Author: Roger A. Greenwell
Publisher:
ISBN:
Category : Optical fibers
Languages : en
Pages : 338
Book Description
Optical Materials Reliability and Testing
Author: Roger A. Greenwell
Publisher:
ISBN:
Category : Optical fibers
Languages : en
Pages : 338
Book Description
Publisher:
ISBN:
Category : Optical fibers
Languages : en
Pages : 338
Book Description
Optical Materials Reliability and Testing: Benign and Adverse Environments
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Los Alamos Optical Materials Reliability, Maintainability, and Exposure Testing Program
Author: Stanley W. Moore
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 19
Book Description
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 19
Book Description
Los Alamos Optical Materials Reliability, Maintainability, and Exposure Testing Program
Author: Stanley W. Moore
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 22
Book Description
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 22
Book Description
Los Alamos Optical Materials Reliability, Maintainability, and Exposure Testing Program
Author: Stanley W. Moore
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 52
Book Description
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 52
Book Description
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author: Osamu Ueda
Publisher: Springer Science & Business Media
ISBN: 1461443369
Category : Technology & Engineering
Languages : en
Pages : 618
Book Description
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Publisher: Springer Science & Business Media
ISBN: 1461443369
Category : Technology & Engineering
Languages : en
Pages : 618
Book Description
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
Reliability of Semiconductor Lasers and Optoelectronic Devices
Author: Robert Herrick
Publisher: Woodhead Publishing
ISBN: 0128192550
Category : Technology & Engineering
Languages : en
Pages : 334
Book Description
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies. This book is suitable for new entrants to the field of optoelectronics working in R&D. • Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry • Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products. • Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more.
Publisher: Woodhead Publishing
ISBN: 0128192550
Category : Technology & Engineering
Languages : en
Pages : 334
Book Description
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies. This book is suitable for new entrants to the field of optoelectronics working in R&D. • Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry • Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products. • Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more.
A Ruggedness Evaluation of Procedures for Damage Threshold Testing Optical Materials
Author: Matthew W. Hooker
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 16
Book Description
Publisher:
ISBN:
Category : Optical materials
Languages : en
Pages : 16
Book Description
Reliability of Optical Fibres and Components
Author: Tarja Volotinen
Publisher: Springer Science & Business Media
ISBN: 9781852331474
Category : Technology & Engineering
Languages : en
Pages : 454
Book Description
This comprehensive volume provides a deeper understanding of the reliability of optical fibres and components. It is the first of its kind to look at the reliability of products and show their results and conclusions, bringing together 70 experts from a joint research initiative.
Publisher: Springer Science & Business Media
ISBN: 9781852331474
Category : Technology & Engineering
Languages : en
Pages : 454
Book Description
This comprehensive volume provides a deeper understanding of the reliability of optical fibres and components. It is the first of its kind to look at the reliability of products and show their results and conclusions, bringing together 70 experts from a joint research initiative.
Fiber Optics Reliability and Testing
Author: Dilip K. Paul
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 340
Book Description
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 340
Book Description