prepared the translation from German into English with deep scientific understanding and in close contact with the author. I also wish to express my gratitude to Chapman & Hall for their support to this project without which the English edition could not have been published. Dr.-Ing. habil. C. Bernhardt Freiberg 1 Position, tasks and structure of particle size analysis Today the concept of particle size analysis is that of a special field of particle measurement technology, which in turn is part of particulate technology. This classification has developed over the last 20 years; it is the result of a scientific integration process taking place in many industrialized countries of the world. In recent years, the meaning and mutual connection of the related concepts as well as the tasks of the scientific disciplines designated by them have been the subject of intensive discussion which, however, has not led to a generally accepted terminology.
Author: N G Stanley-Wood
Publisher: Royal Society of Chemistry
ISBN: 1847551629
Category : Science
Languages : en
Pages : 557
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Book Description
Particle Size Analysis reviews the development of particle characterization over the past 25 years and also speculates on its future. Interest in the subject has increased enormously over the years and this book highlights the changes and advances made within the field. This book is comprehensive in its coverage of particle size analysis and includes contributions on such characterization techniques as microscopy using fractal analysis, light diffraction, light scattering with the phase doppler technique, light observation, and photon correlation spectroscopy. A number of chapters address the interest in on-line in-stream particle size analysis and illustrate the progress being made in achieving this long sought after ideal of in-situ in-process particle characterization. Applications to other technological fields are detailed by chapters covering biological systems and the pharmaceutical industry. The subject of surface area determination is considered with particular emphasis on the measurements on porosity of powders, the characterization and comparability of reference materials, and the need for standards. Particle Size Analysis should provide stimulating reading for technologists, scientists, and engineers involved in particle characterization and powder technology worldwide.
Author: J. Gautheyrou
Publisher: CRC Press
ISBN: 9789054107163
Category : Technology & Engineering
Languages : en
Pages : 514
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Book Description
The objective of this book is to provide a better understanding of tools for soil analysis in order to use them more efficiently. It covers sampling problems as well as difficulties relating to actual analysis and quality control.
Author: P. J. Lloyd
Publisher: John Wiley & Sons
ISBN: 9780471919971
Category : Science
Languages : en
Pages : 384
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Book Description
The study of particle characteristics in terms of size, surface area and shear has attracted widespread interest over many years. Initially the emphasis has been on the instrumentation and measurement of particle size but with the increasing importance of particle characterisation in the fields of chemical processing, metallurgy, pharmaceuticals, food and biological materials, the informational needs have been enlarged and the emphasis has changed to incorporate material parameters other than particle size.
Author: P. J. Lloyd
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 184
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Book Description
Author: P. J. Lloyd
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 690
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Book Description
Author: Terence Allen
Publisher: Springer Science & Business Media
ISBN: 9780412753305
Category : Technology & Engineering
Languages : en
Pages : 282
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Book Description
This is the fifth edition of the highly successful work first published in 1968, comprising two definitive volumes on particle characterisation. The first volume is devoted to sampling and particle size measurement, while surface area and pore size determination are reviewed in volume 2. Particle size and characterisation are central to understanding powder properties and behaviour. This book describes numerous potential measuring devices, how they operate and their advantages and disadvantages. It comprise a fully comprehensive treatise on the wide range of available equipment with an extensive literature survey, and a list of manufacturers and suppliers. The author's blend of academic and industrial experience results in a readable technical book with information on how to analyse, present, and extract useful information from data. This is an essential reference book for both industrial and academic research workers in a variety of areas including: pharmaceuticals, food science, pollution analysis and control, electronic materials, agricultural products, polymers, pigments and chemicals.
Author: Abraham Landzberg
Publisher: Springer Science & Business Media
ISBN: 1461520290
Category : Technology & Engineering
Languages : en
Pages : 663
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Book Description
The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
