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Author: Daniel Malacara
Publisher: John Wiley & Sons
ISBN: 9780470135969
Category : Science
Languages : en
Pages : 888
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Book Description
The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.
Author: Daniel Malacara
Publisher: John Wiley & Sons
ISBN: 9780470135969
Category : Science
Languages : en
Pages : 888
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Book Description
The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.
Author: Zacarias Malacara
Publisher: CRC Press
ISBN: 1420027271
Category : Science
Languages : en
Pages : 568
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Book Description
In this day of digitalization, you can work within the technology of optics without having to fully understand the science behind it. However, for those who wish to master the science, rather than merely be its servant, it's essential to learn the nuances, such as those involved with studying fringe patterns produced by optical testing interferometers. When Interferogram Analysis for Optical Testing originally came to print, it filled the need for an authoritative reference on this aspect of fringe analysis. That it was also exceptionally current and highly accessible made its arrival even more relevant. Of course, any book on something as cutting edge as interferogram analysis, no matter how insightful, isn't going to stay relevant forever. The second edition of Interferogram Analysis for Optical Testing is designed to meet the needs of all those involved or wanting to become involved in this area of advanced optical engineering. For those new to the science, it provides the necessary fundamentals, including basic computational methods for studying fringe patterns. For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education. Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.
Author: Joseph M. Geary
Publisher: SPIE Press
ISBN: 9780819413772
Category : Technology & Engineering
Languages : en
Pages : 168
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Book Description
This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations.
Author: Jim Schwiegerling
Publisher:
ISBN: 9781628413670
Category : Electronic books
Languages : en
Pages : 216
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Book Description
This book connects the dots between geometrical optics, interference and diffraction, and aberrations to illustrate the development of an optical system. It focuses on initial layout, design and aberration analysis, fabrication, and, finally, testing and verification of the individual components and the system performance. It also covers more specialized topics such as fitting Zernike polynomials, representing aspheric surfaces with the Forbes Q polynomials, and testing with the Shack-Hartmann wavefront sensor. These topics are discussed in more detail than is found in other textbooks, and the techniques are developed to the point where readers can pursue their own analyses or modify to their particular situations.
Author: Christoph Gerhard
Publisher: CRC Press
ISBN: 1498764614
Category : Technology & Engineering
Languages : en
Pages : 326
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Book Description
Optical components are essential key elements in modern engineering and everyday life. The education of skilled personnel and specialists in the fields of theoretical and practical optics manufacturing is of essential importance for next-generation technologies. Against this background, this book provides the basis for the education and advanced training of precision and ophthalmic optics technicians, craftsmen, and foremen, and it is an extensive reference work for students, academics, optical designers or shop managers, and production engineers. It not only covers particularly used and applied machines, working materials, testing procedures, and machining steps for classical optics manufacturing, but it also addresses the production and specification of optical glasses as well as unconventional production techniques and novel approaches. Optics Manufacturing: Components and Systems furthermore covers the basics of light propagation and provides an overview on optical materials and components; presents an introduction and explanation of the necessary considerations and procedures for the initial definition of manufacturing tolerances and the relevant industrial standards for optics manufacturing; and addresses the production of micro optics, the assembly of opto-mechanical setups and possible manufacturing errors, and the impact of the resulting inaccuracies. In order to allow fast and clear access to the most essential information, each chapter ends with a short summary of the most important aspects, including an explanation of relevant equations, symbols, and abbreviations. For further reading, extensive lists of references are also provided. Finally, exercises on the covered basic principles of optics, approaches, and techniques of optics manufacturing—including their corresponding detailed solutions—are found in the appendix.
Author: P. Hariharan
Publisher: Academic Press
ISBN: 0123116309
Category : Science
Languages : en
Pages : 369
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Book Description
Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.
Author: Dennis Derickson
Publisher: Prentice Hall
ISBN:
Category : Science
Languages : en
Pages : 680
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Book Description
This is the most authoritative, complete source of test and measurement information for engineers who design and maintain fiber optic networks. This book presents measurement principles for characterizing all three basic components of a fiber optic communication system: the optical transmitter, fiber medium and optical receiver. It also covers system level measurements, and discusses the principles and limitations of current fiber optic testing equipment. It discusses testing to SONET/SDH international standards, and helps engineers choose the best approach to testing today's new erbium doped fiber amplifiers. The book provides detailed recommendations for understanding polarization states, and presents new methods for accurately characterizing the behavior of Wavelength Division Multiplexing (WDM) fiber systems. It includes detailed coverage of testing fiber in the local loop, using optical power meters and optical time domain reflectometers. It also reviews the latest state-of-the-art 10 Gb/s systems, and even faster systems on the horizon. The coverage is practical, helping professionals accurately measure and test fiber optic systems without becoming experts in theory. All fiber optic engineers working with communications applications.
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1420019163
Category : Science
Languages : en
Pages : 524
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Book Description
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.
Author: Donald C. O'Shea
Publisher: SPIE Press
ISBN: 9780819451712
Category : Science
Languages : en
Pages : 266
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Book Description
This book provides the reader with the broad range of materials that were discussed in a series of short courses presented at Georgia Tech on the design, fabrication, and testing of diffractive optical elements (DOEs). Although there are not long derivations or detailed methods for specific engineering calculations, the reader should be familiar and comfortable with basic computational techniques. This text is not a 'cookbook' for producing DOEs, but it should provide readers with sufficient information to assess whether this technology would benefit their work, and to understand the requirements for using the concepts and techniques presented by the authors.
Author: Dmitry Budker
Publisher: Cambridge University Press
ISBN: 1107010357
Category : Science
Languages : en
Pages : 431
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Book Description
Comprehensive coverage of the principles, technology and diverse applications of optical magnetometry for graduate students and researchers in atomic physics.
